{"id":"https://openalex.org/W2133826245","doi":"https://doi.org/10.1109/tii.2010.2103401","title":"Robust Data-Driven Modeling Approach for Real-Time Final Product Quality Prediction in Batch Process Operation","display_name":"Robust Data-Driven Modeling Approach for Real-Time Final Product Quality Prediction in Batch Process Operation","publication_year":2011,"publication_date":"2011-01-28","ids":{"openalex":"https://openalex.org/W2133826245","doi":"https://doi.org/10.1109/tii.2010.2103401","mag":"2133826245"},"language":"en","primary_location":{"id":"doi:10.1109/tii.2010.2103401","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2010.2103401","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100652803","display_name":"David Wang","orcid":"https://orcid.org/0000-0002-0294-7738"},"institutions":[{"id":"https://openalex.org/I4210105704","display_name":"Institute of Chemical and Engineering Sciences","ror":"https://ror.org/01cbwn720","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210105704","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"David Wang","raw_affiliation_strings":["Process Science and Modeling, Institute of Chemical and Engineering Sciences, Singapore, Singapore","Process Science and Modelling, Institute of Chemical & Engineering Sciences, Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Process Science and Modeling, Institute of Chemical and Engineering Sciences, Singapore, Singapore","institution_ids":["https://openalex.org/I4210105704"]},{"raw_affiliation_string":"Process Science and Modelling, Institute of Chemical & Engineering Sciences, Singapore, Singapore","institution_ids":["https://openalex.org/I4210105704"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100652803"],"corresponding_institution_ids":["https://openalex.org/I4210105704"],"apc_list":null,"apc_paid":null,"fwci":19.7367,"has_fulltext":false,"cited_by_count":113,"citation_normalized_percentile":{"value":0.99325835,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"7","issue":"2","first_page":"371","last_page":"377"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9779999852180481,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6938883662223816},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6288357377052307},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.6033718585968018},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.528156042098999},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.48831412196159363},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.48749828338623047},{"id":"https://openalex.org/keywords/raw-data","display_name":"Raw data","score":0.476915568113327},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.4376934766769409},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3520016372203827},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3515699505805969},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19796526432037354},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.15283632278442383},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11616533994674683}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6938883662223816},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6288357377052307},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.6033718585968018},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.528156042098999},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.48831412196159363},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.48749828338623047},{"id":"https://openalex.org/C132964779","wikidata":"https://www.wikidata.org/wiki/Q2110223","display_name":"Raw data","level":2,"score":0.476915568113327},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.4376934766769409},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3520016372203827},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3515699505805969},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19796526432037354},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.15283632278442383},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11616533994674683},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tii.2010.2103401","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tii.2010.2103401","pdf_url":null,"source":{"id":"https://openalex.org/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1570432110","https://openalex.org/W1570673794","https://openalex.org/W1964285384","https://openalex.org/W1969221155","https://openalex.org/W1979494200","https://openalex.org/W2004046805","https://openalex.org/W2069085418","https://openalex.org/W2080245386","https://openalex.org/W2095271222","https://openalex.org/W2132649257","https://openalex.org/W2137922462","https://openalex.org/W2488343051","https://openalex.org/W2496323672","https://openalex.org/W2620037932","https://openalex.org/W3099514962"],"related_works":["https://openalex.org/W3006513224","https://openalex.org/W2046456988","https://openalex.org/W2357409937","https://openalex.org/W2074430941","https://openalex.org/W2113096305","https://openalex.org/W2580722822","https://openalex.org/W1486338765","https://openalex.org/W2023876576","https://openalex.org/W3094550016","https://openalex.org/W2982650128"],"abstract_inverted_index":{"Making":[0],"on-specification":[1],"products":[2],"is":[3,87,136,163,168],"a":[4,9,79,83,171],"primary":[5],"goal,":[6],"and":[7,23],"also":[8],"challenge":[10],"in":[11,60,126,145,155],"chemical":[12,173],"batch":[13,80,174],"process":[14,58,94],"operation.":[15,81],"Due":[16],"to":[17,57,62,97,101,130,140,147,170],"the":[18,32,45,69,98,107,112,118,134,142,149,156],"uncertainty":[19],"of":[20,25,71,74,114,120,151],"raw":[21],"materials":[22],"instability":[24],"operating":[26],"conditions,":[27],"it":[28],"may":[29],"not":[30],"produce":[31],"desired":[33],"on-spec":[34,64],"final":[35,75,108],"product.":[36,65],"It":[37],"would":[38],"be":[39,124],"helpful":[40],"if":[41],"one":[42,53],"can":[43,54,123],"predict":[44],"product":[46,76,109,121],"quality":[47,77,110,122],"during":[48,78,111],"each":[49],"operation,":[50,115],"so":[51,116],"that":[52,117],"make":[55,63,141],"adjustments":[56],"conditions":[59],"order":[61,146],"This":[66,89],"paper":[67],"addresses":[68],"issue":[70],"real-time":[72],"prediction":[73,179],"First,":[82],"data-driven":[84,132],"modeling":[85],"approach":[86,91,167],"presented.":[88,164],"multimodel":[90],"uses":[92],"available":[93],"information":[95],"up":[96],"current":[99],"points":[100],"capture":[102],"their":[103],"time-varying":[104],"relationships":[105],"with":[106,177],"course":[113],"prognosis":[119],"obtained":[125],"real-time.":[127],"Then,":[128],"due":[129],"its":[131,178],"nature,":[133],"focus":[135],"given":[137],"on":[138],"how":[139],"models":[143],"robust":[144],"eliminate":[148],"effect":[150],"noise,":[152],"especially,":[153],"outliers":[154],"data.":[157],"A":[158],"model-based":[159],"outlier":[160],"detection":[161],"method":[162],"The":[165],"proposed":[166],"applied":[169],"generic":[172],"case":[175],"study,":[176],"performance":[180],"being":[181],"evaluated.":[182]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":10},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":12},{"year":2013,"cited_by_count":10},{"year":2012,"cited_by_count":8}],"updated_date":"2026-04-04T08:04:53.788161","created_date":"2025-10-10T00:00:00"}