{"id":"https://openalex.org/W4404101894","doi":"https://doi.org/10.1109/tifs.2024.3492810","title":"DEFending Integrated Circuit Layouts","display_name":"DEFending Integrated Circuit Layouts","publication_year":2024,"publication_date":"2024-11-06","ids":{"openalex":"https://openalex.org/W4404101894","doi":"https://doi.org/10.1109/tifs.2024.3492810"},"language":"en","primary_location":{"id":"doi:10.1109/tifs.2024.3492810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2024.3492810","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083354804","display_name":"Jitendra Bhandari","orcid":"https://orcid.org/0000-0003-1017-1690"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jitendra Bhandari","raw_affiliation_strings":["Department of Electrical and Computer Engineering, New York University, New York City, NY, USA","New York University, New York City, NY, USA"],"raw_orcid":"https://orcid.org/0000-0003-1017-1690","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, New York University, New York City, NY, USA","institution_ids":["https://openalex.org/I57206974"]},{"raw_affiliation_string":"New York University, New York City, NY, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043832528","display_name":"Jayanth Gopinath","orcid":null},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jayanth Gopinath","raw_affiliation_strings":["Department of Electrical and Computer Engineering, New York University, New York City, NY, USA","New York University, New York City, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, New York University, New York City, NY, USA","institution_ids":["https://openalex.org/I57206974"]},{"raw_affiliation_string":"New York University, New York City, NY, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076080488","display_name":"Mohammed Ashraf","orcid":"https://orcid.org/0000-0002-1256-7229"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]},{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["AE","US"],"is_corresponding":false,"raw_author_name":"Mohammed Ashraf","raw_affiliation_strings":["Department of Electrical and Computer Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","New York University Abu Dhabi, UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]},{"raw_affiliation_string":"New York University Abu Dhabi, UAE","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052751303","display_name":"Johann Knechtel","orcid":"https://orcid.org/0000-0001-5093-2939"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]},{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["AE","US"],"is_corresponding":false,"raw_author_name":"Johann Knechtel","raw_affiliation_strings":["Department of Electrical and Computer Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","New York University Abu Dhabi, UAE"],"raw_orcid":"https://orcid.org/0000-0001-5093-2939","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]},{"raw_affiliation_string":"New York University Abu Dhabi, UAE","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]},{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["AE","US"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","New York University Abu Dhabi, UAE"],"raw_orcid":"https://orcid.org/0000-0003-0782-0397","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]},{"raw_affiliation_string":"New York University Abu Dhabi, UAE","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059648257","display_name":"Ramesh Karri","orcid":"https://orcid.org/0000-0001-7989-5617"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramesh Karri","raw_affiliation_strings":["Department of Electrical and Computer Engineering, New York University, New York City, NY, USA","New York University, New York City, NY, USA"],"raw_orcid":"https://orcid.org/0000-0001-7989-5617","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, New York University, New York City, NY, USA","institution_ids":["https://openalex.org/I57206974"]},{"raw_affiliation_string":"New York University, New York City, NY, USA","institution_ids":["https://openalex.org/I57206974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.329,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.81482861,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"20","issue":null,"first_page":"46","last_page":"59"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.3912999927997589,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.3912999927997589,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.34880000352859497,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7353384494781494}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7353384494781494}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tifs.2024.3492810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2024.3492810","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320313203","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W11194751","https://openalex.org/W1537875328","https://openalex.org/W1892172799","https://openalex.org/W1944814515","https://openalex.org/W1994094562","https://openalex.org/W1998648611","https://openalex.org/W2002990987","https://openalex.org/W2026936612","https://openalex.org/W2113436456","https://openalex.org/W2123596153","https://openalex.org/W2128045766","https://openalex.org/W2166778460","https://openalex.org/W2188294739","https://openalex.org/W2291231941","https://openalex.org/W2311957057","https://openalex.org/W2511192821","https://openalex.org/W2520282831","https://openalex.org/W2567209895","https://openalex.org/W2581963379","https://openalex.org/W2614052576","https://openalex.org/W2738836551","https://openalex.org/W2767607341","https://openalex.org/W2798600174","https://openalex.org/W2884921918","https://openalex.org/W2969353795","https://openalex.org/W2987478323","https://openalex.org/W2999530360","https://openalex.org/W3001499944","https://openalex.org/W3015325772","https://openalex.org/W3021938476","https://openalex.org/W3043578933","https://openalex.org/W3097819802","https://openalex.org/W3114160048","https://openalex.org/W4200317015","https://openalex.org/W4223897650","https://openalex.org/W4244015912","https://openalex.org/W4247476895","https://openalex.org/W4308338690","https://openalex.org/W4312121029","https://openalex.org/W4312630985","https://openalex.org/W4353031975","https://openalex.org/W4384948639","https://openalex.org/W4396240782","https://openalex.org/W4402288710","https://openalex.org/W4405242160","https://openalex.org/W6632480037","https://openalex.org/W6785236380","https://openalex.org/W6842219440","https://openalex.org/W6846588798"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Modern":[0],"integrated":[1],"circuits":[2],"(ICs)":[3],"require":[4],"a":[5,116],"complex,":[6],"outsourced":[7],"supply-chain,":[8],"involving":[9],"computer-aided":[10],"design":[11,74,138],"(CAD)":[12],"tools,":[13],"expert":[14],"knowledge,":[15],"and":[16,57,81,91,96,112,118,158],"advanced":[17],"foundries.":[18],"This":[19],"complexity":[20],"has":[21],"led":[22],"to":[23,67,94,127,151,166],"various":[24,98],"security":[25,69],"threats,":[26],"such":[27],"as":[28],"Trojans":[29],"inserted":[30],"by":[31],"adversaries":[32],"during":[33,71],"outsourcing,":[34],"but":[35],"also":[36],"run-time":[37],"threats":[38],"like":[39],"physical":[40,73],"probing.":[41],"Our":[42],"proposed":[43],"design-time":[44],"solution,":[45],"<italic":[46,85],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[47,86],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DEFense</i>,":[48],"is":[49,66,115],"an":[50,89],"extensible":[51,119],"CAD":[52,129],"framework":[53,121,165],"for":[54,125],"holistic":[55],"assessment":[56],"proactive":[58],"mitigation":[59],"of":[60,75,137],"multiple":[61],"prominent":[62],"threats.":[63],"The":[64],"goal":[65],"prioritize":[68],"concerns":[70],"the":[72,102,123,133,164,167],"ICs,":[76],"alongside":[77],"traditional":[78],"power,":[79],"performance,":[80],"area":[82],"(PPA)":[83],"objectives.":[84],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DEFense</i>":[87],"utilizes":[88],"iterative":[90],"modular":[92],"approach":[93],"assess":[95],"mitigate":[97],"known":[99],"vulnerabilities":[100],"in":[101],"IC":[103,149],"layout,":[104],"which":[105],"are":[106,162],"targeting":[107],"on":[108,146],"sensitive":[109],"active":[110],"devices":[111],"wires.":[113],"It":[114],"flexible":[117],"scripting":[120],"without":[122],"need":[124],"modifications":[126],"commercial":[128],"flows,":[130],"yet":[131],"with":[132],"same":[134],"high":[135],"level":[136],"quality.":[139],"We":[140,161],"have":[141],"conducted":[142],"extensive":[143],"case":[144],"studies":[145],"representative":[147],"modern":[148],"designs":[150],"\u201cDEFend\u201d":[152],"layouts":[153],"against":[154],"Trojan":[155],"insertion,":[156],"probing,":[157],"crosstalk":[159],"attacks.":[160],"providing":[163],"community.":[168]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}