{"id":"https://openalex.org/W2621333324","doi":"https://doi.org/10.1109/tifs.2017.2710954","title":"Testing the Trustworthiness of IC Testing: An Oracle-Less Attack on IC Camouflaging","display_name":"Testing the Trustworthiness of IC Testing: An Oracle-Less Attack on IC Camouflaging","publication_year":2017,"publication_date":"2017-06-01","ids":{"openalex":"https://openalex.org/W2621333324","doi":"https://doi.org/10.1109/tifs.2017.2710954","mag":"2621333324"},"language":"en","primary_location":{"id":"doi:10.1109/tifs.2017.2710954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2017.2710954","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034926702","display_name":"Muhammad Yasin","orcid":"https://orcid.org/0000-0001-9475-2796"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Muhammad Yasin","raw_affiliation_strings":["New York University, Brooklyn, NY, USA"],"raw_orcid":"https://orcid.org/0000-0001-9475-2796","affiliations":[{"raw_affiliation_string":"New York University, Brooklyn, NY, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["New York University Abu Dhabi, Abu Dhabi, U.A.E"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New York University Abu Dhabi, Abu Dhabi, U.A.E","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059126377","display_name":"Jeyavijayan Rajendran","orcid":"https://orcid.org/0000-0003-3687-3746"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeyavijayan Rajendran","raw_affiliation_strings":["The University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.9215,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":{"value":0.96522681,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"12","issue":"11","first_page":"2668","last_page":"2682"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8105930089950562},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.80788254737854},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7702224850654602},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6294345259666443},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5875877141952515},{"id":"https://openalex.org/keywords/oracle","display_name":"Oracle","score":0.551638126373291},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.520072877407074},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4611198604106903},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4557603597640991},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4299659729003906},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.4225214123725891},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3827439546585083},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3765720725059509},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.14190295338630676},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12922021746635437},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.10560286045074463}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8105930089950562},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.80788254737854},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7702224850654602},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6294345259666443},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5875877141952515},{"id":"https://openalex.org/C55166926","wikidata":"https://www.wikidata.org/wiki/Q2892946","display_name":"Oracle","level":2,"score":0.551638126373291},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.520072877407074},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4611198604106903},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4557603597640991},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4299659729003906},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.4225214123725891},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3827439546585083},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3765720725059509},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.14190295338630676},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12922021746635437},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10560286045074463},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tifs.2017.2710954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2017.2710954","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6600000262260437}],"awards":[{"id":"https://openalex.org/G3696810781","display_name":"CAREER: Towards Provably-Secure Design of Integrated Circuits","funder_award_id":"1652842","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G3826675100","display_name":null,"funder_award_id":"65513-CS","funder_id":"https://openalex.org/F4320338281","funder_display_name":"Army Research Office"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320309290","display_name":"New York University","ror":"https://ror.org/0190ak572"},{"id":"https://openalex.org/F4320313203","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821"},{"id":"https://openalex.org/F4320338281","display_name":"Army Research Office","ror":"https://ror.org/05epdh915"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W76123274","https://openalex.org/W359238146","https://openalex.org/W429018773","https://openalex.org/W1505879652","https://openalex.org/W1595368737","https://openalex.org/W1849928240","https://openalex.org/W1952517978","https://openalex.org/W1997908542","https://openalex.org/W2008008242","https://openalex.org/W2037435513","https://openalex.org/W2052353102","https://openalex.org/W2063615695","https://openalex.org/W2064541558","https://openalex.org/W2070574955","https://openalex.org/W2085362698","https://openalex.org/W2094165715","https://openalex.org/W2095410905","https://openalex.org/W2099814124","https://openalex.org/W2103292881","https://openalex.org/W2104548962","https://openalex.org/W2106409910","https://openalex.org/W2110037191","https://openalex.org/W2112173236","https://openalex.org/W2112965713","https://openalex.org/W2135627440","https://openalex.org/W2140904634","https://openalex.org/W2141624968","https://openalex.org/W2142537526","https://openalex.org/W2154112540","https://openalex.org/W2167381458","https://openalex.org/W2285261652","https://openalex.org/W2343475170","https://openalex.org/W2346502084","https://openalex.org/W2347054447","https://openalex.org/W2419784917","https://openalex.org/W2500678391","https://openalex.org/W2532898432","https://openalex.org/W2536656707","https://openalex.org/W2776226745","https://openalex.org/W2963707299","https://openalex.org/W6603123321","https://openalex.org/W6641116602","https://openalex.org/W6668177937","https://openalex.org/W6675797392","https://openalex.org/W6681113282","https://openalex.org/W6684791173","https://openalex.org/W6704743215","https://openalex.org/W6746609838"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W1991935474","https://openalex.org/W2021253405","https://openalex.org/W2091533492","https://openalex.org/W2323083271","https://openalex.org/W2802691720","https://openalex.org/W2535245920","https://openalex.org/W2147058777"],"abstract_inverted_index":{"Test":[0],"of":[1,45,80,189],"integrated":[2],"circuits":[3],"(ICs)":[4],"is":[5,13,29,95,183],"essential":[6],"to":[7,15,64,76,102,176],"ensure":[8],"their":[9],"quality;":[10],"the":[11,24,33,38,48,78,86,90,99,103,111,115,133,138,145,150,167,171,187,190,203],"test":[12,28,40,46,49,55,71,81,134,139,172,192,195,205],"meant":[14],"prevent":[16],"defective":[17],"and":[18,170,182],"out-of-spec":[19],"ICs":[20],"from":[21],"entering":[22],"into":[23],"supply":[25],"chain.":[26],"The":[27],"conducted":[30],"by":[31],"comparing":[32],"observed":[34],"IC":[35,204],"output":[36],"with":[37,212],"expected":[39],"responses":[41],"for":[42,162],"a":[43],"set":[44],"patterns;":[47],"patterns":[50],"are":[51],"generated":[52,131],"using":[53,165],"automatic":[54],"pattern":[56],"generation":[57,61,207],"algorithms.":[58],"Existing":[59],"test-pattern":[60],"algorithms":[62,84,208],"aim":[63],"achieve":[65],"higher":[66],"fault":[67],"coverage":[68],"at":[69],"lower":[70],"costs.":[72],"In":[73,119],"an":[74,125],"attempt":[75],"reduce":[77],"size":[79],"data,":[82,135],"these":[83],"reveal":[85],"maximum":[87],"information":[88,130],"about":[89],"internal":[91,100],"circuit":[92,116],"structure.":[93],"This":[94],"realized":[96],"through":[97],"sensitizing":[98],"nets":[101],"outputs":[104],"as":[105,107,117,157],"much":[106],"possible,":[108],"unintentionally":[109],"leaking":[110],"secrets":[112],"embedded":[113],"in":[114,132,186],"well.":[118],"this":[120],"paper,":[121],"we":[122],"present":[123],"HackTest,":[124],"attack":[126,200],"that":[127,202],"extracts":[128],"secret":[129],"even":[136,185],"if":[137],"data":[140,196,206],"do":[141],"not":[142],"explicitly":[143],"contain":[144],"secret.":[146],"HackTest":[147,174],"can":[148,209],"break":[149],"existing":[151,178],"intellectual":[152],"property":[153],"protection":[154],"techniques,":[155],"such":[156],"camouflaging,":[158],"within":[159],"2":[160],"min":[161],"our":[163],"benchmarks":[164],"only":[166],"camouflaged":[168,179],"layout":[169],"data.":[173],"applies":[175],"all":[177],"gate-selection":[180],"techniques":[181],"successful":[184],"presence":[188],"state-of-the-art":[191],"infrastructure,":[193],"i.e.,":[194],"compression":[197],"circuits.":[198],"Our":[199],"necessitates":[201],"be":[210],"reinforced":[211],"security.":[213]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}