{"id":"https://openalex.org/W2302635400","doi":"https://doi.org/10.1109/tifs.2016.2518130","title":"Against Double Fault Attacks: Injection Effort Model, Space and Time Randomization Based Countermeasures for Reconfigurable Array Architecture","display_name":"Against Double Fault Attacks: Injection Effort Model, Space and Time Randomization Based Countermeasures for Reconfigurable Array Architecture","publication_year":2016,"publication_date":"2016-01-15","ids":{"openalex":"https://openalex.org/W2302635400","doi":"https://doi.org/10.1109/tifs.2016.2518130","mag":"2302635400"},"language":"en","primary_location":{"id":"doi:10.1109/tifs.2016.2518130","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2016.2518130","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100408076","display_name":"Bo Wang","orcid":"https://orcid.org/0000-0002-2918-1912"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Wang","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100358856","display_name":"Leibo Liu","orcid":"https://orcid.org/0000-0001-7548-4116"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Leibo Liu","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023829435","display_name":"Chenchen Deng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenchen Deng","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101484570","display_name":"Min Zhu","orcid":"https://orcid.org/0000-0002-9854-7455"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Zhu","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054524841","display_name":"Shouyi Yin","orcid":"https://orcid.org/0000-0003-2309-572X"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shouyi Yin","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036023084","display_name":"Shaojun Wei","orcid":"https://orcid.org/0000-0001-5117-7920"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaojun Wei","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.7787,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.94433748,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"11","issue":"6","first_page":"1151","last_page":"1164"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7642901539802551},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.654370129108429},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6396065950393677},{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.6023373007774353},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5065299272537231},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4997420310974121},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.46833133697509766},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.44878318905830383},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.44102048873901367},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.4254821538925171},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.32790514826774597},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.29021650552749634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13027623295783997},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.08520117402076721},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07694000005722046},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07422879338264465}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7642901539802551},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.654370129108429},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6396065950393677},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.6023373007774353},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5065299272537231},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4997420310974121},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.46833133697509766},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.44878318905830383},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.44102048873901367},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.4254821538925171},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.32790514826774597},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.29021650552749634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13027623295783997},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.08520117402076721},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07694000005722046},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07422879338264465},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tifs.2016.2518130","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2016.2518130","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1537875328","https://openalex.org/W1964471912","https://openalex.org/W1998435257","https://openalex.org/W2015923915","https://openalex.org/W2021749238","https://openalex.org/W2035473608","https://openalex.org/W2035736061","https://openalex.org/W2038631119","https://openalex.org/W2041052461","https://openalex.org/W2041396597","https://openalex.org/W2058413145","https://openalex.org/W2059866937","https://openalex.org/W2072402822","https://openalex.org/W2078668570","https://openalex.org/W2079792016","https://openalex.org/W2082988283","https://openalex.org/W2087461431","https://openalex.org/W2090732265","https://openalex.org/W2095609723","https://openalex.org/W2096014416","https://openalex.org/W2096434182","https://openalex.org/W2110162979","https://openalex.org/W2111725598","https://openalex.org/W2112284176","https://openalex.org/W2112571059","https://openalex.org/W2122610147","https://openalex.org/W2137226052","https://openalex.org/W2157216158","https://openalex.org/W2157645463","https://openalex.org/W2161719472","https://openalex.org/W2169957670","https://openalex.org/W2172583428","https://openalex.org/W2355550369","https://openalex.org/W3030356974","https://openalex.org/W3105925763","https://openalex.org/W4248135367","https://openalex.org/W6674725526","https://openalex.org/W6778195073"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3148663848","https://openalex.org/W2024194466","https://openalex.org/W1986800855","https://openalex.org/W2278517150","https://openalex.org/W2130922779","https://openalex.org/W4256030018","https://openalex.org/W2185394135","https://openalex.org/W2742111403","https://openalex.org/W2082366402"],"abstract_inverted_index":{"With":[0],"the":[1,33,53,67,76,80,86,103,112,120,132,138,152,156,160,164,176,181,186,196,199,202,216,233],"increasing":[2],"accuracy":[3],"of":[4,69,105,140,154,162,188,221,244],"fault":[5,27,35,46,71,82,87,108,178,235],"injections,":[6],"it":[7,38],"has":[8,52],"become":[9],"possible":[10],"to":[11,43,55,101,194,241,249],"inject":[12],"two":[13,240],"faults":[14],"into":[15],"specific":[16],"circuit":[17],"regions":[18],"precisely":[19],"at":[20],"a":[21,106,125],"certain":[22],"time.":[23],"Unfortunately,":[24],"most":[25],"existing":[26],"attack":[28,83],"countermeasures":[29,146,168],"are":[30,147,169,191,227],"based":[31],"on":[32,137,149],"single":[34],"assumption,":[36],"and":[37,58,142,180,201,213,225,230],"is,":[39],"therefore,":[40],"very":[41],"difficult":[42],"resist":[44],"double":[45,70,81,177,234],"attacks.":[47,72],"Reconfigurable":[48],"array":[49],"architecture":[50],"(RAA)":[51],"ability":[54],"introduce":[56],"spatial":[57,141],"time":[59,143],"randomness":[60],"by":[61,239],"dynamic":[62],"reconfiguration,":[63],"which":[64],"can":[65,128,172,237],"alleviate":[66],"threat":[68],"This":[73],"paper,":[74],"for":[75,131,151,252],"first":[77],"time,":[78],"analyzes":[79],"issues":[84],"in":[85,219],"injection":[88,95,114],"phase":[89],"systematically.":[90],"An":[91],"evaluation":[92],"model,":[93],"named":[94],"effort":[96],"model":[97],"(IEM),":[98],"is":[99,116],"proposed":[100],"quantify":[102],"efforts":[104],"successful":[107],"injection.":[109],"In":[110],"IEM,":[111],"real":[113],"process":[115],"described":[117],"mathematically":[118],"using":[119,204],"probability":[121],"method,":[122],"so":[123],"that":[124],"theoretical":[126],"basis":[127],"be":[129,173],"provided":[130],"corresponding":[133],"countermeasure":[134],"design.":[135],"Based":[136],"concept":[139],"randomization,":[144],"three":[145],"implemented":[148],"RAA":[150],"purpose":[153],"decreasing":[155],"implementation":[157],"overhead":[158,183,203,217],"under":[159],"premise":[161],"ensuring":[163],"security.":[165],"When":[166,215],"these":[167],"adopted,":[170],"tradeoffs":[171],"made":[174],"between":[175,198],"resistance":[179,200,236],"extra":[182],"through":[184],"changing":[185],"degree":[187],"randomness.":[189],"Experiments":[190],"carried":[192],"out":[193],"analyze":[195],"relationship":[197],"Advanced":[205],"Encryption":[206,210],"Standard":[207,211],"(AES),":[208],"Data":[209],"(DES),":[212],"Camellia.":[214],"constraints":[218],"terms":[220],"throughput,":[222],"hardware":[223],"resources,":[224],"energy":[226],"5%,":[228],"35%,":[229],"10%":[231],"respectively,":[232],"increase":[238],"four":[242],"orders":[243],"magnitude":[245],"(ranging":[246],"from":[247],"824":[248],"10":[250],"149":[251],"different":[253],"algorithms).":[254]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}