{"id":"https://openalex.org/W2108243386","doi":"https://doi.org/10.1109/tifs.2008.2009604","title":"Scanner Identification Using Feature-Based Processing and Analysis","display_name":"Scanner Identification Using Feature-Based Processing and Analysis","publication_year":2009,"publication_date":"2009-01-30","ids":{"openalex":"https://openalex.org/W2108243386","doi":"https://doi.org/10.1109/tifs.2008.2009604","mag":"2108243386"},"language":"en","primary_location":{"id":"doi:10.1109/tifs.2008.2009604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2008.2009604","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091066896","display_name":"Nitin Khanna","orcid":"https://orcid.org/0000-0001-7571-9130"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Khanna","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","Sch. of Electr. and Comput. Eng., Purdue Univ., West Lafayette, IN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Sch. of Electr. and Comput. Eng., Purdue Univ., West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048829818","display_name":"Aravind K. Mikkilineni","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.K. Mikkilineni","raw_affiliation_strings":["School of Mechanical Engineering, Purdue University, West Lafayette, IN, USA","Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089688702","display_name":"Edward J. Delp","orcid":"https://orcid.org/0000-0002-2909-7323"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.J. Delp","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","Sch. of Electr. and Comput. Eng., Purdue Univ., West Lafayette, IN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Sch. of Electr. and Comput. Eng., Purdue Univ., West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":6.2411,"has_fulltext":false,"cited_by_count":69,"citation_normalized_percentile":{"value":0.9678301,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"4","issue":"1","first_page":"123","last_page":"139"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10388","display_name":"Advanced Steganography and Watermarking Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9764000177383423,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.812907338142395},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7865530252456665},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.756261944770813},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7061342597007751},{"id":"https://openalex.org/keywords/sharpening","display_name":"Sharpening","score":0.6006814241409302},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.5755607485771179},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5620732307434082},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.49422338604927063},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4741734266281128},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4572458267211914},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.10670751333236694}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.812907338142395},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7865530252456665},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.756261944770813},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7061342597007751},{"id":"https://openalex.org/C2781137444","wikidata":"https://www.wikidata.org/wiki/Q237105","display_name":"Sharpening","level":2,"score":0.6006814241409302},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.5755607485771179},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5620732307434082},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.49422338604927063},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4741734266281128},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4572458267211914},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.10670751333236694}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tifs.2008.2009604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tifs.2008.2009604","pdf_url":null,"source":{"id":"https://openalex.org/S61310614","display_name":"IEEE Transactions on Information Forensics and Security","issn_l":"1556-6013","issn":["1556-6013","1556-6021"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Information Forensics and Security","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W15168827","https://openalex.org/W1506281249","https://openalex.org/W1506864492","https://openalex.org/W1580963329","https://openalex.org/W1964095033","https://openalex.org/W1970928574","https://openalex.org/W1971081286","https://openalex.org/W1978903816","https://openalex.org/W1985836135","https://openalex.org/W1988600563","https://openalex.org/W1990438568","https://openalex.org/W2006028575","https://openalex.org/W2033323324","https://openalex.org/W2033781283","https://openalex.org/W2065391104","https://openalex.org/W2089305009","https://openalex.org/W2096754397","https://openalex.org/W2109943925","https://openalex.org/W2121451848","https://openalex.org/W2124695272","https://openalex.org/W2124929806","https://openalex.org/W2141698957","https://openalex.org/W2152203125","https://openalex.org/W2153635508","https://openalex.org/W2162192649","https://openalex.org/W2225832240","https://openalex.org/W3120421331","https://openalex.org/W4205687621","https://openalex.org/W4210764419","https://openalex.org/W6642821842"],"related_works":["https://openalex.org/W2329932281","https://openalex.org/W64535957","https://openalex.org/W2043790407","https://openalex.org/W2348902545","https://openalex.org/W2321247741","https://openalex.org/W2087564795","https://openalex.org/W4386159743","https://openalex.org/W2136313643","https://openalex.org/W2011367085","https://openalex.org/W1977940492"],"abstract_inverted_index":{"Digital":[0],"images":[1,36],"can":[2],"be":[3,120],"obtained":[4],"through":[5],"a":[6,25,65,85],"variety":[7],"of":[8,24,53,62,113],"sources":[9],"including":[10],"digital":[11,26],"cameras":[12],"and":[13,131],"scanners.":[14,44],"In":[15],"many":[16],"cases,":[17],"the":[18,22,77,82,106,114],"ability":[19],"to":[20,100,119],"determine":[21],"source":[23,83],"image":[27],"is":[28,73,94],"important.":[29],"This":[30],"paper":[31],"presents":[32],"methods":[33,46],"for":[34,75],"authenticating":[35],"that":[37],"have":[38],"been":[39],"acquired":[40],"using":[41],"flatbed":[42],"desktop":[43],"These":[45,96],"use":[47],"scanner":[48],"fingerprints":[49,93,108],"based":[50,90,109],"on":[51,91,110],"statistics":[52],"imaging":[54],"sensor":[55,63,115],"pattern":[56],"noise.":[57],"To":[58,80],"capture":[59],"different":[60,70],"types":[61],"noise,":[64],"denoising":[66,71],"filterbank":[67],"consisting":[68],"four":[69],"filters":[72],"used":[74],"obtaining":[76],"noise":[78,116],"patterns.":[79],"identify":[81],"scanner,":[84],"support":[86],"vector":[87],"machine":[88],"classifier":[89],"these":[92],"used.":[95],"features":[97],"are":[98,117],"shown":[99,118],"achieve":[101],"high":[102],"classification":[103],"accuracy.":[104],"Furthermore,":[105],"selected":[107],"statistical":[111],"properties":[112],"robust":[121],"under":[122],"postprocessing":[123],"operations,":[124],"such":[125],"as":[126],"JPEG":[127],"compression,":[128],"contrast":[129],"stretching,":[130],"sharpening.":[132]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}