{"id":"https://openalex.org/W7139068927","doi":"https://doi.org/10.1109/tie.2026.3670237","title":"Data Augmentation by Time-Frequency Feature Reconstruction for Few-Shot Multifault Diagnosis of PMSM","display_name":"Data Augmentation by Time-Frequency Feature Reconstruction for Few-Shot Multifault Diagnosis of PMSM","publication_year":2026,"publication_date":"2026-03-19","ids":{"openalex":"https://openalex.org/W7139068927","doi":"https://doi.org/10.1109/tie.2026.3670237"},"language":null,"primary_location":{"id":"doi:10.1109/tie.2026.3670237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2026.3670237","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5129983055","display_name":"Ke Lv","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Lv","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0004-6323-0425","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023920709","display_name":"Q. P. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I903994226","display_name":"Xuchang University","ror":"https://ror.org/03k174p87","country_code":"CN","type":"education","lineage":["https://openalex.org/I903994226"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Wang","raw_affiliation_strings":["XJ Electric Science and Technology Research Institute, XJ Electric Company Ltd., Xuchang, China"],"raw_orcid":"https://orcid.org/0009-0000-6442-9082","affiliations":[{"raw_affiliation_string":"XJ Electric Science and Technology Research Institute, XJ Electric Company Ltd., Xuchang, China","institution_ids":["https://openalex.org/I903994226"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5130037687","display_name":"Dong Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I2800710378","display_name":"Naval University of Engineering","ror":"https://ror.org/056vyez31","country_code":"CN","type":"education","lineage":["https://openalex.org/I2800710378"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dong Wang","raw_affiliation_strings":["National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-5298-4142","affiliations":[{"raw_affiliation_string":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China","institution_ids":["https://openalex.org/I2800710378"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Zhiqiang Wang","orcid":"https://orcid.org/0000-0001-5946-8407"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiqiang Wang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-5946-8407","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5129888692","display_name":"Jikai Si","orcid":null},"institutions":[{"id":"https://openalex.org/I38877650","display_name":"Zhengzhou University","ror":"https://ror.org/04ypx8c21","country_code":"CN","type":"education","lineage":["https://openalex.org/I38877650"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jikai Si","raw_affiliation_strings":["College of Electrical Engineering, Zhengzhou University, Zhengzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-2559-1252","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhengzhou University, Zhengzhou, China","institution_ids":["https://openalex.org/I38877650"]}]},{"author_position":"last","author":{"id":null,"display_name":"Jinghua Hu","orcid":"https://orcid.org/0000-0002-9690-9432"},"institutions":[{"id":"https://openalex.org/I2800710378","display_name":"Naval University of Engineering","ror":"https://ror.org/056vyez31","country_code":"CN","type":"education","lineage":["https://openalex.org/I2800710378"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinghua Hu","raw_affiliation_strings":["National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-9690-9432","affiliations":[{"raw_affiliation_string":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China","institution_ids":["https://openalex.org/I2800710378"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.2888246,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"8","first_page":"12414","last_page":"12426"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5842000246047974},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5565000176429749},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5465999841690063},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5450000166893005},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.47749999165534973},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4690999984741211},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4343999922275543},{"id":"https://openalex.org/keywords/permanent-magnet-synchronous-motor","display_name":"Permanent magnet synchronous motor","score":0.3653999865055084}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6579999923706055},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5842000246047974},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5629000067710876},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5565000176429749},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5465999841690063},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5450000166893005},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.47749999165534973},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4690999984741211},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4343999922275543},{"id":"https://openalex.org/C2986944758","wikidata":"https://www.wikidata.org/wiki/Q845675","display_name":"Permanent magnet synchronous motor","level":3,"score":0.3653999865055084},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.362199991941452},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.3418999910354614},{"id":"https://openalex.org/C71376005","wikidata":"https://www.wikidata.org/wiki/Q845675","display_name":"Synchronous motor","level":2,"score":0.33660000562667847},{"id":"https://openalex.org/C70958404","wikidata":"https://www.wikidata.org/wiki/Q7512728","display_name":"Signal reconstruction","level":4,"score":0.334199994802475},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.3100000023841858},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.29420000314712524},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.29339998960494995},{"id":"https://openalex.org/C2781170535","wikidata":"https://www.wikidata.org/wiki/Q30587856","display_name":"Noisy data","level":2,"score":0.2913999855518341},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.2888000011444092},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.2865999937057495},{"id":"https://openalex.org/C37736160","wikidata":"https://www.wikidata.org/wiki/Q1801315","display_name":"Adversarial system","level":2,"score":0.2851000130176544},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.2824000120162964},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.27480000257492065},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26350000500679016},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.257999986410141}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2026.3670237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2026.3670237","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G84717264","display_name":null,"funder_award_id":"52425701","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Deep":[0],"learning":[1],"for":[2,109,127,141],"multifault":[3,111,128],"diagnosis":[4,112,129,145],"in":[5,92,113,130],"permanent":[6],"magnet":[7],"synchronous":[8],"motors":[9],"(PMSMs)":[10],"suffers":[11],"from":[12],"accuracy":[13,78],"degradation":[14],"under":[15,79,132],"few-shot":[16,80,110,133],"conditions.":[17,134],"While":[18],"data":[19,46,87],"augmentation":[20,47,88],"is":[21,90],"a":[22,138],"common":[23],"solution,":[24],"but":[25],"existing":[26],"methods":[27],"neglect":[28],"the":[29,61,72,85,95,101,106,121,142],"physics":[30],"of":[31,58,100,146],"signal":[32],"generation,":[33],"impairing":[34],"synthetic":[35],"sample":[36],"efficiency":[37],"and":[38,68,98],"generalization.":[39],"Hence,":[40],"this":[41],"article":[42],"proposes":[43],"an":[44],"efficient":[45],"method":[48,62,89,108,123],"based":[49],"on":[50],"time-frequency":[51],"feature":[52],"reconstruction.":[53],"Utilizing":[54],"physical":[55],"mechanisms":[56],"instead":[57],"adversarial":[59],"training,":[60],"generates":[63],"virtual":[64,102],"samples":[65,103],"simulating":[66],"noise":[67],"speed":[69],"effects.":[70],"First,":[71],"factors":[73],"contributing":[74],"to":[75],"diminished":[76],"diagnostic":[77],"conditions":[81],"are":[82,115],"investigated.":[83],"Then,":[84],"proposed":[86,107,122],"introduced":[91],"detail.":[93],"Finally,":[94],"optimization":[96],"ability":[97],"applicability":[99],"generated":[104],"by":[105],"PMSMs":[114,131],"analyzed.":[116],"The":[117],"results":[118],"indicate":[119],"that":[120],"achieve":[124],"superior":[125],"performance":[126],"This":[135],"work":[136],"provides":[137],"significant":[139],"reference":[140],"multiple":[143],"fault":[144],"PMSM.":[147]},"counts_by_year":[],"updated_date":"2026-06-25T06:16:34.145877","created_date":"2026-03-20T00:00:00"}