{"id":"https://openalex.org/W7133529904","doi":"https://doi.org/10.1109/tie.2026.3663758","title":"Transient Overcurrent Suppression in Fault Recovery Stage for Grid Forming Converter Based on Postfault Active Angle Control","display_name":"Transient Overcurrent Suppression in Fault Recovery Stage for Grid Forming Converter Based on Postfault Active Angle Control","publication_year":2026,"publication_date":"2026-03-04","ids":{"openalex":"https://openalex.org/W7133529904","doi":"https://doi.org/10.1109/tie.2026.3663758"},"language":null,"primary_location":{"id":"doi:10.1109/tie.2026.3663758","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2026.3663758","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058305136","display_name":"Boxin Liu","orcid":"https://orcid.org/0000-0001-7441-8803"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Boxin Liu","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-7441-8803","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128089314","display_name":"Xin Xiang","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Xiang","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-7032-6271","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5130251198","display_name":"Yi Long","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Long","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0006-6971-0598","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5146879710","display_name":"Yonghao Li","orcid":"https://orcid.org/0009-0003-0800-0419"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonghao Li","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0003-0800-0419","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128089113","display_name":"Huan Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huan Yang","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-5388-0687","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128118028","display_name":"Wuhua Li","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wuhua Li","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-0345-5815","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5128050950","display_name":"Xiangning He","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangning He","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-0953-0097","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16554641,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"8","first_page":"11538","last_page":"11550"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.4668000042438507,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.4668000042438507,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.1860000044107437,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.04259999841451645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overcurrent","display_name":"Overcurrent","score":0.678600013256073},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5601999759674072},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5561000108718872},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.4284000098705292},{"id":"https://openalex.org/keywords/stage","display_name":"Stage (stratigraphy)","score":0.40310001373291016},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.39419999718666077},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.34700000286102295}],"concepts":[{"id":"https://openalex.org/C47949032","wikidata":"https://www.wikidata.org/wiki/Q663542","display_name":"Overcurrent","level":3,"score":0.678600013256073},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5601999759674072},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5561000108718872},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.4284000098705292},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4074999988079071},{"id":"https://openalex.org/C146357865","wikidata":"https://www.wikidata.org/wiki/Q1123245","display_name":"Stage (stratigraphy)","level":2,"score":0.40310001373291016},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.39419999718666077},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.34700000286102295},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.33970001339912415},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.3391000032424927},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.3276999890804291},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.31949999928474426},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3188999891281128},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.3140000104904175},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.30550000071525574},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.30469998717308044},{"id":"https://openalex.org/C72047438","wikidata":"https://www.wikidata.org/wiki/Q779785","display_name":"Transient recovery voltage","level":5,"score":0.26829999685287476}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2026.3663758","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2026.3663758","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.42617514729499817}],"awards":[{"id":"https://openalex.org/G3983893296","display_name":null,"funder_award_id":"52477203","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4796005038","display_name":null,"funder_award_id":"U25B6018","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1965287768","https://openalex.org/W2104195154","https://openalex.org/W2504711627","https://openalex.org/W2572181832","https://openalex.org/W2591901517","https://openalex.org/W2750703600","https://openalex.org/W2896180559","https://openalex.org/W2952105605","https://openalex.org/W2973527287","https://openalex.org/W2998325899","https://openalex.org/W3009112930","https://openalex.org/W3041866734","https://openalex.org/W3154122279","https://openalex.org/W3204174786","https://openalex.org/W3206439627","https://openalex.org/W3213107319","https://openalex.org/W4213426428","https://openalex.org/W4251455620","https://openalex.org/W4251818744","https://openalex.org/W4285248540","https://openalex.org/W4285307053","https://openalex.org/W4294891576","https://openalex.org/W4296912695","https://openalex.org/W4312939821","https://openalex.org/W4313332319","https://openalex.org/W4361988330","https://openalex.org/W4367280296","https://openalex.org/W4377971322","https://openalex.org/W4378965914","https://openalex.org/W4390187331","https://openalex.org/W4390738930","https://openalex.org/W4390970444","https://openalex.org/W4391021665","https://openalex.org/W4394698844","https://openalex.org/W4399282514","https://openalex.org/W4399527393","https://openalex.org/W4399939212","https://openalex.org/W4400770948","https://openalex.org/W4403918160","https://openalex.org/W4404179958"],"related_works":[],"abstract_inverted_index":{"The":[0,39],"grid":[1,33,76,93,133],"forming":[2],"(GFM)":[3],"converter":[4,142],"may":[5,138],"undesirably":[6],"output":[7],"a":[8,97,116],"higher":[9],"postfault":[10,117,165],"current":[11,48,74],"than":[12],"the":[13,23,32,45,51,59,69,92,103,107,128,140,145,150,155,164,168,188,191,195,198,205],"fault":[14,34,46,60,132,156],"duration":[15,47],"current,":[16],"which":[17],"would":[18],"cause":[19,105],"it":[20,89],"to":[21],"face":[22],"severe":[24],"risk":[25],"of":[26,106,170,190,197],"overcurrent":[27,56,109],"or":[28],"even":[29],"damage":[30],"after":[31],"has":[35],"already":[36],"been":[37],"cleared.":[38],"existing":[40],"methods":[41],"mainly":[42],"focus":[43],"on":[44],"limitation,":[49],"while":[50],"tailored":[52],"strategy":[53,122,137,200],"for":[54,130],"transient":[55,73],"suppression":[57],"in":[58,83,172,185,204],"recovery":[61,95,108,157],"stage":[62,158],"is":[63,102,123,175],"still":[64],"missing.":[65],"This":[66,136],"article":[67],"describes":[68],"analytical":[70],"relationship":[71],"between":[72],"and":[75,125,178,194],"voltage":[77,94],"considering":[78],"power":[79,99,151],"angle":[80,100,119,152],"swing":[81],"effect":[82,169],"GFM":[84,141],"converter.":[85],"On":[86],"this":[87,114],"basis,":[88],"reveals":[90],"that":[91],"under":[96],"significant":[98],"value":[101],"root":[104],"(ROC)":[110],"phenomenon.":[111],"To":[112],"solve":[113],"issue,":[115],"active":[118],"control":[120,174],"(PAAC)":[121],"proposed":[124],"designed":[126],"without":[127,159],"need":[129],"additional":[131],"detection":[134],"methods.":[135],"help":[139],"effectively":[143],"avoid":[144],"ROC":[146],"problem":[147],"by":[148],"reshaping":[149],"trajectory":[153],"at":[154],"compromising":[160],"resynchronization":[161],"capability":[162],"with":[163],"grid.":[166],"Furthermore,":[167],"parameters":[171],"PAAC":[173,199],"assessed":[176],"analytically,":[177],"its":[179],"design":[180],"criteria":[181],"are":[182,201],"also":[183],"discussed":[184],"detail.":[186],"Finally,":[187],"correctness":[189],"theoretical":[192],"analysis":[193],"feasibility":[196],"both":[202],"verified":[203],"experimental":[206],"tests.":[207]},"counts_by_year":[],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2026-03-05T00:00:00"}