{"id":"https://openalex.org/W4417439075","doi":"https://doi.org/10.1109/tie.2025.3637398","title":"Impact of IEEE Standard 2800-Compliant Inverters on the Performance of Phase Selection Elements in Protective Relays","display_name":"Impact of IEEE Standard 2800-Compliant Inverters on the Performance of Phase Selection Elements in Protective Relays","publication_year":2025,"publication_date":"2025-12-17","ids":{"openalex":"https://openalex.org/W4417439075","doi":"https://doi.org/10.1109/tie.2025.3637398"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2025.3637398","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3637398","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100317444","display_name":"Yifei Li","orcid":"https://orcid.org/0009-0000-3562-4815"},"institutions":[{"id":"https://openalex.org/I891191580","display_name":"Aalborg University","ror":"https://ror.org/04m5j1k67","country_code":"DK","type":"education","lineage":["https://openalex.org/I891191580"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Yifei Li","raw_affiliation_strings":["Department of Energy (AAU Energy), Aalborg University, Aalborg, Denmark"],"raw_orcid":"https://orcid.org/0009-0000-3562-4815","affiliations":[{"raw_affiliation_string":"Department of Energy (AAU Energy), Aalborg University, Aalborg, Denmark","institution_ids":["https://openalex.org/I891191580"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034805159","display_name":"Heng Wu","orcid":"https://orcid.org/0000-0003-0557-7573"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Heng Wu","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0003-0557-7573","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033672683","display_name":"Yongxin Xiong","orcid":"https://orcid.org/0000-0001-6636-4016"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Yongxin Xiong","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hong Kong, China"],"raw_orcid":"https://orcid.org/0000-0001-6636-4016","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028256016","display_name":"Zejie Li","orcid":"https://orcid.org/0000-0003-4462-7908"},"institutions":[{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Zejie Li","raw_affiliation_strings":["Division of Electric Power and Energy Systems, KTH Royal Institute of Technology, Stockholm, Sweden"],"raw_orcid":"https://orcid.org/0000-0003-4462-7908","affiliations":[{"raw_affiliation_string":"Division of Electric Power and Energy Systems, KTH Royal Institute of Technology, Stockholm, Sweden","institution_ids":["https://openalex.org/I86987016"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021491888","display_name":"Xiongfei Wang","orcid":"https://orcid.org/0000-0002-6327-9729"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiongfei Wang","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6327-9729","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9042,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.81162183,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"73","issue":"4","first_page":"5710","last_page":"5722"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9283999800682068,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9283999800682068,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.026399999856948853,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.005400000140070915,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.6126000285148621},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.5174000263214111},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5115000009536743},{"id":"https://openalex.org/keywords/three-phase","display_name":"Three-phase","score":0.4449999928474426},{"id":"https://openalex.org/keywords/protective-relay","display_name":"Protective relay","score":0.42829999327659607},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.42100000381469727},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.38260000944137573}],"concepts":[{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.6126000285148621},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5174000263214111},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5116000175476074},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5115000009536743},{"id":"https://openalex.org/C173871940","wikidata":"https://www.wikidata.org/wiki/Q471846","display_name":"Three-phase","level":3,"score":0.4449999928474426},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4350999891757965},{"id":"https://openalex.org/C2412688","wikidata":"https://www.wikidata.org/wiki/Q503732","display_name":"Protective relay","level":4,"score":0.42829999327659607},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.42100000381469727},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3853999972343445},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.38260000944137573},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.367000013589859},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.34929999709129333},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34139999747276306},{"id":"https://openalex.org/C38361682","wikidata":"https://www.wikidata.org/wiki/Q1756067","display_name":"Power-system protection","level":4,"score":0.31049999594688416},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.2919999957084656},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.2840000092983246},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.2685000002384186},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.26589998602867126}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2025.3637398","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3637398","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:publications/6ff17b6e-ac48-4912-ab38-9513d54aa524","is_oa":false,"landing_page_url":"https://vbn.aau.dk/da/publications/6ff17b6e-ac48-4912-ab38-9513d54aa524","pdf_url":null,"source":{"id":"https://openalex.org/S4306401731","display_name":"VBN Forskningsportal (Aalborg Universitet)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I891191580","host_organization_name":"Aalborg University","host_organization_lineage":["https://openalex.org/I891191580"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Li, Y, Wu, H, Xiong, Y, Li, Z & Wang, X 2026, 'Impact of IEEE Standard 2800-Compliant Inverters on the Performance of Phase Selection Elements in Protective Relays', IEEE Transactions on Industrial Electronics, vol. 73, no. 4, 11301903, pp. 5710-5722. https://doi.org/10.1109/TIE.2025.3637398","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0],"article":[1],"analyzes":[2],"the":[3,11,25,42,48,51,68,78,87,99],"influence":[4],"of":[5,13,44,50,80,89,98],"IEEE":[6,38],"Std.":[7,39],"2800-compliant":[8],"inverters":[9],"on":[10,47],"performance":[12,49,88],"phase":[14],"selection":[15],"elements":[16],"(PSEs)":[17],"in":[18,33,55],"protective":[19],"relays.":[20],"It":[21],"is":[22,103],"revealed":[23],"that":[24,94],"incremental":[26],"quality-based":[27],"PSEs":[28,54,102],"are":[29,64,115],"prone":[30],"to":[31],"malfunction":[32],"inverter-based":[34],"systems":[35,57],"complying":[36],"with":[37],"2800,":[40],"while":[41],"impact":[43,79],"load":[45],"conditions":[46],"total":[52,100],"quantity-based":[53,101],"such":[56],"can":[58],"be":[59],"quantified.":[60],"These":[61],"two":[62],"characteristics":[63],"significantly":[65],"different":[66],"from":[67],"legacy":[69],"synchronous":[70],"generator":[71],"(SG)-based":[72],"systems.":[73],"Further,":[74],"this":[75],"work":[76],"examines":[77],"fault":[81],"resistance,":[82],"another":[83],"inherent":[84],"limitation":[85],"affecting":[86],"PSEs.":[90],"The":[91,112],"analyses":[92],"show":[93],"modifying":[95],"fault-type":[96],"bands":[97],"both":[104],"necessary":[105],"and":[106,119],"sufficient":[107],"for":[108],"their":[109],"reliable":[110],"operation.":[111],"theoretical":[113],"findings":[114],"validated":[116],"through":[117],"simulations":[118],"controller":[120],"hardware-in-the-loop":[121],"(CHIL)":[122],"tests.":[123]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-12-17T00:00:00"}