{"id":"https://openalex.org/W7116737481","doi":"https://doi.org/10.1109/tie.2025.3634404","title":"A High-Stability Real-Time Simulation Model for DC\u2013AC Power Electronic Converters and Digital Twin Applications","display_name":"A High-Stability Real-Time Simulation Model for DC\u2013AC Power Electronic Converters and Digital Twin Applications","publication_year":2025,"publication_date":"2025-12-22","ids":{"openalex":"https://openalex.org/W7116737481","doi":"https://doi.org/10.1109/tie.2025.3634404"},"language":null,"primary_location":{"id":"doi:10.1109/tie.2025.3634404","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3634404","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113278056","display_name":"Mingwang Xu","orcid":"https://orcid.org/0009-0004-5259-790X"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingwang Xu","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0009-0004-5259-790X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5121006865","display_name":"Wei Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Gu","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0003-2701-0009","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5121018497","display_name":"Keyan Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]},{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":null,"type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Keyan Liu","raw_affiliation_strings":["China Electric Power Research Institute, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4709-4270","affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute, Beijing, China","institution_ids":["https://openalex.org/I153473198","https://openalex.org/I4392738113"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Fei Zhang","orcid":"https://orcid.org/0000-0002-1358-440X"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Zhang","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-1358-440X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5120992967","display_name":"Wei Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Liu","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-9859-4892","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.52240237,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"5","first_page":"6534","last_page":"6546"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9448999762535095,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9448999762535095,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13286","display_name":"Modeling and Simulation Systems","score":0.014800000004470348,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11206","display_name":"Model Reduction and Neural Networks","score":0.00559999980032444,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.8180999755859375},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5950999855995178},{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.5504999756813049},{"id":"https://openalex.org/keywords/power-electronics","display_name":"Power electronics","score":0.5349000096321106},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.48840001225471497},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.4474000036716461},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.4357999861240387},{"id":"https://openalex.org/keywords/electronic-component","display_name":"Electronic component","score":0.38040000200271606}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.8180999755859375},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.597599983215332},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5950999855995178},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5864999890327454},{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.5504999756813049},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.5349000096321106},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.48840001225471497},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.4474000036716461},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.4357999861240387},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.38040000200271606},{"id":"https://openalex.org/C2780974030","wikidata":"https://www.wikidata.org/wiki/Q16951926","display_name":"Co-simulation","level":2,"score":0.3440999984741211},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.32670000195503235},{"id":"https://openalex.org/C2983266536","wikidata":"https://www.wikidata.org/wiki/Q3509543","display_name":"Electronic systems","level":2,"score":0.3156000077724457},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31299999356269836},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30660000443458557},{"id":"https://openalex.org/C141812795","wikidata":"https://www.wikidata.org/wiki/Q7236534","display_name":"Power module","level":3,"score":0.2946000099182129},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.28839999437332153},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.2766000032424927},{"id":"https://openalex.org/C108882727","wikidata":"https://www.wikidata.org/wiki/Q2991685","display_name":"Solid modeling","level":2,"score":0.2671999931335449},{"id":"https://openalex.org/C12590798","wikidata":"https://www.wikidata.org/wiki/Q3933199","display_name":"Replication (statistics)","level":2,"score":0.2533999979496002}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2025.3634404","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3634404","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Real-time":[0],"simulation":[1],"(RTS)":[2],"of":[3,29,45,130],"large-scale":[4],"power":[5,55,82,133],"electronic":[6,56,83,134],"converter":[7,84],"systems":[8],"is":[9,62,68],"often":[10],"hindered":[11],"by":[12],"the":[13,38,72,117,122,131],"heavy":[14],"computational":[15],"burden":[16],"associated":[17],"with":[18],"high-dimensional,":[19],"time-varying":[20],"matrices.":[21],"Digital":[22],"twin":[23],"(DT)":[24],"technology,":[25],"as":[26],"an":[27,51],"extension":[28],"RTS,":[30],"enables":[31,124],"continuous":[32],"system":[33],"monitoring":[34],"and":[35,86,106,126,138,149],"optimization":[36],"throughout":[37],"lifecycle,":[39],"offering":[40,109],"a":[41,65,76,79],"more":[42],"accurate":[43],"representation":[44],"real-world":[46],"dynamics.":[47],"In":[48],"this":[49],"article,":[50],"RTS":[52,73,137],"model":[53,94,123],"for":[54,120],"converters":[57],"that":[58],"guarantees":[59],"high":[60,96],"stability":[61],"proposed.":[63],"Besides,":[64],"DT":[66,118,139],"platform":[67,119],"developed":[69],"to":[70],"validate":[71,144],"model,":[74],"integrating":[75],"physical":[77,132],"controller,":[78],"three-phase":[80],"dc\u2013ac":[81],"prototype,":[85],"high-speed":[87],"I/O":[88],"interfaces":[89],"on":[90],"RT-LAB.":[91],"The":[92],"proposed":[93],"ensures":[95],"stability,":[97],"featuring":[98],"without":[99],"interface":[100],"time":[101],"delay,":[102],"constant":[103],"admittance":[104],"matrices,":[105],"low-dimensional":[107],"nodes,":[108],"significant":[110],"advantages":[111],"over":[112],"existing":[113],"models.":[114],"Embedded":[115],"within":[116],"application,":[121],"efficient":[125],"reliable":[127],"digital":[128],"replication":[129],"converter.":[135],"Comprehensive":[136],"experiments":[140],"across":[141],"multiple":[142],"scenarios":[143],"its":[145],"superior":[146],"dynamic":[147],"performance":[148],"accuracy.":[150]},"counts_by_year":[],"updated_date":"2026-04-04T06:10:10.580331","created_date":"2025-12-22T00:00:00"}