{"id":"https://openalex.org/W4416961038","doi":"https://doi.org/10.1109/tie.2025.3629346","title":"An Active Bypass Protection With the Charging Circuit for Shoot-Through Faults in IGCT-Based Converters","display_name":"An Active Bypass Protection With the Charging Circuit for Shoot-Through Faults in IGCT-Based Converters","publication_year":2025,"publication_date":"2025-12-03","ids":{"openalex":"https://openalex.org/W4416961038","doi":"https://doi.org/10.1109/tie.2025.3629346"},"language":null,"primary_location":{"id":"doi:10.1109/tie.2025.3629346","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3629346","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043266666","display_name":"Jiayu Fan","orcid":"https://orcid.org/0000-0001-9217-7484"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Jiayu Fan","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057850830","display_name":"Yu Xiao","orcid":"https://orcid.org/0000-0003-2654-3110"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Yu Xiao","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025067242","display_name":"Liangcai Shu","orcid":"https://orcid.org/0000-0002-4258-1929"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Liangcai Shu","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050575273","display_name":"Zhonghao Dongye","orcid":"https://orcid.org/0000-0001-5961-2608"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]},{"id":"https://openalex.org/I4391767892","display_name":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources","ror":"https://ror.org/045hfth47","country_code":null,"type":"facility","lineage":["https://openalex.org/I153473198","https://openalex.org/I4391767892"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhonghao Dongye","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electrical Power University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electrical Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198","https://openalex.org/I4391767892"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015041663","display_name":"Zheran Zeng","orcid":"https://orcid.org/0009-0006-6684-6916"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Zheran Zeng","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041144914","display_name":"Lei Qi","orcid":"https://orcid.org/0000-0002-5175-7607"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]},{"id":"https://openalex.org/I4391767892","display_name":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources","ror":"https://ror.org/045hfth47","country_code":null,"type":"facility","lineage":["https://openalex.org/I153473198","https://openalex.org/I4391767892"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Qi","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electrical Power University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electrical Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198","https://openalex.org/I4391767892"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100738462","display_name":"Wei Xu","orcid":"https://orcid.org/0000-0003-0816-6016"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Xu","raw_affiliation_strings":["State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040405791","display_name":"Dongsheng Yang","orcid":"https://orcid.org/0000-0002-1808-1908"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Dongsheng Yang","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5043266666"],"corresponding_institution_ids":["https://openalex.org/I83019370"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39084104,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"4","first_page":"5591","last_page":"5602"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.45170000195503235,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.45170000195503235,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.2935999929904938,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.12240000069141388,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrated-gate-commutated-thyristor","display_name":"Integrated gate-commutated thyristor","score":0.7972000241279602},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7468000054359436},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.6800000071525574},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5934000015258789},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5236999988555908},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.45899999141693115},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45579999685287476},{"id":"https://openalex.org/keywords/commutation","display_name":"Commutation","score":0.3734999895095825}],"concepts":[{"id":"https://openalex.org/C194777113","wikidata":"https://www.wikidata.org/wiki/Q1066563","display_name":"Integrated gate-commutated thyristor","level":4,"score":0.7972000241279602},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7468000054359436},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.6800000071525574},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5934000015258789},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5236999988555908},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46160000562667847},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45899999141693115},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45579999685287476},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4496999979019165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4284999966621399},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4101000130176544},{"id":"https://openalex.org/C2780147050","wikidata":"https://www.wikidata.org/wiki/Q5155085","display_name":"Commutation","level":3,"score":0.3734999895095825},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.3495999872684479},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.335999995470047},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.31940001249313354},{"id":"https://openalex.org/C102665078","wikidata":"https://www.wikidata.org/wiki/Q4677571","display_name":"Active networking","level":2,"score":0.3052999973297119},{"id":"https://openalex.org/C186339688","wikidata":"https://www.wikidata.org/wiki/Q233523","display_name":"Safe operating area","level":4,"score":0.2847000062465668},{"id":"https://openalex.org/C161638520","wikidata":"https://www.wikidata.org/wiki/Q1189770","display_name":"Gate turn-off thyristor","level":5,"score":0.2784999907016754},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.2711000144481659},{"id":"https://openalex.org/C129187525","wikidata":"https://www.wikidata.org/wiki/Q10858078","display_name":"Fault current limiter","level":4,"score":0.2612999975681305},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.25589999556541443}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2025.3629346","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3629346","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Integrated":[0],"gate-commutated":[1],"thyristor":[2],"(IGCT)":[3],"converters":[4,62],"promise":[5],"high":[6,9],"reliability":[7],"and":[8,33,85,135,163,183,194],"efficiency.":[10],"Due":[11],"to":[12,31,104,166],"its":[13],"thyristor-based":[14],"structure,":[15],"the":[16,24,44,51,60,91,106,110,125,130,136,146,158,176,192,198],"IGCT":[17,111,199],"device":[18,32],"cannot":[19],"turn":[20],"<sc":[21],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[22,66,80,116,132],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">off</small>":[23],"short-circuit":[25,107],"current,":[26],"which":[27,54,89],"might":[28],"subsequently":[29],"lead":[30],"converter":[34],"failures.":[35],"In":[36],"this":[37,142,168],"article,":[38],"an":[39,77],"active":[40,72,126,177],"bypass":[41,73,127,178],"protection":[42,169,179],"with":[43],"charging":[45,87],"circuit":[46,74,97],"is":[47,150,161],"put":[48],"forward":[49],"for":[50],"first":[52],"time,":[53],"can":[55,99,180],"eliminate":[56],"shoot-through":[57],"faults":[58],"in":[59,109,141,187],"IGCT-based":[61,188],"within":[63,113],"250":[64],"<inline-formula":[65,115],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[67,117],"<tex-math":[68,118],"notation=\"LaTeX\">$\\boldsymbol{\\upmu}$</tex-math>":[69,119],"</inline-formula>s.":[70,120],"The":[71,95],"consists":[75],"of":[76,124],"inductance\u2013capacitance":[78],"(<italic":[79],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">LC</i>)":[81],"component,":[82],"a":[83,86,101],"thyristor,":[84],"circuit,":[88],"removes":[90],"additional":[92],"voltage":[93],"supply.":[94],"proposed":[96],"topology":[98],"generate":[100],"reverse":[102],"current":[103,108,195],"commutate":[105],"branches":[112],"40":[114],"Then,":[121],"key":[122],"factors":[123],"protection,":[128],"including":[129],"<italic":[131],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">LC</i>":[133],"parameters":[134],"capacitor":[137],"voltage,":[138],"are":[139],"analyzed":[140],"article.":[143],"After":[144],"that,":[145],"parameter":[147],"design":[148],"approach":[149],"presented":[151],"based":[152],"on":[153,197],"simulations":[154],"as":[155],"well.":[156],"Moreover,":[157],"down-scale":[159],"prototype":[160],"designed":[162],"then":[164],"established":[165],"verify":[167],"circuit.":[170],"It":[171],"has":[172],"been":[173],"validated":[174],"that":[175],"ensure":[181],"rapid":[182],"effective":[184],"fault":[185],"elimination":[186],"converters,":[189],"thereby":[190],"lowering":[191],"thermal":[193],"stresses":[196],"devices.":[200]},"counts_by_year":[],"updated_date":"2026-03-20T20:47:17.329874","created_date":"2025-12-03T00:00:00"}