{"id":"https://openalex.org/W4416649999","doi":"https://doi.org/10.1109/tie.2025.3618872","title":"Adaptive Threshold-Based Local Fault Diagnosis Method for DC Microgrids","display_name":"Adaptive Threshold-Based Local Fault Diagnosis Method for DC Microgrids","publication_year":2025,"publication_date":"2025-11-25","ids":{"openalex":"https://openalex.org/W4416649999","doi":"https://doi.org/10.1109/tie.2025.3618872"},"language":null,"primary_location":{"id":"doi:10.1109/tie.2025.3618872","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3618872","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100622143","display_name":"Hongyi Liu","orcid":"https://orcid.org/0000-0003-4156-4788"},"institutions":[{"id":"https://openalex.org/I121296143","display_name":"Hunan University of Science and Technology","ror":"https://ror.org/02m9vrb24","country_code":"CN","type":"education","lineage":["https://openalex.org/I121296143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hongyi Liu","raw_affiliation_strings":["School of Information and Electrical Engineering, Hunan University of Science and Technology, Xiangtan, China"],"raw_orcid":"https://orcid.org/0000-0003-4156-4788","affiliations":[{"raw_affiliation_string":"School of Information and Electrical Engineering, Hunan University of Science and Technology, Xiangtan, China","institution_ids":["https://openalex.org/I121296143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073660632","display_name":"Hua Han","orcid":"https://orcid.org/0000-0001-8318-9336"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hua Han","raw_affiliation_strings":["School of Automation, Hunan Provincial Key Laboratory of Power Electronics Equipment and Gird, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0001-8318-9336","affiliations":[{"raw_affiliation_string":"School of Automation, Hunan Provincial Key Laboratory of Power Electronics Equipment and Gird, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082281365","display_name":"Guangze Shi","orcid":"https://orcid.org/0000-0001-6852-2073"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangze Shi","raw_affiliation_strings":["School of Artificial Intelligence and Advanced Computing, Hunan University of Technology and Business, and Xiangjiang Laboratory, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0001-6852-2073","affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence and Advanced Computing, Hunan University of Technology and Business, and Xiangjiang Laboratory, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075942868","display_name":"Xida Chen","orcid":"https://orcid.org/0000-0002-0238-0989"},"institutions":[{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":null,"type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xida Chen","raw_affiliation_strings":["China Electric Power Research Institute, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-0238-0989","affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute, Wuhan, China","institution_ids":["https://openalex.org/I4392738113"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108048517","display_name":"Yao Sun","orcid":"https://orcid.org/0000-0002-7268-9201"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Sun","raw_affiliation_strings":["School of Automation, Hunan Provincial Key Laboratory of Power Electronics Equipment and Gird, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-7268-9201","affiliations":[{"raw_affiliation_string":"School of Automation, Hunan Provincial Key Laboratory of Power Electronics Equipment and Gird, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059535638","display_name":"Mei Su","orcid":null},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mei Su","raw_affiliation_strings":["School of Automation, Hunan Provincial Key Laboratory of Power Electronics Equipment and Gird, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0001-7293-7669","affiliations":[{"raw_affiliation_string":"School of Automation, Hunan Provincial Key Laboratory of Power Electronics Equipment and Gird, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100630346","display_name":"Chaoyang Chen","orcid":"https://orcid.org/0000-0002-8095-399X"},"institutions":[{"id":"https://openalex.org/I121296143","display_name":"Hunan University of Science and Technology","ror":"https://ror.org/02m9vrb24","country_code":"CN","type":"education","lineage":["https://openalex.org/I121296143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chaoyang Chen","raw_affiliation_strings":["School of Information and Electrical Engineering, Hunan University of Science and Technology, Xiangtan, China"],"raw_orcid":"https://orcid.org/0000-0002-8095-399X","affiliations":[{"raw_affiliation_string":"School of Information and Electrical Engineering, Hunan University of Science and Technology, Xiangtan, China","institution_ids":["https://openalex.org/I121296143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100622143"],"corresponding_institution_ids":["https://openalex.org/I121296143"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.43023011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"3","first_page":"4917","last_page":"4929"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.31290000677108765,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.31290000677108765,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.2718000113964081,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.21070000529289246,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6725999712944031},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5917999744415283},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.5205000042915344},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.5019999742507935},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5008000135421753},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4848000109195709},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.45249998569488525},{"id":"https://openalex.org/keywords/overcurrent","display_name":"Overcurrent","score":0.44359999895095825}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6725999712944031},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5917999744415283},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.5205000042915344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5062000155448914},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.5019999742507935},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5008000135421753},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4848000109195709},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45249998569488525},{"id":"https://openalex.org/C47949032","wikidata":"https://www.wikidata.org/wiki/Q663542","display_name":"Overcurrent","level":3,"score":0.44359999895095825},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.43810001015663147},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39719998836517334},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3896999955177307},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3580999970436096},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.3569999933242798},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.3221000134944916},{"id":"https://openalex.org/C110407247","wikidata":"https://www.wikidata.org/wiki/Q122508","display_name":"Inertia","level":2,"score":0.3149999976158142},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3089999854564667},{"id":"https://openalex.org/C118671147","wikidata":"https://www.wikidata.org/wiki/Q578714","display_name":"Quantile","level":2,"score":0.3010999858379364},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.29120001196861267},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.2847000062465668},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.2793999910354614},{"id":"https://openalex.org/C107464732","wikidata":"https://www.wikidata.org/wiki/Q235781","display_name":"Adaptive control","level":3,"score":0.2791999876499176},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.27810001373291016},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.2639000117778778}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2025.3618872","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3618872","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1148092178","display_name":null,"funder_award_id":"52407096","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2287139646","display_name":null,"funder_award_id":"62533010","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G405155768","display_name":null,"funder_award_id":"62222306","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5104226517","display_name":null,"funder_award_id":"U23B20129","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7464846755","display_name":null,"funder_award_id":"52177205","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2339766197","https://openalex.org/W2497855708","https://openalex.org/W2617617186","https://openalex.org/W2897289100","https://openalex.org/W2922402609","https://openalex.org/W2951013095","https://openalex.org/W2973424750","https://openalex.org/W3007672649","https://openalex.org/W3016103383","https://openalex.org/W3120780860","https://openalex.org/W4285198919","https://openalex.org/W4285213030","https://openalex.org/W4289656132","https://openalex.org/W4293093467","https://openalex.org/W4320013853","https://openalex.org/W4320712823","https://openalex.org/W4323065749","https://openalex.org/W4361767830","https://openalex.org/W4388740360","https://openalex.org/W4391305489","https://openalex.org/W4404953262","https://openalex.org/W4411688070","https://openalex.org/W4414458685"],"related_works":[],"abstract_inverted_index":{"Line":[0],"short-circuit":[1],"faults":[2],"diagnosis":[3,25,33,42,87,103],"in":[4],"dc":[5],"microgrids":[6],"(dcMGs)":[7],"requires":[8],"high":[9],"rapidity":[10,142],"and":[11,18,35,47,51,57,116,124,141,151,166,174,195],"reliability":[12],"due":[13,29,74],"to":[14,30,75,137],"their":[15,31],"low":[16],"inertia":[17],"weak":[19],"overcurrent":[20],"capability.":[21],"At":[22],"present,":[23],"threshold-based":[24,85],"methods":[26],"are":[27,44,109,126,135],"popular":[28],"fast":[32],"speed":[34],"ease":[36],"of":[37,102,119,143,176,186],"employment.":[38],"However,":[39],"the":[40,80,93,100,112,129,139,184,187],"existing":[41],"thresholds":[43,134],"usually":[45,62],"fixed":[46],"determined":[48],"by":[49],"simulation":[50],"empirical":[52],"analysis,":[53],"which":[54,71],"lack":[55],"flexibility":[56,175],"adaptability.":[58],"In":[59],"addition,":[60],"they":[61],"depend":[63],"on":[64,161],"additional":[65],"line":[66,144,148,177],"current":[67,123],"and/or":[68],"voltage":[69,125,168],"sensors,":[70],"may":[72],"fail":[73],"sensor":[76],"faults.":[77],"To":[78],"solve":[79],"above":[81],"issues,":[82],"an":[83],"adaptive":[84],"fault":[86,130,145,157,178],"method":[88,159,189],"using":[89],"information":[90],"shared":[91],"with":[92],"local":[94],"converter":[95,121],"controller":[96],"is":[97,170,190],"proposed.":[98],"First,":[99],"difficulties":[101],"threshold":[104],"setting":[105],"under":[106],"fewer":[107],"sensors":[108,150],"revealed.":[110],"Second,":[111],"skewness,":[113],"cumulative":[114],"sum,":[115],"multistep":[117],"derivatives":[118],"single-end":[120],"bus-side":[122,167],"selected":[127],"as":[128],"features.":[131],"Adaptive":[132],"detection":[133],"designed":[136],"improve":[138],"accuracy":[140,173],"identification":[146],"without":[147],"current/voltage":[149],"communication":[152],"links.":[153],"Third,":[154],"a":[155],"modified":[156],"classification":[158,179],"based":[160],"real-time":[162],"calculated":[163],"quantile":[164],"interval":[165],"estimation":[169],"presented.":[171],"The":[172],"can":[180],"be":[181],"enhanced.":[182],"Finally,":[183],"performance":[185],"proposed":[188],"validated":[191],"through":[192],"MATLAB/Simulink":[193],"simulations":[194],"experimental":[196],"tests.":[197]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-11-25T00:00:00"}