{"id":"https://openalex.org/W7076051594","doi":"https://doi.org/10.1109/tie.2025.3589403","title":"A Novel Contactless DC Current Sensor Using a Highly Sensitive Thin-Film Lamb Wave Resonator With a Self-Aligned Micromagnet","display_name":"A Novel Contactless DC Current Sensor Using a Highly Sensitive Thin-Film Lamb Wave Resonator With a Self-Aligned Micromagnet","publication_year":2025,"publication_date":"2025-08-15","ids":{"openalex":"https://openalex.org/W7076051594","doi":"https://doi.org/10.1109/tie.2025.3589403"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2025.3589403","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3589403","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Wenwei Gao","orcid":"https://orcid.org/0009-0004-1504-4978"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenwei Gao","raw_affiliation_strings":["School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0004-1504-4978","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Feng Gao","orcid":"https://orcid.org/0009-0001-6068-2707"},"institutions":[{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Gao","raw_affiliation_strings":["College of ISEE and ZJU-Hangzhou Global Scientific and Technological Innovation Center, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0001-6068-2707","affiliations":[{"raw_affiliation_string":"College of ISEE and ZJU-Hangzhou Global Scientific and Technological Innovation Center, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I55712492"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chenyao Zhu","orcid":"https://orcid.org/0000-0002-8017-5366"},"institutions":[{"id":"https://openalex.org/I4210115494","display_name":"Baogang Group (China)","ror":"https://ror.org/01rt7y457","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210115494"]},{"id":"https://openalex.org/I4210156612","display_name":"Baotou Research Institute of Rare Earths","ror":"https://ror.org/05b3shf88","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210156612"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenyao Zhu","raw_affiliation_strings":["Baotou INST Magnetic New Materials Company, Ltd., Baotou, China"],"raw_orcid":"https://orcid.org/0000-0002-8017-5366","affiliations":[{"raw_affiliation_string":"Baotou INST Magnetic New Materials Company, Ltd., Baotou, China","institution_ids":["https://openalex.org/I4210115494","https://openalex.org/I4210156612"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Huikai Xie","orcid":"https://orcid.org/0000-0002-8393-0021"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huikai Xie","raw_affiliation_strings":["School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-8393-0021","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":null,"display_name":"Xiaoyi Wang","orcid":"https://orcid.org/0000-0002-6286-3085"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyi Wang","raw_affiliation_strings":["School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6286-3085","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I125839683"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.62129667,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"1","first_page":"1459","last_page":"1468"},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":{"id":"https://openalex.org/T13370","display_name":"Diverse Scientific and Economic Studies","score":0.04610000178217888,"subfield":{"id":"https://openalex.org/subfields/2002","display_name":"Economics and Econometrics"},"field":{"id":"https://openalex.org/fields/20","display_name":"Economics, Econometrics and Finance"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T13370","display_name":"Diverse Scientific and Economic Studies","score":0.04610000178217888,"subfield":{"id":"https://openalex.org/subfields/2002","display_name":"Economics and Econometrics"},"field":{"id":"https://openalex.org/fields/20","display_name":"Economics, Econometrics and Finance"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12773","display_name":"Water Quality and Resources Studies","score":0.03819999843835831,"subfield":{"id":"https://openalex.org/subfields/2312","display_name":"Water Science and Technology"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13398","display_name":"Data Analysis with R","score":0.021400000900030136,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.6825000047683716},{"id":"https://openalex.org/keywords/cantilever","display_name":"Cantilever","score":0.6492999792098999},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.6080999970436096},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.5751000046730042},{"id":"https://openalex.org/keywords/lamb-waves","display_name":"Lamb waves","score":0.48989999294281006},{"id":"https://openalex.org/keywords/etching","display_name":"Etching (microfabrication)","score":0.4846000075340271},{"id":"https://openalex.org/keywords/piezoelectricity","display_name":"Piezoelectricity","score":0.3894999921321869},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.3833000063896179},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.36309999227523804}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.754800021648407},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.6825000047683716},{"id":"https://openalex.org/C141354745","wikidata":"https://www.wikidata.org/wiki/Q17227","display_name":"Cantilever","level":2,"score":0.6492999792098999},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.6080999970436096},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.5751000046730042},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5508000254631042},{"id":"https://openalex.org/C142358356","wikidata":"https://www.wikidata.org/wiki/Q375680","display_name":"Lamb waves","level":3,"score":0.48989999294281006},{"id":"https://openalex.org/C100460472","wikidata":"https://www.wikidata.org/wiki/Q2368605","display_name":"Etching (microfabrication)","level":3,"score":0.4846000075340271},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4449999928474426},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.41589999198913574},{"id":"https://openalex.org/C100082104","wikidata":"https://www.wikidata.org/wiki/Q183759","display_name":"Piezoelectricity","level":2,"score":0.3894999921321869},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.3833000063896179},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.36309999227523804},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.35499998927116394},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3402999937534332},{"id":"https://openalex.org/C50587689","wikidata":"https://www.wikidata.org/wiki/Q4698328","display_name":"Air gap (plumbing)","level":2,"score":0.3391999900341034},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.33889999985694885},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.313400000333786},{"id":"https://openalex.org/C2777207636","wikidata":"https://www.wikidata.org/wiki/Q424481","display_name":"Lithium niobate","level":2,"score":0.31200000643730164},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.3098999857902527},{"id":"https://openalex.org/C2778460333","wikidata":"https://www.wikidata.org/wiki/Q4228979","display_name":"Optical ring resonators","level":3,"score":0.2973000109195709},{"id":"https://openalex.org/C201645281","wikidata":"https://www.wikidata.org/wiki/Q4155214","display_name":"Surface acoustic wave sensor","level":3,"score":0.29280000925064087},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.288100004196167},{"id":"https://openalex.org/C84174578","wikidata":"https://www.wikidata.org/wiki/Q889796","display_name":"Surface wave","level":2,"score":0.2806999981403351},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.2741999924182892},{"id":"https://openalex.org/C2776620479","wikidata":"https://www.wikidata.org/wiki/Q159241","display_name":"Direct current","level":3,"score":0.2728999853134155},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.2623000144958496},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.26019999384880066},{"id":"https://openalex.org/C173677008","wikidata":"https://www.wikidata.org/wiki/Q2094637","display_name":"Piezoelectric sensor","level":3,"score":0.25760000944137573},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.2540999948978424},{"id":"https://openalex.org/C162954803","wikidata":"https://www.wikidata.org/wiki/Q424074","display_name":"Surface acoustic wave","level":2,"score":0.2515999972820282}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2025.3589403","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3589403","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7258492112159729}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1980216055","https://openalex.org/W1988939913","https://openalex.org/W2045006221","https://openalex.org/W2056407449","https://openalex.org/W2087973592","https://openalex.org/W2152347296","https://openalex.org/W2186506441","https://openalex.org/W2562404898","https://openalex.org/W2566895335","https://openalex.org/W2604503217","https://openalex.org/W2809377310","https://openalex.org/W2889267154","https://openalex.org/W3000347616","https://openalex.org/W3027973333","https://openalex.org/W3117894964","https://openalex.org/W3128678093","https://openalex.org/W3129922250","https://openalex.org/W3196319793","https://openalex.org/W4200344944","https://openalex.org/W4221064556","https://openalex.org/W4285139056","https://openalex.org/W4312879288","https://openalex.org/W4367044435","https://openalex.org/W4386415561","https://openalex.org/W4386634508","https://openalex.org/W4400647443","https://openalex.org/W4402832409","https://openalex.org/W4406354560"],"related_works":[],"abstract_inverted_index":{"This":[0,90],"article":[1],"presents":[2],"a":[3,22,27,36,62,71,77,82,107,122,141,146,157],"novel":[4],"resonant":[5,63,104],"current":[6,17,148],"sensor":[7,20,43,176],"designed":[8],"for":[9,113,166,180],"contactless,":[10],"miniaturized,":[11],"high-sensitivity,":[12],"and":[13,35,49,133,156,189],"high-precision":[14],"static":[15],"dc":[16,167],"measurement.":[18],"The":[19,38],"features":[21],"cantilever":[23,75],"structure":[24,95],"integrated":[25],"with":[26,76],"thin-film":[28],"lithium":[29],"niobate":[30],"lamb":[31],"wave":[32],"resonator":[33],"(LWR)":[34],"micromagnet.":[37],"working":[39],"principle":[40],"of":[41,56,66,143,150,161],"the":[42,47,53,57,67,94,98,103,127,130,134,174],"is":[44,88,111,136],"based":[45,125],"on":[46,126],"torque":[48],"force":[50],"induced":[51],"by":[52],"magnetic":[54],"field":[55],"measured":[58],"current,":[59],"which":[60],"causes":[61],"frequency":[64],"shift":[65],"LWR.":[68],"To":[69],"integrate":[70],"30":[72],"\u00b5m":[73],"thick":[74,80],"400":[78],"nm":[79],"LWR,":[81],"dual-mask":[83],"deep":[84],"silicon":[85],"etching":[86],"process":[87,91,124],"employed.":[89],"ensures":[92],"that":[93,110,173],"can":[96],"support":[97],"magnet":[99,120,135],"while":[100],"also":[101],"maintaining":[102],"region":[105],"as":[106],"thin":[108],"film":[109],"favorable":[112],"LWR":[114],"operation.":[115],"Furthermore,":[116],"to":[117,163],"ensure":[118],"precise":[119],"placement,":[121],"self-aligning":[123],"attraction":[128],"between":[129],"nickel":[131],"layer":[132],"introduced.":[137],"Experimental":[138],"results":[139,171],"demonstrate":[140],"sensitivity":[142],"2.2":[144],"kHz/A,":[145],"minimum":[147],"resolution":[149],"0.6":[151],"A":[152,165],"in":[153,182],"open-loop":[154],"testing,":[155],"linear":[158],"measurement":[159],"range":[160],"up":[162],"70":[164],"wire":[168],"measurements.":[169],"These":[170],"suggest":[172],"proposed":[175],"has":[177],"strong":[178],"potential":[179],"applications":[181],"smart":[183],"meters,":[184],"battery":[185],"management":[186],"systems":[187],"(BMS),":[188],"electric":[190],"vehicle":[191],"charging":[192],"stations.":[193]},"counts_by_year":[],"updated_date":"2025-12-31T23:11:33.660297","created_date":"2025-10-10T00:00:00"}