{"id":"https://openalex.org/W4412623533","doi":"https://doi.org/10.1109/tie.2025.3587098","title":"Mitigation of Voltage Unbalancing in the Series-Connected GaN Switches Using Gate Current Injection Method","display_name":"Mitigation of Voltage Unbalancing in the Series-Connected GaN Switches Using Gate Current Injection Method","publication_year":2025,"publication_date":"2025-07-24","ids":{"openalex":"https://openalex.org/W4412623533","doi":"https://doi.org/10.1109/tie.2025.3587098"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2025.3587098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3587098","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031004293","display_name":"Siddhartha Suyal","orcid":"https://orcid.org/0000-0002-9409-3396"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Siddhartha Suyal","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Roorkee, Uttarakhand, India"],"raw_orcid":"https://orcid.org/0000-0002-9409-3396","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Roorkee, Uttarakhand, India","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101406646","display_name":"Apurv Kumar Yadav","orcid":"https://orcid.org/0000-0003-4050-8944"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Apurv Kumar Yadav","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Roorkee, Uttarakhand, India"],"raw_orcid":"https://orcid.org/0000-0003-4050-8944","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Roorkee, Uttarakhand, India","institution_ids":["https://openalex.org/I154851008"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5031004293"],"corresponding_institution_ids":["https://openalex.org/I154851008"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15494599,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"72","issue":"12","first_page":"12621","last_page":"12631"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9819999933242798,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6028020977973938},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5576307773590088},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5411189794540405},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5394319891929626},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.510141909122467},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.4900933504104614},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4702507555484772},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.46431586146354675},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46235594153404236},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4532117545604706},{"id":"https://openalex.org/keywords/gate-voltage","display_name":"Gate voltage","score":0.43167683482170105},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3705180883407593},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23262548446655273},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22740381956100464}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6028020977973938},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5576307773590088},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5411189794540405},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5394319891929626},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.510141909122467},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.4900933504104614},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4702507555484772},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.46431586146354675},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46235594153404236},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4532117545604706},{"id":"https://openalex.org/C2984119601","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Gate voltage","level":4,"score":0.43167683482170105},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3705180883407593},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23262548446655273},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22740381956100464},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2025.3587098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3587098","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.46000000834465027,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1656520974","https://openalex.org/W1904103275","https://openalex.org/W1965820000","https://openalex.org/W2029699094","https://openalex.org/W2139772385","https://openalex.org/W2153363401","https://openalex.org/W2155756103","https://openalex.org/W2218130918","https://openalex.org/W2329138937","https://openalex.org/W2406218257","https://openalex.org/W2464381483","https://openalex.org/W2559250475","https://openalex.org/W2762901730","https://openalex.org/W2769256280","https://openalex.org/W2769623822","https://openalex.org/W2798666355","https://openalex.org/W2803739488","https://openalex.org/W2806110253","https://openalex.org/W3096796181","https://openalex.org/W3107845073","https://openalex.org/W3111270381","https://openalex.org/W3134222763","https://openalex.org/W3134644989","https://openalex.org/W3140811503","https://openalex.org/W3195737161","https://openalex.org/W3198288414","https://openalex.org/W3217602007","https://openalex.org/W4225827112","https://openalex.org/W4285786398"],"related_works":["https://openalex.org/W4398198689","https://openalex.org/W2354365353","https://openalex.org/W1988437325","https://openalex.org/W2811287415","https://openalex.org/W2354835317","https://openalex.org/W2130152888","https://openalex.org/W2003918017","https://openalex.org/W2171140818","https://openalex.org/W2906102508","https://openalex.org/W3190489116"],"abstract_inverted_index":{"Due":[0],"to":[1,14,31,53,100,137,155],"their":[2,157],"lower":[3],"voltage-blocking":[4],"capacity,":[5],"gallium":[6],"nitride":[7],"(GaN)":[8],"devices":[9,23,51,84],"have":[10],"not":[11],"been":[12],"able":[13],"gain":[15],"much":[16],"popularity":[17],"in":[18,27,49],"higher":[19,37],"voltage":[20,38,47,65,102,118,146,177,192],"applications.":[21],"Two":[22],"can":[24],"be":[25],"connected":[26],"a":[28,33,75,87,93],"series":[29],"fashion":[30],"make":[32],"single":[34],"device":[35,57],"of":[36,46,104,141,143,147,187],"rating":[39],"effectively.":[40],"However,":[41],"there":[42],"is":[43,72,98],"an":[44,133],"issue":[45,67],"unbalance":[48,178],"series-connected":[50,70,105],"due":[52],"gate":[54,94,153],"circuit":[55],"and":[56,150,171,173],"parameters":[58],"mismatch.":[59],"In":[60],"this":[61],"article,":[62],"first,":[63],"the":[64,69,109,117,122,125,139,144,148,167,174],"unbalancing":[66],"for":[68,86],"switches":[71,107,123,149],"explained":[73],"by":[74,121],"simulation":[76],"model":[77],"using":[78,166],"LTspice,":[79],"incorporating":[80],"commercially":[81],"available":[82],"GaN":[83,106,168],"EPC2304":[85,170],"300":[88],"V":[89],"dc":[90,188],"link.":[91],"Then,":[92],"current":[95],"injection":[96],"technique":[97,131,162],"proposed":[99,161],"achieve":[101],"balancing":[103],"during":[108,124],"turn-<sc":[110,126],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[111,127,183],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">off</small>":[112],"period":[113],"while":[114],"also":[115],"reducing":[116],"overshoot":[119],"experienced":[120],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">on</small>":[128],"period.":[129],"The":[130,160],"uses":[132],"external":[134],"control":[135,156],"capacitance":[136],"sense":[138],"rate":[140],"transition":[142],"drain":[145],"inject":[151],"additional":[152],"currents":[154],"slew":[158],"rate.":[159],"was":[163,179],"experimentally":[164],"verified":[165],"switch":[169],"GS61008,":[172],"worst":[175],"case":[176],"reduced":[180],"under":[181],"<inline-formula":[182],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex-math":[184],"notation=\"LaTeX\">$\\pm":[185],"10\\%$</tex-math></inline-formula>":[186],"links":[189],"with":[190],"minimal":[191],"overshoot.":[193]},"counts_by_year":[],"updated_date":"2025-12-06T23:10:59.065948","created_date":"2025-10-10T00:00:00"}