{"id":"https://openalex.org/W4411408503","doi":"https://doi.org/10.1109/tie.2025.3572977","title":"Current Residual Double Normalization Fault Diagnosis Method for Interturn Short-Circuit Fault of PMSM Servo System","display_name":"Current Residual Double Normalization Fault Diagnosis Method for Interturn Short-Circuit Fault of PMSM Servo System","publication_year":2025,"publication_date":"2025-06-18","ids":{"openalex":"https://openalex.org/W4411408503","doi":"https://doi.org/10.1109/tie.2025.3572977"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2025.3572977","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3572977","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5115603932","display_name":"Yao Rao","orcid":"https://orcid.org/0000-0002-7888-5959"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yao Rao","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100391657","display_name":"Wei Wang","orcid":"https://orcid.org/0000-0001-5330-8189"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Wang","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jie Fu","orcid":"https://orcid.org/0009-0006-6474-8984"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jie Fu","raw_affiliation_strings":["Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000990702","display_name":"Peijuan Cui","orcid":"https://orcid.org/0000-0003-2319-535X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Peijuan Cui","raw_affiliation_strings":["Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072628233","display_name":"Zaiping Zheng","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zaiping Zheng","raw_affiliation_strings":["Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5115603932"],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":1.1617,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.79035901,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"72","issue":"12","first_page":"12309","last_page":"12320"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14474","display_name":"Industrial Technology and Control Systems","score":0.9708999991416931,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.783073902130127},{"id":"https://openalex.org/keywords/normalization","display_name":"Normalization (sociology)","score":0.7257055640220642},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5719041228294373},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5252344608306885},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5034167170524597},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4323037564754486},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.41355857253074646},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2733638882637024},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23775994777679443},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1549067199230194},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15373122692108154},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.14558276534080505},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1135103702545166},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07757216691970825},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.06959059834480286}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.783073902130127},{"id":"https://openalex.org/C136886441","wikidata":"https://www.wikidata.org/wiki/Q926129","display_name":"Normalization (sociology)","level":2,"score":0.7257055640220642},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5719041228294373},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5252344608306885},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5034167170524597},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4323037564754486},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.41355857253074646},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2733638882637024},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23775994777679443},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1549067199230194},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15373122692108154},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.14558276534080505},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1135103702545166},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07757216691970825},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.06959059834480286},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C19165224","wikidata":"https://www.wikidata.org/wiki/Q23404","display_name":"Anthropology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2025.3572977","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3572977","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.8899999856948853,"id":"https://metadata.un.org/sdg/13"}],"awards":[{"id":"https://openalex.org/G537890856","display_name":null,"funder_award_id":"51977036","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W2044676280","https://openalex.org/W2256456467","https://openalex.org/W2291339429","https://openalex.org/W2592087115","https://openalex.org/W2602794282","https://openalex.org/W2989544315","https://openalex.org/W2999256904","https://openalex.org/W3010877614","https://openalex.org/W3022961976","https://openalex.org/W3106674729","https://openalex.org/W3200371711","https://openalex.org/W4309324929","https://openalex.org/W4312335969","https://openalex.org/W4313063908","https://openalex.org/W4317496136","https://openalex.org/W4375929112","https://openalex.org/W4390692066","https://openalex.org/W4393853190","https://openalex.org/W4396766383","https://openalex.org/W4405845223","https://openalex.org/W4405967958"],"related_works":["https://openalex.org/W2591697403","https://openalex.org/W2944728705","https://openalex.org/W2904022177","https://openalex.org/W2359348847","https://openalex.org/W3011538607","https://openalex.org/W4297807321","https://openalex.org/W4385301753","https://openalex.org/W3186428265","https://openalex.org/W2171501125","https://openalex.org/W2617234683"],"abstract_inverted_index":{"The":[0,57,163],"stator":[1],"interturn":[2,52],"short-circuit":[3,53,123],"fault":[4,44,54,120],"can":[5],"cause":[6],"great":[7],"harm":[8],"to":[9,19,43,75,118,145,158],"the":[10,21,26,29,71,77,80,85,97,104,112,119,133,136,143,147,150,160,166],"permanent":[11],"magnet":[12],"synchronous":[13],"motor":[14],"(PMSM),":[15],"necessitating":[16],"timely":[17],"diagnosis":[18,55],"mitigate":[20],"damage.":[22],"Under":[23],"servo":[24,134],"conditions,":[25,135],"variation":[27],"of":[28,36,39,82,106,165],"speed,":[30],"torque,":[31],"and":[32,34,122,128],"amplitude":[33,127],"frequency":[35,129,161],"electrical":[37],"signals":[38],"PMSM":[40,59,73],"present":[41],"challenges":[42],"diagnosis.":[45],"This":[46],"article":[47],"proposes":[48],"a":[49,64,93],"double":[50],"normalization":[51],"method.":[56],"healthy":[58],"current":[60,74,88,113,121,137],"is":[61,90,109,115,139,153,169],"calculated":[62],"using":[63],"linear":[65],"extended":[66],"state":[67],"observer,":[68],"subtracted":[69],"from":[70],"faulty":[72],"generate":[76],"residual.":[78],"Considering":[79],"existence":[81],"model":[83,107],"errors,":[84],"second":[86],"harmonic":[87],"residual":[89,114,138],"converted":[91],"into":[92],"dc":[94,151],"component":[95,152],"in":[96],"negative":[98],"sequence":[99],"rotating":[100],"frame,":[101],"such":[102],"that":[103],"impact":[105],"parameters":[108],"reduced.":[110],"Since":[111],"directly":[116],"related":[117],"turns":[124],"ratio,":[125],"whose":[126],"will":[130],"change":[131],"under":[132],"first":[140],"divided":[141],"by":[142,155,171],"voltage":[144],"normalize":[146,159],"amplitude;":[148],"then":[149],"extracted":[154],"angle":[156],"integration":[157],"change.":[162],"effectiveness":[164],"proposed":[167],"method":[168],"verified":[170],"experimental":[172],"results.":[173]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}
