{"id":"https://openalex.org/W4408897590","doi":"https://doi.org/10.1109/tie.2025.3549106","title":"Enhanced Fault Detection, Localization, and Tolerance Strategy for Dual Active Bridge DC\u2013DC Converters Through Frequency-Domain Analysis of Remote Voltage","display_name":"Enhanced Fault Detection, Localization, and Tolerance Strategy for Dual Active Bridge DC\u2013DC Converters Through Frequency-Domain Analysis of Remote Voltage","publication_year":2025,"publication_date":"2025-03-27","ids":{"openalex":"https://openalex.org/W4408897590","doi":"https://doi.org/10.1109/tie.2025.3549106"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2025.3549106","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3549106","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://figshare.com/articles/journal_contribution/Enhanced_Fault_Detection_Localization_and_Tolerance_Strategy_for_Dual_Active_Bridge_DC_DC_Converters_Through_Frequency-Domain_Analysis_of_Remote_Voltage/28682654","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101991732","display_name":"Mingxue Li","orcid":"https://orcid.org/0000-0001-7549-3979"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingxue Li","raw_affiliation_strings":["School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-7549-3979","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061654203","display_name":"Dongsheng Yu","orcid":"https://orcid.org/0000-0002-2269-3659"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongsheng Yu","raw_affiliation_strings":["School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-2269-3659","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113017035","display_name":"Samson S. Yu","orcid":"https://orcid.org/0000-0002-2983-7344"},"institutions":[{"id":"https://openalex.org/I149704539","display_name":"Deakin University","ror":"https://ror.org/02czsnj07","country_code":"AU","type":"education","lineage":["https://openalex.org/I149704539"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Samson Shenglong Yu","raw_affiliation_strings":["School of Engineering, Deakin University, Burwood, VIC, Australia"],"raw_orcid":"https://orcid.org/0000-0002-2983-7344","affiliations":[{"raw_affiliation_string":"School of Engineering, Deakin University, Burwood, VIC, Australia","institution_ids":["https://openalex.org/I149704539"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100339629","display_name":"Xiaoqiang Li","orcid":"https://orcid.org/0000-0002-2782-2632"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoqiang Li","raw_affiliation_strings":["School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-2782-2632","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002397251","display_name":"Hua Geng","orcid":"https://orcid.org/0000-0002-8336-6731"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hua Geng","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-8336-6731","affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6136,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.89821322,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"72","issue":"10","first_page":"10847","last_page":"10858"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.8199002742767334},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5906839966773987},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.5272520780563354},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.5221105813980103},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4876319468021393},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4629116654396057},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4544163644313812},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.43651461601257324},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.4324200749397278},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.42864394187927246},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39343827962875366},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3647616505622864},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1333596408367157},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08445122838020325},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.08360067009925842}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.8199002742767334},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5906839966773987},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.5272520780563354},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5221105813980103},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4876319468021393},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4629116654396057},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4544163644313812},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.43651461601257324},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.4324200749397278},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42864394187927246},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39343827962875366},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3647616505622864},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1333596408367157},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08445122838020325},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.08360067009925842},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2025.3549106","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3549106","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:figshare.com:article/28682654","is_oa":true,"landing_page_url":"https://figshare.com/articles/journal_contribution/Enhanced_Fault_Detection_Localization_and_Tolerance_Strategy_for_Dual_Active_Bridge_DC_DC_Converters_Through_Frequency-Domain_Analysis_of_Remote_Voltage/28682654","pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:figshare.com:article/28682654","is_oa":true,"landing_page_url":"https://figshare.com/articles/journal_contribution/Enhanced_Fault_Detection_Localization_and_Tolerance_Strategy_for_Dual_Active_Bridge_DC_DC_Converters_Through_Frequency-Domain_Analysis_of_Remote_Voltage/28682654","pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W2001312628","https://openalex.org/W2093805979","https://openalex.org/W2158114484","https://openalex.org/W2169607864","https://openalex.org/W2174980551","https://openalex.org/W2298299401","https://openalex.org/W2554650592","https://openalex.org/W2590567059","https://openalex.org/W2740435195","https://openalex.org/W2752595229","https://openalex.org/W2865947436","https://openalex.org/W2883440686","https://openalex.org/W2888294792","https://openalex.org/W2908380120","https://openalex.org/W2913984744","https://openalex.org/W2972334793","https://openalex.org/W3040427592","https://openalex.org/W3108161764","https://openalex.org/W3115415148","https://openalex.org/W3196138522","https://openalex.org/W4226224530","https://openalex.org/W4285066555","https://openalex.org/W4285166629","https://openalex.org/W4285196187","https://openalex.org/W4288061904","https://openalex.org/W4312382222","https://openalex.org/W4313598785","https://openalex.org/W4321021477","https://openalex.org/W4327808956","https://openalex.org/W4389104985"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W4386859288","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2042495646","https://openalex.org/W3048918492"],"abstract_inverted_index":{"Featuring":[0],"high":[1,4],"control":[2,51,128],"flexibility,":[3],"efficiency,":[5],"and":[6,24,49,75,87,104,116,146,152,156,165],"fast":[7],"dynamic":[8],"response,":[9],"modular":[10],"dual":[11],"active":[12],"bridge":[13],"(DAB)":[14],"dc\u2013dc":[15],"converters":[16,28,72],"have":[17],"been":[18],"frequently":[19],"employed":[20],"for":[21,98],"energy":[22],"conversion":[23],"management.":[25],"However,":[26],"DAB":[27,71],"are":[29,78,161],"also":[30],"susceptible":[31],"to":[32,37],"open-circuit":[33,108],"faults,":[34],"primarily":[35],"attributed":[36],"the":[38,41,81,89,95,114,121,141],"vulnerability":[39],"of":[40,62,70,83,106,113,120,140,158],"power":[42],"switches.":[43],"Therefore,":[44],"a":[45,134],"fault":[46,85,99,109,126],"detection,":[47],"localization,":[48],"tolerance":[50,127],"method":[52,129,143],"is":[53,92,130,144],"proposed":[54,142],"in":[55,73],"this":[56,159],"work,":[57],"based":[58],"on":[59],"frequency-domain":[60],"analysis":[61,112],"far-end":[63],"or":[64],"remote":[65,84],"voltage.":[66,123],"The":[67,102,124,138,154],"frequency":[68],"characteristics":[69],"normal":[74],"faulty":[76],"operations":[77],"analyzed.":[79],"From":[80],"perspective":[82],"monitoring":[86],"diagnosis,":[88],"output":[90,122],"voltage":[91],"used":[93],"as":[94],"characteristic":[96],"variable":[97],"feature":[100],"extraction.":[101],"detection":[103],"localization":[105],"an":[107,111],"involve":[110],"fundamental":[115],"second":[117],"harmonic":[118],"components":[119],"associated":[125],"implemented":[131],"by":[132],"isolating":[133],"specific":[135],"secondary-side":[136],"switch.":[137],"realization":[139],"straightforward":[145],"cost-effective,":[147],"requiring":[148],"no":[149],"additional":[150],"devices":[151],"sensors.":[153],"feasibility":[155],"effectiveness":[157],"approach":[160],"validated":[162],"through":[163],"simulation":[164],"experimental":[166],"results.":[167]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":6}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}