{"id":"https://openalex.org/W4408048318","doi":"https://doi.org/10.1109/tie.2025.3544193","title":"Cumulative Degradation Modeling of Electrolytic Capacitors Considering Stress Interactions in Industrial Applications","display_name":"Cumulative Degradation Modeling of Electrolytic Capacitors Considering Stress Interactions in Industrial Applications","publication_year":2025,"publication_date":"2025-02-28","ids":{"openalex":"https://openalex.org/W4408048318","doi":"https://doi.org/10.1109/tie.2025.3544193"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2025.3544193","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3544193","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029059480","display_name":"Qisen Sun","orcid":"https://orcid.org/0000-0002-7038-2599"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qisen Sun","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-7038-2599","affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100622589","display_name":"Cen Chen","orcid":"https://orcid.org/0000-0002-5115-4929"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cen Chen","raw_affiliation_strings":["Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-5115-4929","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100347973","display_name":"Zicheng Wang","orcid":"https://orcid.org/0009-0003-2376-0977"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zicheng Wang","raw_affiliation_strings":["Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0009-0003-2376-0977","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048812154","display_name":"Xuerong Ye","orcid":"https://orcid.org/0000-0002-5258-2474"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuerong Ye","raw_affiliation_strings":["Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070592593","display_name":"Min Xie","orcid":"https://orcid.org/0000-0002-8500-8364"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Min Xie","raw_affiliation_strings":["Department of System Engineering, City University of Hong Kong, Kowloon, Hong Kong"],"raw_orcid":"https://orcid.org/0000-0002-8500-8364","affiliations":[{"raw_affiliation_string":"Department of System Engineering, City University of Hong Kong, Kowloon, Hong Kong","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072400262","display_name":"Guofu Zhai","orcid":"https://orcid.org/0000-0003-1026-6024"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guofu Zhai","raw_affiliation_strings":["Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0003-1026-6024","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5029059480"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":1.3062,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.79149021,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"72","issue":"9","first_page":"9739","last_page":"9747"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10409","display_name":"Fuel Cells and Related Materials","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10409","display_name":"Fuel Cells and Related Materials","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11557","display_name":"Lubricants and Their Additives","score":0.9598000049591064,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7927041053771973},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.7083495259284973},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7001535296440125},{"id":"https://openalex.org/keywords/electrolytic-capacitor","display_name":"Electrolytic capacitor","score":0.503147304058075},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41026541590690613},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3812738060951233},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30690324306488037},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.29237544536590576},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.29068779945373535},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26879972219467163}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7927041053771973},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.7083495259284973},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7001535296440125},{"id":"https://openalex.org/C79100374","wikidata":"https://www.wikidata.org/wiki/Q1326992","display_name":"Electrolytic capacitor","level":4,"score":0.503147304058075},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41026541590690613},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3812738060951233},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30690324306488037},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29237544536590576},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29068779945373535},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26879972219467163},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2025.3544193","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2025.3544193","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1932372884","https://openalex.org/W1993147091","https://openalex.org/W2063698062","https://openalex.org/W2150763729","https://openalex.org/W2298878005","https://openalex.org/W2333012428","https://openalex.org/W2434283531","https://openalex.org/W2802189195","https://openalex.org/W2810050724","https://openalex.org/W2885112526","https://openalex.org/W2980917194","https://openalex.org/W3081277493","https://openalex.org/W3085501598","https://openalex.org/W3093826633","https://openalex.org/W3101967035","https://openalex.org/W3111719526","https://openalex.org/W3134875744","https://openalex.org/W3193709370","https://openalex.org/W3209924521","https://openalex.org/W3212174914","https://openalex.org/W4206821103","https://openalex.org/W4210468526","https://openalex.org/W4226266931","https://openalex.org/W4285060907","https://openalex.org/W4295347206","https://openalex.org/W4311439068","https://openalex.org/W4365130637","https://openalex.org/W4386322102","https://openalex.org/W4387448875","https://openalex.org/W4399666071"],"related_works":["https://openalex.org/W1988437325","https://openalex.org/W2558839413","https://openalex.org/W1969544509","https://openalex.org/W2939139470","https://openalex.org/W2536788144","https://openalex.org/W2377409801","https://openalex.org/W2167108869","https://openalex.org/W2007755361","https://openalex.org/W2039437343","https://openalex.org/W2317423517"],"abstract_inverted_index":{"Electrolytic":[0],"capacitors":[1],"are":[2,62],"vital":[3],"to":[4,66,86,142,173],"the":[5,16,37,49,88,101,107,126,152,164,170,176],"functionality":[6],"of":[7,20,48,90,103,109,129,169],"power":[8],"electronic":[9],"converters,":[10],"with":[11,125],"their":[12],"degradation":[13,38,59,80,91,108,130],"significantly":[14],"affecting":[15],"safety":[17],"and":[18,72,146,154,167],"reliability":[19,70],"these":[21],"devices.":[22],"Capacitors":[23],"typically":[24],"operate":[25],"under":[26,39,93,132],"dynamic":[27,40,94],"rather":[28],"than":[29],"constant":[30,133],"stress":[31,41,51,84,123,134],"levels":[32],"in":[33,106],"industrial":[34],"applications.":[35],"Quantifying":[36],"is":[42,140],"challenging,":[43],"as":[44],"it":[45],"requires":[46],"consideration":[47],"potential":[50],"interactions.":[52],"Although":[53],"such":[54],"interactions":[55,85,124],"can":[56],"profoundly":[57],"affect":[58],"paths,":[60],"they":[61],"often":[63],"overlooked,":[64],"leading":[65],"significant":[67],"deviations":[68],"between":[69],"predictions":[71],"engineering":[73],"practices.":[74],"This":[75,96],"article":[76,97],"introduces":[77],"a":[78,119,148],"cumulative":[79],"model":[81],"that":[82],"considers":[83],"enhance":[87,143],"accuracy":[89,145,168],"prediction":[92,144],"stress.":[95],"not":[98],"only":[99],"identifies":[100],"existence":[102],"path":[104,137],"dependence":[105],"electrolytic":[110],"capacitor":[111],"parameters":[112],"but":[113],"also,":[114],"building":[115],"upon":[116],"this,":[117],"presents":[118],"method":[120,178],"for":[121,151,158],"integrating":[122],"existing":[127],"foundation":[128],"modeling":[131],"conditions.":[135],"A":[136],"adjustment":[138],"factor":[139],"introduced":[141],"provide":[147],"detailed":[149],"methodology":[150],"experimental":[153],"data":[155],"analysis":[156],"required":[157],"its":[159],"estimation.":[160],"Experimental":[161],"evidence":[162],"confirms":[163],"practical":[165],"applicability":[166],"method.":[171],"Compared":[172],"conventional":[174],"models,":[175],"proposed":[177],"considerably":[179],"enhances":[180],"computational":[181],"accuracy.":[182]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}