{"id":"https://openalex.org/W4404179936","doi":"https://doi.org/10.1109/tie.2024.3485718","title":"Electromagnetic Time Reversal Localization Method for Distribution Cables Based on Reflection Coefficient Modification","display_name":"Electromagnetic Time Reversal Localization Method for Distribution Cables Based on Reflection Coefficient Modification","publication_year":2024,"publication_date":"2024-11-08","ids":{"openalex":"https://openalex.org/W4404179936","doi":"https://doi.org/10.1109/tie.2024.3485718"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2024.3485718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3485718","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078742258","display_name":"Guangya Zhu","orcid":"https://orcid.org/0000-0003-3790-4014"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangya Zhu","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3790-4014","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102523108","display_name":"Songkun Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songkun Pan","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","college of Electronics and Information Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0003-0805-3297","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"college of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24201400","https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100366031","display_name":"Lu Lu","orcid":"https://orcid.org/0000-0002-6077-0977"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lu Lu","raw_affiliation_strings":["College of Electronics and Information Engineering, Sichuan University, Chengdu, China","High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-6077-0977","affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24201400","https://openalex.org/I24185976"]},{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033519367","display_name":"Pengfei Meng","orcid":"https://orcid.org/0000-0002-8279-3491"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Meng","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-8279-3491","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077489891","display_name":"Zhaogui Liu","orcid":"https://orcid.org/0000-0002-8846-8059"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaogui Liu","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-8846-8059","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Xinyi Wang","orcid":"https://orcid.org/0009-0009-6445-5999"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinyi Wang","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0009-6445-5999","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101328527","display_name":"Kai Zhou","orcid":"https://orcid.org/0009-0003-8124-7960"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Zhou","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0003-8124-7960","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1812,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.78012325,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"72","issue":"6","first_page":"6497","last_page":"6506"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9793999791145325,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.7585409879684448},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.5949755907058716},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.47864997386932373},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.4140237867832184},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3514549732208252},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34724289178848267},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3377547264099121},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3178468942642212},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.27711233496665955},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.241877943277359},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.2161281704902649},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19847986102104187}],"concepts":[{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.7585409879684448},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.5949755907058716},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.47864997386932373},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.4140237867832184},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3514549732208252},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34724289178848267},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3377547264099121},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3178468942642212},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.27711233496665955},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.241877943277359},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.2161281704902649},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19847986102104187},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2024.3485718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3485718","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.49000000953674316,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2461668777","display_name":null,"funder_award_id":"5400-202318550A-3-2-ZN","funder_id":"https://openalex.org/F4320326707","funder_display_name":"State Grid Corporation of China"},{"id":"https://openalex.org/G4077621543","display_name":null,"funder_award_id":"2023NSFSC0451","funder_id":"https://openalex.org/F4320329861","funder_display_name":"Natural Science Foundation of Sichuan Province"},{"id":"https://openalex.org/G4760468370","display_name":null,"funder_award_id":"2023NSFSC0820","funder_id":"https://openalex.org/F4320329861","funder_display_name":"Natural Science Foundation of Sichuan Province"},{"id":"https://openalex.org/G6477918544","display_name":null,"funder_award_id":"52107160","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8883337509","display_name":null,"funder_award_id":"62371319","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326707","display_name":"State Grid Corporation of China","ror":"https://ror.org/05twwhs70"},{"id":"https://openalex.org/F4320329861","display_name":"Natural Science Foundation of Sichuan Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W2006659608","https://openalex.org/W2015962916","https://openalex.org/W2073887634","https://openalex.org/W2095736798","https://openalex.org/W2155077058","https://openalex.org/W2156859338","https://openalex.org/W2528841625","https://openalex.org/W2575508801","https://openalex.org/W2791446099","https://openalex.org/W2807617370","https://openalex.org/W3032077192","https://openalex.org/W3033820873","https://openalex.org/W3153103222","https://openalex.org/W3158124358","https://openalex.org/W3211852961","https://openalex.org/W4285197207","https://openalex.org/W4285531398","https://openalex.org/W4288391496","https://openalex.org/W4312408048","https://openalex.org/W4366308976","https://openalex.org/W4376607980","https://openalex.org/W4390187452","https://openalex.org/W4391661557","https://openalex.org/W4392114397","https://openalex.org/W4392607799","https://openalex.org/W4394585976","https://openalex.org/W6636689933"],"related_works":["https://openalex.org/W3052101671","https://openalex.org/W2102167196","https://openalex.org/W4386004670","https://openalex.org/W2362680144","https://openalex.org/W2038558525","https://openalex.org/W2329459365","https://openalex.org/W860648897","https://openalex.org/W1971503079","https://openalex.org/W2363386573","https://openalex.org/W1416700706"],"abstract_inverted_index":{"Accurate":[0],"and":[1,43,100,109,123],"rapid":[2],"localization":[3,54,82],"of":[4,15,39,84],"cable":[5,17,31,120],"faults":[6],"is":[7,86,105,117],"crucial":[8],"for":[9],"enhancing":[10],"the":[11,36,52,77,81,94,114],"power":[12],"supply":[13],"reliability":[14],"distribution":[16],"systems.":[18],"The":[19,73,90],"traditional":[20],"electromagnetic":[21],"time":[22],"reversal":[23],"(EMTR)":[24],"method":[25,66,116],"was":[26],"utilized":[27],"to":[28,35,48],"accurately":[29],"localize":[30],"faults.":[32],"However,":[33],"due":[34],"nonlinear":[37],"characteristics":[38],"fault":[40,45,78,124],"development,":[41],"unknown":[42],"varying":[44],"resistances":[46],"lead":[47],"significant":[49],"deviations":[50],"in":[51,88],"EMTR":[53,65,85,95],"results.":[55],"To":[56],"address":[57],"this":[58,60],"issue,":[59],"article":[61],"proposes":[62],"an":[63],"improved":[64],"based":[67],"on":[68],"reflection":[69,91],"coefficient":[70],"modification":[71],"(EMTR-RCM).":[72],"mechanism":[74],"by":[75],"which":[76],"resistance":[79],"affects":[80],"accuracy":[83],"analyzed":[87],"detail.":[89],"coefficients":[92],"during":[93],"backward-time":[96],"process":[97],"are":[98],"modified,":[99],"a":[101],"new":[102],"transfer":[103],"function":[104],"designed.":[106],"Experimental":[107],"validation":[108],"simulation":[110],"analysis":[111],"demonstrate":[112],"that":[113],"proposed":[115],"robust":[118],"against":[119],"operating":[121],"conditions":[122],"types.":[125]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}