{"id":"https://openalex.org/W4402389439","doi":"https://doi.org/10.1109/tie.2024.3447752","title":"Multishot Structured-Light 3-D Scanning for Surfaces in Challenging Motion","display_name":"Multishot Structured-Light 3-D Scanning for Surfaces in Challenging Motion","publication_year":2024,"publication_date":"2024-09-10","ids":{"openalex":"https://openalex.org/W4402389439","doi":"https://doi.org/10.1109/tie.2024.3447752"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2024.3447752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3447752","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035522701","display_name":"Minghui Duan","orcid":"https://orcid.org/0000-0001-6878-5834"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Minghui Duan","raw_affiliation_strings":["School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Anhui, China"],"raw_orcid":"https://orcid.org/0000-0001-6878-5834","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Anhui, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030326528","display_name":"Yabing Zheng","orcid":"https://orcid.org/0000-0002-2142-8095"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yabing Zheng","raw_affiliation_strings":["Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China"],"raw_orcid":"https://orcid.org/0000-0002-2142-8095","affiliations":[{"raw_affiliation_string":"Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039480817","display_name":"Yi Jin","orcid":"https://orcid.org/0000-0001-8232-3863"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Jin","raw_affiliation_strings":["Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China"],"raw_orcid":"https://orcid.org/0000-0001-8232-3863","affiliations":[{"raw_affiliation_string":"Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003931624","display_name":"Jinjin Zheng","orcid":"https://orcid.org/0000-0003-4663-5880"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinjin Zheng","raw_affiliation_strings":["Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China"],"raw_orcid":"https://orcid.org/0000-0003-4663-5880","affiliations":[{"raw_affiliation_string":"Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048237545","display_name":"Enhong Chen","orcid":"https://orcid.org/0000-0002-4835-4102"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Enhong Chen","raw_affiliation_strings":["Department of Computer Science, University of Science and Technology of China, Anhui, China"],"raw_orcid":"https://orcid.org/0000-0002-4835-4102","affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Science and Technology of China, Anhui, China","institution_ids":["https://openalex.org/I126520041"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5035522701"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":0.3583,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55650706,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"72","issue":"4","first_page":"4269","last_page":"4279"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9729999899864197,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9729999899864197,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9441999793052673,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9370999932289124,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/structured-light","display_name":"Structured light","score":0.6173220276832581},{"id":"https://openalex.org/keywords/motion","display_name":"Motion (physics)","score":0.4795403480529785},{"id":"https://openalex.org/keywords/3d-scanning","display_name":"3d scanning","score":0.43502819538116455},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.42771393060684204},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.426200807094574},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42105239629745483},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.41460880637168884},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37596532702445984},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.3507707417011261},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2939249575138092}],"concepts":[{"id":"https://openalex.org/C193581530","wikidata":"https://www.wikidata.org/wiki/Q683778","display_name":"Structured light","level":2,"score":0.6173220276832581},{"id":"https://openalex.org/C104114177","wikidata":"https://www.wikidata.org/wiki/Q79782","display_name":"Motion (physics)","level":2,"score":0.4795403480529785},{"id":"https://openalex.org/C3019493240","wikidata":"https://www.wikidata.org/wiki/Q94701573","display_name":"3d scanning","level":2,"score":0.43502819538116455},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.42771393060684204},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.426200807094574},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42105239629745483},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.41460880637168884},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37596532702445984},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.3507707417011261},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2939249575138092}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2024.3447752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3447752","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1816819197","display_name":null,"funder_award_id":"202304a05020072","funder_id":"https://openalex.org/F4320336578","funder_display_name":"Anhui Provincial Key Research and Development Plan"},{"id":"https://openalex.org/G5808503682","display_name":null,"funder_award_id":"JZ2024HGQA0100","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null},{"id":"https://openalex.org/F4320336578","display_name":"Anhui Provincial Key Research and Development Plan","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1964859077","https://openalex.org/W1997310089","https://openalex.org/W2009501432","https://openalex.org/W2028893534","https://openalex.org/W2044230059","https://openalex.org/W2047815317","https://openalex.org/W2050353448","https://openalex.org/W2119460517","https://openalex.org/W2167667767","https://openalex.org/W2396283514","https://openalex.org/W2505895835","https://openalex.org/W2605648900","https://openalex.org/W2759428153","https://openalex.org/W2772813103","https://openalex.org/W2777119554","https://openalex.org/W2778531572","https://openalex.org/W2784138225","https://openalex.org/W2804654620","https://openalex.org/W2901765845","https://openalex.org/W2953583120","https://openalex.org/W2955179830","https://openalex.org/W2964321433","https://openalex.org/W3003954661","https://openalex.org/W3035279286","https://openalex.org/W3072075124","https://openalex.org/W3110031215","https://openalex.org/W3177381575","https://openalex.org/W3179805570","https://openalex.org/W3194784384","https://openalex.org/W4229061174","https://openalex.org/W4285140247","https://openalex.org/W4293704341","https://openalex.org/W4391827404"],"related_works":["https://openalex.org/W2392375636","https://openalex.org/W2371021624","https://openalex.org/W2061654637","https://openalex.org/W3196662484","https://openalex.org/W2072617475","https://openalex.org/W4206062533","https://openalex.org/W4205108487","https://openalex.org/W2072635527","https://openalex.org/W2748512799","https://openalex.org/W2311729434"],"abstract_inverted_index":{"Challenging":[0],"motion,":[1],"resulting":[2],"in":[3,11,52],"serious":[4,62],"motion":[5,36,63,82,98,118,179],"artifacts,":[6,83],"is":[7,111],"a":[8,23,43,86,104,183],"well-known":[9],"problem":[10],"structured-light":[12],"(SL)":[13],"3-D":[14,60,157,174],"scanning.":[15],"Single-shot":[16],"imaging":[17],"or":[18,32],"tracking":[19],"interframe":[20,94],"offsets":[21],"provides":[22],"solution;":[24],"however,":[25],"these":[26],"methods":[27,123],"either":[28],"sacrifice":[29],"spatial":[30],"resolution":[31],"work":[33],"on":[34,125],"slow":[35],"under":[37,136],"quasi-still":[38],"photography.":[39],"This":[40],"article":[41],"presents":[42],"universal":[44],"multishot":[45],"SL":[46,156,173],"(MS-SL)":[47],"strategy":[48,150,166],"to":[49,154,176],"measure":[50],"surfaces":[51],"challenging":[53,178],"motion.":[54],"During":[55],"the":[56,67,78,93,116,131,141,168],"acquisition":[57],"of":[58,81,146,172,186],"MS-SL":[59],"scanning,":[61],"artifacts":[64],"diffuse":[65],"into":[66],"overall":[68],"image":[69],"sequence,":[70],"showing":[71],"long-range":[72],"and":[73,96,107,133,144,161,181],"short-range":[74],"effects.":[75],"To":[76],"quantify":[77],"different":[79],"effects":[80],"we":[84],"establish":[85],"spatiotemporal":[87,147],"artifact":[88],"coupling":[89],"(STAC)":[90],"model":[91],"fusing":[92],"ghosts":[95],"intraframe":[97],"blur.":[99],"Furthermore,":[100],"without":[101],"complicated":[102],"decoupling,":[103],"unified":[105],"deghosting":[106],"deblurring":[108],"(UDD)":[109],"framework":[110],"constructed":[112],"for":[113],"automatically":[114],"removing":[115],"coupled":[117],"artifacts.":[119],"Unlike":[120],"existing":[121],"restoration":[122],"functioning":[124],"natural":[126],"images,":[127],"UDD":[128],"can":[129,151],"recover":[130],"intensity":[132],"phase":[134],"distributions":[135],"periodically":[137],"encoded":[138],"illumination.":[139],"Through":[140],"adaptive":[142],"extraction":[143],"utilization":[145],"mapping,":[148],"our":[149,165],"be":[152],"applied":[153],"various":[155,177],"scanning":[158,175],"technologies.":[159],"Simulations":[160],"experiments":[162],"prove":[163],"that":[164],"extends":[167],"excellent":[169],"metrological":[170],"performance":[171],"scenes":[180],"achieves":[182],"measurement":[184],"accuracy":[185],"0.03":[187],"mm.":[188]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-21T23:12:01.093139","created_date":"2025-10-10T00:00:00"}