{"id":"https://openalex.org/W4399527393","doi":"https://doi.org/10.1109/tie.2024.3395781","title":"Transient Stability Enhancement of Current Limited-GFM Inverters Based on Varying Virtual Impedance","display_name":"Transient Stability Enhancement of Current Limited-GFM Inverters Based on Varying Virtual Impedance","publication_year":2024,"publication_date":"2024-06-11","ids":{"openalex":"https://openalex.org/W4399527393","doi":"https://doi.org/10.1109/tie.2024.3395781"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2024.3395781","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3395781","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022051466","display_name":"Ling Zhan","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ling Zhan","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028352417","display_name":"Bin Hu","orcid":"https://orcid.org/0000-0003-3286-4607"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Hu","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006971723","display_name":"Liang Chen","orcid":"https://orcid.org/0000-0003-2036-6328"},"institutions":[{"id":"https://openalex.org/I159389169","display_name":"Ningbo University of Technology","ror":"https://ror.org/037dym702","country_code":"CN","type":"education","lineage":["https://openalex.org/I159389169"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Chen","raw_affiliation_strings":["School of Information Science and Engineering, NingboTech University, Ningbo, China"],"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, NingboTech University, Ningbo, China","institution_ids":["https://openalex.org/I159389169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102925644","display_name":"Yuming Liao","orcid":"https://orcid.org/0009-0007-1935-1301"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuming Liao","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100457414","display_name":"Meng Li","orcid":"https://orcid.org/0000-0001-9442-6384"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Li","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013983336","display_name":"Heng Nian","orcid":"https://orcid.org/0000-0003-4816-084X"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Heng Nian","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5022051466"],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":6.4796,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.97000418,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"71","issue":"12","first_page":"15946","last_page":"15958"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14444","display_name":"Power Systems and Renewable Energy","score":0.9803000092506409,"subfield":{"id":"https://openalex.org/subfields/2102","display_name":"Energy Engineering and Power Technology"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14444","display_name":"Power Systems and Renewable Energy","score":0.9803000092506409,"subfield":{"id":"https://openalex.org/subfields/2102","display_name":"Energy Engineering and Power Technology"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9728000164031982,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":0.9354000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.7274864315986633},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6427905559539795},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.5867446064949036},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.5629467368125916},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5304272174835205},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5188887715339661},{"id":"https://openalex.org/keywords/focused-impedance-measurement","display_name":"Focused Impedance Measurement","score":0.44342201948165894},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.41416144371032715},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.4101415276527405},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40614965558052063},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37983813881874084},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.37740373611450195},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37263941764831543},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22128364443778992},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16496878862380981}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.7274864315986633},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6427905559539795},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.5867446064949036},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.5629467368125916},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5304272174835205},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5188887715339661},{"id":"https://openalex.org/C172066009","wikidata":"https://www.wikidata.org/wiki/Q5463955","display_name":"Focused Impedance Measurement","level":3,"score":0.44342201948165894},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.41416144371032715},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.4101415276527405},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40614965558052063},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37983813881874084},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.37740373611450195},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37263941764831543},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22128364443778992},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16496878862380981},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2024.3395781","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3395781","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6899999976158142}],"awards":[{"id":"https://openalex.org/G1179018120","display_name":null,"funder_award_id":"52325702","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1965885281","https://openalex.org/W1994959046","https://openalex.org/W2157617966","https://openalex.org/W2238280276","https://openalex.org/W2483605635","https://openalex.org/W2612483862","https://openalex.org/W2750703600","https://openalex.org/W2897459764","https://openalex.org/W2899274790","https://openalex.org/W2965352614","https://openalex.org/W2996528132","https://openalex.org/W3046421068","https://openalex.org/W3047876507","https://openalex.org/W3081965210","https://openalex.org/W3110874572","https://openalex.org/W3164185548","https://openalex.org/W3213107319","https://openalex.org/W4205178995","https://openalex.org/W4250628974","https://openalex.org/W4283745142","https://openalex.org/W4285266682","https://openalex.org/W4312739724","https://openalex.org/W4312752011","https://openalex.org/W4312939821","https://openalex.org/W4315783940","https://openalex.org/W4386590704","https://openalex.org/W4391406937","https://openalex.org/W4392980198"],"related_works":["https://openalex.org/W2545105407","https://openalex.org/W4297786912","https://openalex.org/W1530957495","https://openalex.org/W2572422521","https://openalex.org/W2562155397","https://openalex.org/W2356432821","https://openalex.org/W2752941547","https://openalex.org/W1990323938","https://openalex.org/W2072189119","https://openalex.org/W4243306918"],"abstract_inverted_index":{"Due":[0],"to":[1,112,133],"the":[2,9,21,24,35,47,53,61,73,77,95,104,113,117,126],"limited":[3],"overcurrent":[4,15],"capability":[5],"of":[6,31,37,49,80,97],"semiconductor":[7],"components,":[8],"grid-forming":[10],"(GFM)":[11],"inverters":[12],"require":[13],"additional":[14],"protection":[16],"schemes.":[17],"This":[18,100],"article":[19],"analyzes":[20],"interaction":[22],"between":[23],"circular":[25,54],"current":[26,50],"limiter":[27],"and":[28,66,147],"different":[29],"types":[30],"virtual":[32],"impedance":[33,63,68],"from":[34],"perspective":[36],"transient":[38,90,109],"stability.":[39],"The":[40,86],"established":[41],"unified":[42],"equivalent":[43],"circuit":[44],"model":[45],"reveals":[46],"mechanism":[48],"limitation":[51],"by":[52,94],"limiter,":[55],"which":[56,131],"is":[57,92,129,143],"based":[58,124],"on":[59,125],"both":[60],"feedforward-virtual":[62],"(FVI)":[64],"method":[65,106,115,128],"embedded-virtual":[67],"(EVI)":[69],"method.":[70],"Although":[71],"with":[72],"same":[74,118],"current-limiting":[75],"effects,":[76],"power-angle":[78,98],"characteristics":[79],"these":[81],"two":[82],"methods":[83],"are":[84],"different.":[85],"dominant":[87],"factor":[88],"influencing":[89],"stability":[91,110],"demonstrated":[93],"analysis":[96,142],"trajectory.":[99],"study":[101],"observes":[102],"that":[103],"EVI":[105,127],"exhibits":[107],"superior":[108],"compared":[111],"FVI":[114],"under":[116],"parameters.":[119],"Further,":[120],"a":[121],"parameter-switching":[122],"approach":[123],"proposed,":[130],"aims":[132],"achieve":[134],"an":[135],"extended":[136],"fault":[137],"ride-through":[138],"duration.":[139],"Finally,":[140],"theoretical":[141],"validated":[144],"through":[145],"simulations":[146],"control":[148],"hardware-in-the-loop":[149],"experiments.":[150]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":29},{"year":2024,"cited_by_count":5}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}