{"id":"https://openalex.org/W4394966811","doi":"https://doi.org/10.1109/tie.2024.3382977","title":"Open-Circuit Fault Diagnosis and Fault-Tolerant Control for a Coupled-Inductor-Based Aalborg Inverter","display_name":"Open-Circuit Fault Diagnosis and Fault-Tolerant Control for a Coupled-Inductor-Based Aalborg Inverter","publication_year":2024,"publication_date":"2024-04-19","ids":{"openalex":"https://openalex.org/W4394966811","doi":"https://doi.org/10.1109/tie.2024.3382977"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2024.3382977","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3382977","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://vbn.aau.dk/ws/files/822960972/Open-Circuit_Fault_Diagnosis_and_Fault-Tolerant_Control_for_a_Coupled-Inductor-Based_Aalborg_Inverter.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002045349","display_name":"Chengqi Xiao","orcid":"https://orcid.org/0009-0007-4031-6041"},"institutions":[{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengqi Xiao","raw_affiliation_strings":["Electrical Engineering Department, Shanghai Maritime University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0007-4031-6041","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Shanghai Maritime University, Shanghai, China","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Weimin Wu","orcid":"https://orcid.org/0000-0002-1567-7917"},"institutions":[{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weimin Wu","raw_affiliation_strings":["Electrical Engineering Department, Shanghai Maritime University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1567-7917","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Shanghai Maritime University, Shanghai, China","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101945167","display_name":"Jian\u2010Ming Chen","orcid":"https://orcid.org/0009-0008-3150-1891"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jianming Chen","raw_affiliation_strings":["Photovoltaic Division, Zhejiang Hengfu Electric Co., Ltd., Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0008-3150-1891","affiliations":[{"raw_affiliation_string":"Photovoltaic Division, Zhejiang Hengfu Electric Co., Ltd., Hangzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071434403","display_name":"Eftichios Koutroulis","orcid":"https://orcid.org/0000-0003-1285-8840"},"institutions":[{"id":"https://openalex.org/I55741626","display_name":"Technical University of Crete","ror":"https://ror.org/03f8bz564","country_code":"GR","type":"education","lineage":["https://openalex.org/I55741626"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Eftichios Koutroulis","raw_affiliation_strings":["School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece"],"raw_orcid":"https://orcid.org/0000-0003-1285-8840","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece","institution_ids":["https://openalex.org/I55741626"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039395705","display_name":"Frede Blaabjerg","orcid":"https://orcid.org/0000-0001-8311-7412"},"institutions":[{"id":"https://openalex.org/I891191580","display_name":"Aalborg University","ror":"https://ror.org/04m5j1k67","country_code":"DK","type":"education","lineage":["https://openalex.org/I891191580"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Frede Blaabjerg","raw_affiliation_strings":["Energy Engineering Department, Aalborg University, Aalborg, Denmark"],"raw_orcid":"https://orcid.org/0000-0001-8311-7412","affiliations":[{"raw_affiliation_string":"Energy Engineering Department, Aalborg University, Aalborg, Denmark","institution_ids":["https://openalex.org/I891191580"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.9039,"has_fulltext":true,"cited_by_count":11,"citation_normalized_percentile":{"value":0.85686006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"71","issue":"11","first_page":"14044","last_page":"14053"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.8181681036949158},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7458366751670837},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.732947587966919},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5402223467826843},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5232152938842773},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.5041991472244263},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4971783459186554},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4602910280227661},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.425814151763916},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.41386160254478455},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3950742483139038},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.371182918548584},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.30823031067848206},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18589526414871216},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.16247111558914185},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1392148733139038}],"concepts":[{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.8181681036949158},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7458366751670837},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.732947587966919},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5402223467826843},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5232152938842773},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.5041991472244263},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4971783459186554},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4602910280227661},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.425814151763916},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.41386160254478455},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3950742483139038},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.371182918548584},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.30823031067848206},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18589526414871216},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.16247111558914185},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1392148733139038},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2024.3382977","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3382977","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:publications/3e472752-c2d5-411c-b1a8-158ba60bb40b","is_oa":true,"landing_page_url":"https://vbn.aau.dk/da/publications/3e472752-c2d5-411c-b1a8-158ba60bb40b","pdf_url":"https://vbn.aau.dk/ws/files/822960972/Open-Circuit_Fault_Diagnosis_and_Fault-Tolerant_Control_for_a_Coupled-Inductor-Based_Aalborg_Inverter.pdf","source":{"id":"https://openalex.org/S4306401731","display_name":"VBN Forskningsportal (Aalborg Universitet)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I891191580","host_organization_name":"Aalborg University","host_organization_lineage":["https://openalex.org/I891191580"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Xiao, C, Wu, W, Chen, J, Koutroulis, E & Blaabjerg, F 2024, 'Open-Circuit Fault Diagnosis and Fault-Tolerant Control for a Coupled-Inductor-Based Aalborg Inverter', IEEE Transactions on Industrial Electronics, vol. 71, no. 11, pp. 14044-14053. https://doi.org/10.1109/TIE.2024.3382977","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:pure.atira.dk:publications/3e472752-c2d5-411c-b1a8-158ba60bb40b","is_oa":true,"landing_page_url":"https://vbn.aau.dk/da/publications/3e472752-c2d5-411c-b1a8-158ba60bb40b","pdf_url":"https://vbn.aau.dk/ws/files/822960972/Open-Circuit_Fault_Diagnosis_and_Fault-Tolerant_Control_for_a_Coupled-Inductor-Based_Aalborg_Inverter.pdf","source":{"id":"https://openalex.org/S4306401731","display_name":"VBN Forskningsportal (Aalborg Universitet)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I891191580","host_organization_name":"Aalborg University","host_organization_lineage":["https://openalex.org/I891191580"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Xiao, C, Wu, W, Chen, J, Koutroulis, E & Blaabjerg, F 2024, 'Open-Circuit Fault Diagnosis and Fault-Tolerant Control for a Coupled-Inductor-Based Aalborg Inverter', IEEE Transactions on Industrial Electronics, vol. 71, no. 11, pp. 14044-14053. https://doi.org/10.1109/TIE.2024.3382977","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.5600000023841858}],"awards":[{"id":"https://openalex.org/G621382188","display_name":null,"funder_award_id":"U22A20216","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8602518336","display_name":null,"funder_award_id":"52177186","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4394966811.pdf","grobid_xml":"https://content.openalex.org/works/W4394966811.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W1963843066","https://openalex.org/W2001262230","https://openalex.org/W2049391500","https://openalex.org/W2059936846","https://openalex.org/W2099883498","https://openalex.org/W2125239084","https://openalex.org/W2205067742","https://openalex.org/W2344926255","https://openalex.org/W2557184478","https://openalex.org/W2609701023","https://openalex.org/W2741125629","https://openalex.org/W2761246164","https://openalex.org/W2780561978","https://openalex.org/W2792175060","https://openalex.org/W2910895477","https://openalex.org/W2945932175","https://openalex.org/W2986026331","https://openalex.org/W2998792451","https://openalex.org/W3061495788","https://openalex.org/W3212177678","https://openalex.org/W4225718741","https://openalex.org/W4310502481","https://openalex.org/W4312410232","https://openalex.org/W4312626131","https://openalex.org/W4312720855","https://openalex.org/W4361862458","https://openalex.org/W4366386365"],"related_works":["https://openalex.org/W2544222762","https://openalex.org/W2575775159","https://openalex.org/W2577233154","https://openalex.org/W3186790058","https://openalex.org/W2350226881","https://openalex.org/W190707418","https://openalex.org/W2169757786","https://openalex.org/W2380803702","https://openalex.org/W2328588909","https://openalex.org/W2134238172"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"an":[3,48,57],"open-circuit":[4,49,58],"fault":[5,32,59,110],"diagnosis":[6,33,111],"and":[7,37,98,112],"fault-tolerant":[8,63,113],"control":[9,64,95,114],"method":[10,65,80],"of":[11,43,107],"power":[12],"switch":[13,42,54],"for":[14,84],"a":[15],"coupled-inductor-based":[16],"Aalborg":[17],"inverter,":[18],"where":[19],"no":[20],"additional":[21],"sensors":[22],"or":[23],"diagnostic":[24],"circuits":[25],"are":[26,100],"required,":[27],"is":[28,46,55,81],"proposed.":[29],"The":[30],"proposed":[31,62,79,109],"technique":[34],"can":[35,66,89],"quickly":[36],"accurately":[38],"identify":[39],"if":[40],"any":[41,52],"the":[44,61,69,78,94,105,108],"inverter":[45,70],"in":[47,56,93],"state.":[50],"When":[51],"high-frequency":[53],"condition,":[60],"ensure":[67],"that":[68],"continues":[71],"to":[72,103],"operate":[73],"with":[74],"high":[75],"performance.":[76],"Furthermore,":[77],"highly":[82],"suitable":[83],"industrial":[85],"applications":[86],"since":[87],"it":[88],"be":[90],"easily":[91],"embedded":[92],"system.":[96],"Simulations":[97],"experiments":[99],"carried":[101],"out":[102],"verify":[104],"effectiveness":[106],"method.":[115]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}