{"id":"https://openalex.org/W4392523541","doi":"https://doi.org/10.1109/tie.2024.3368139","title":"Thyristor-Based Multiport Hybrid DC Circuit Breaker for Multiterminal DC Grid Protection","display_name":"Thyristor-Based Multiport Hybrid DC Circuit Breaker for Multiterminal DC Grid Protection","publication_year":2024,"publication_date":"2024-03-06","ids":{"openalex":"https://openalex.org/W4392523541","doi":"https://doi.org/10.1109/tie.2024.3368139"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2024.3368139","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3368139","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100450412","display_name":"Shuo Zhang","orcid":"https://orcid.org/0000-0003-4344-1212"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]},{"id":"https://openalex.org/I4210125878","display_name":"Suzhou Research Institute","ror":"https://ror.org/03ebk0c60","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210125878"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shuo Zhang","raw_affiliation_strings":["Shandong University, Jinan, China","Suzhou Research Institute, Shandong University, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-4344-1212","affiliations":[{"raw_affiliation_string":"Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]},{"raw_affiliation_string":"Suzhou Research Institute, Shandong University, Suzhou, China","institution_ids":["https://openalex.org/I4210125878"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051744665","display_name":"Guibin Zou","orcid":"https://orcid.org/0000-0001-6267-9993"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guibin Zou","raw_affiliation_strings":["Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0001-6267-9993","affiliations":[{"raw_affiliation_string":"Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048293972","display_name":"Feng Gao","orcid":"https://orcid.org/0000-0002-4969-5195"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Gao","raw_affiliation_strings":["Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0002-4969-5195","affiliations":[{"raw_affiliation_string":"Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033654208","display_name":"Dashan Shi","orcid":"https://orcid.org/0009-0005-7897-1995"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dashan Shi","raw_affiliation_strings":["Shanghai Electro-Mechanical Engineering Institute, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0005-7897-1995","affiliations":[{"raw_affiliation_string":"Shanghai Electro-Mechanical Engineering Institute, Shanghai, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066908116","display_name":"Xiuyan Wei","orcid":"https://orcid.org/0000-0003-0929-2671"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuyan Wei","raw_affiliation_strings":["Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0003-0929-2671","affiliations":[{"raw_affiliation_string":"Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100450412"],"corresponding_institution_ids":["https://openalex.org/I154099455","https://openalex.org/I4210125878"],"apc_list":null,"apc_paid":null,"fwci":1.2017,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.77762939,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"71","issue":"11","first_page":"14197","last_page":"14207"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.8306950330734253},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.7834926843643188},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.573635458946228},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.49513712525367737},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4595465064048767},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42718225717544556},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41718801856040955},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1975475251674652}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.8306950330734253},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.7834926843643188},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.573635458946228},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.49513712525367737},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4595465064048767},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42718225717544556},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41718801856040955},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1975475251674652},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2024.3368139","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3368139","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2137722190","display_name":null,"funder_award_id":"52077124","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4726092636","display_name":null,"funder_award_id":"2023M732046","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G7570893738","display_name":null,"funder_award_id":"ZR2023QE281","funder_id":"https://openalex.org/F4320324174","funder_display_name":"Natural Science Foundation of Shandong Province"},{"id":"https://openalex.org/G8015339903","display_name":null,"funder_award_id":"BK20230255","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320324174","display_name":"Natural Science Foundation of Shandong Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W2031694483","https://openalex.org/W2320858657","https://openalex.org/W2673002214","https://openalex.org/W2757838650","https://openalex.org/W2883395817","https://openalex.org/W2897043030","https://openalex.org/W2900840265","https://openalex.org/W2937779185","https://openalex.org/W2944241195","https://openalex.org/W2999366149","https://openalex.org/W3044280616","https://openalex.org/W3081171432","https://openalex.org/W3120780860","https://openalex.org/W3134556721","https://openalex.org/W3146284778","https://openalex.org/W3154225630","https://openalex.org/W3195347355","https://openalex.org/W4200180051","https://openalex.org/W4200213044","https://openalex.org/W4285159293","https://openalex.org/W4309327864","https://openalex.org/W4312455430","https://openalex.org/W4386736935","https://openalex.org/W6696614334"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4213279392","https://openalex.org/W2379676388","https://openalex.org/W2725874044","https://openalex.org/W2365452505","https://openalex.org/W2059544191","https://openalex.org/W1996216160","https://openalex.org/W2067468876","https://openalex.org/W322365204","https://openalex.org/W250321534"],"abstract_inverted_index":{"Since":[0],"the":[1,10,31,35,41,67,77,79,83,91,93,124,142,145,149,153],"multiport":[2,43,84,114],"hybrid":[3,115],"dc":[4,38,116],"circuit":[5,117],"breaker":[6,13,118],"(HCB)":[7],"can":[8],"share":[9],"expensive":[11],"main":[12],"among":[14],"multiple":[15],"adjacent":[16],"lines,":[17],"it":[18],"is":[19,120,158],"considered":[20],"as":[21,57],"a":[22,47,112],"more":[23],"cost-efficient":[24],"choice":[25],"than":[26],"typical":[27],"HCB":[28],"to":[29,122],"isolate":[30],"dc-side":[32],"fault":[33],"in":[34,109],"large-scale":[36],"multiterminal":[37],"grid.":[39],"However,":[40],"existing":[42,156],"HCBs":[44,85],"still":[45,87],"require":[46],"large":[48],"number":[49],"of":[50,76,82,144,152],"fully":[51],"controlled":[52],"semiconductor":[53],"switches":[54],"(FCSSs),":[55],"such":[56],"insulated":[58],"gate":[59],"bipolar":[60],"transistors":[61],"and":[62,71,105,138],"integrated":[63],"gate-commutated":[64],"thyristors.":[65],"Considering":[66],"high":[68],"unit":[69,98],"price":[70],"weak":[72],"current":[73,102],"turn-off":[74],"capability":[75],"FCSS,":[78,92],"total":[80],"costs":[81],"are":[86],"high.":[88],"Compared":[89],"with":[90,155],"thyristor":[94],"has":[95,128],"significantly":[96,133],"lower":[97,134],"price,":[99],"larger":[100],"surge":[101],"withstanding":[103],"capability,":[104],"higher":[106],"reliability.":[107],"Therefore,":[108],"this":[110],"article,":[111],"thyristor-based":[113],"(T-MHCB)":[119],"proposed":[121,146],"replace":[123],"FCSS-based":[125],"MHCB,":[126],"which":[127],"close":[129],"action":[130],"speed":[131],"but":[132],"costs.":[135],"Extensive":[136],"simulations":[137],"experiments":[139],"have":[140],"verified":[141],"effectiveness":[143],"T-MHCB.":[147],"Besides,":[148],"performance":[150],"comparison":[151],"T-MHCB":[154],"solutions":[157],"elaborated.":[159]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}