{"id":"https://openalex.org/W4391696935","doi":"https://doi.org/10.1109/tie.2024.3357888","title":"Inductively Coupled in-Circuit Measurement of Two-Port Admittance Parameters","display_name":"Inductively Coupled in-Circuit Measurement of Two-Port Admittance Parameters","publication_year":2024,"publication_date":"2024-02-09","ids":{"openalex":"https://openalex.org/W4391696935","doi":"https://doi.org/10.1109/tie.2024.3357888"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2024.3357888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3357888","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/11311/1274935","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043709882","display_name":"Simone Negri","orcid":"https://orcid.org/0000-0001-7048-9380"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Simone Negri","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy"],"raw_orcid":"https://orcid.org/0000-0001-7048-9380","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010506865","display_name":"Giordano Spadacini","orcid":"https://orcid.org/0000-0002-9778-693X"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giordano Spadacini","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy"],"raw_orcid":"https://orcid.org/0000-0002-9778-693X","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079370638","display_name":"Flavia Grassi","orcid":"https://orcid.org/0000-0001-6844-8766"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Flavia Grassi","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy"],"raw_orcid":"https://orcid.org/0000-0001-6844-8766","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010923388","display_name":"Sergio A. Pignari","orcid":"https://orcid.org/0000-0002-6657-1530"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sergio A. Pignari","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy"],"raw_orcid":"https://orcid.org/0000-0002-6657-1530","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":{"value":2495,"currency":"USD","value_usd":2495},"apc_paid":null,"fwci":1.4062,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.79419125,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"71","issue":"10","first_page":"13351","last_page":"13360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9634000062942505,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9228000044822693,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.8512173891067505},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.513887882232666},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4850255846977234},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.43940553069114685},{"id":"https://openalex.org/keywords/admittance-parameters","display_name":"Admittance parameters","score":0.426541805267334},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4254588484764099},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.42189162969589233},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35091066360473633},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33079794049263},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3283199369907379}],"concepts":[{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.8512173891067505},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.513887882232666},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4850255846977234},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.43940553069114685},{"id":"https://openalex.org/C133833761","wikidata":"https://www.wikidata.org/wiki/Q16001847","display_name":"Admittance parameters","level":3,"score":0.426541805267334},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4254588484764099},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.42189162969589233},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35091066360473633},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33079794049263},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3283199369907379}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2024.3357888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2024.3357888","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1274935","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1274935","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:re.public.polimi.it:11311/1274935","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1274935","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W2019017255","https://openalex.org/W2045803626","https://openalex.org/W2059408905","https://openalex.org/W2060083630","https://openalex.org/W2066626412","https://openalex.org/W2105920864","https://openalex.org/W2117924042","https://openalex.org/W2135795438","https://openalex.org/W2171569227","https://openalex.org/W2180015593","https://openalex.org/W2549688056","https://openalex.org/W2610055935","https://openalex.org/W2782403210","https://openalex.org/W2803866944","https://openalex.org/W2912862836","https://openalex.org/W2945219405","https://openalex.org/W2981339426","https://openalex.org/W3018507152","https://openalex.org/W3037435153","https://openalex.org/W3047292528","https://openalex.org/W3142302459","https://openalex.org/W3158777053","https://openalex.org/W3190541168","https://openalex.org/W3191046393","https://openalex.org/W3200786955","https://openalex.org/W3215353010","https://openalex.org/W3217537722","https://openalex.org/W3217798782","https://openalex.org/W4213335060","https://openalex.org/W4226296417","https://openalex.org/W4296426397","https://openalex.org/W4302014045","https://openalex.org/W4311719786","https://openalex.org/W4312376835"],"related_works":["https://openalex.org/W2563111511","https://openalex.org/W2913402129","https://openalex.org/W2161728531","https://openalex.org/W2044195815","https://openalex.org/W2057151759","https://openalex.org/W2368309484","https://openalex.org/W2066729819","https://openalex.org/W2460740512","https://openalex.org/W2163540231","https://openalex.org/W2049226255"],"abstract_inverted_index":{"In-circuit":[0],"impedance":[1,61],"and":[2,45,100,157],"admittance":[3,63,106,127,149,164],"measurements":[4,29,166],"are":[5,39,167],"widely":[6],"exploited":[7],"in":[8,32,144,180],"power":[9],"electronics,":[10],"from":[11],"control":[12],"stability":[13],"analysis":[14],"to":[15,41,82,123],"electromagnetic":[16],"interference":[17],"modeling.":[18],"In":[19,65],"particular,":[20],"the":[21,92,96,125,138,141,170,173],"use":[22],"of":[23,30,95,103,117,129,140,148,172,177,185],"clamp-on":[24],"inductive":[25,79],"probes":[26,80],"allows":[27],"nonintrusive":[28],"systems":[31,58],"real":[33],"operating":[34],"conditions.":[35],"However,":[36],"available":[37],"methods":[38],"limited":[40],"a":[42,68,83,115,130,178],"single":[43],"port":[44],"cannot":[46,54],"evaluate":[47],"mutual":[48,152],"impedances":[49],"or":[50,62],"admittances,":[51],"hence":[52],"they":[53],"properly":[55],"characterize":[56],"multiport":[57],"described":[59],"by":[60],"matrices.":[64],"this":[66],"article,":[67],"two-port":[69,159,163],"inductively":[70],"coupled":[71],"in-circuit":[72],"measurement":[73,102,147],"method":[74,110,143],"is":[75,111],"proposed.":[76],"Specifically,":[77],"two":[78,88],"connected":[81],"vector":[84],"network":[85],"analyzer":[86],"define":[87],"longitudinal":[89],"ports":[90],"along":[91],"clamped":[93],"wires":[94],"system":[97],"under":[98],"test":[99],"allow":[101],"its":[104],"two-by-two":[105],"matrix.":[107],"The":[108],"proposed":[109,142],"firstly":[112],"verified":[113],"with":[114],"set":[116],"known":[118],"passive":[119,158],"loads,":[120],"then":[121],"applied":[122],"measure":[124],"unknown":[126],"matrix":[128,165],"single-phase":[131],"motor":[132],"drive":[133],"system.":[134],"Experimental":[135],"results":[136],"prove":[137],"effectiveness":[139],"providing":[145],"accurate":[146],"parameters,":[150],"including":[151],"terms,":[153],"both":[154],"for":[155,169,182],"active":[156],"devices.":[160],"Additionally,":[161],"such":[162],"suitable":[168],"identification":[171],"behavioral":[174],"circuit":[175],"model":[176],"system,":[179],"general":[181],"any":[183],"number":[184],"ports.":[186]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}
