{"id":"https://openalex.org/W4387789793","doi":"https://doi.org/10.1109/tie.2023.3321978","title":"Bidirectional Supercascode High-Voltage DC Solid-State Circuit Breaker With Sensorless Current\u2013Time Configuration","display_name":"Bidirectional Supercascode High-Voltage DC Solid-State Circuit Breaker With Sensorless Current\u2013Time Configuration","publication_year":2023,"publication_date":"2023-10-19","ids":{"openalex":"https://openalex.org/W4387789793","doi":"https://doi.org/10.1109/tie.2023.3321978"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2023.3321978","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3321978","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088716787","display_name":"Zhixing He","orcid":"https://orcid.org/0000-0003-4354-2611"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhixing He","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-4354-2611","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101443539","display_name":"Ben Zhou","orcid":"https://orcid.org/0000-0002-8474-0481"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ben Zhou","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-8474-0481","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074093842","display_name":"Zongjian Li","orcid":"https://orcid.org/0000-0003-3400-0247"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zongjian Li","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-3400-0247","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004052444","display_name":"Biao Liu","orcid":"https://orcid.org/0000-0003-2994-5473"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Biao Liu","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-2994-5473","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057011514","display_name":"Kangning Chen","orcid":"https://orcid.org/0009-0000-6874-6093"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kangning Chen","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0009-0000-6874-6093","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100436079","display_name":"Lei Wang","orcid":"https://orcid.org/0000-0003-0931-0710"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Wang","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-0931-0710","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015437523","display_name":"Qianming Xu","orcid":"https://orcid.org/0000-0002-6188-2508"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qianming Xu","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-6188-2508","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073736689","display_name":"Yandong Chen","orcid":"https://orcid.org/0000-0001-7604-7516"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yandong Chen","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0001-7604-7516","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101891622","display_name":"Quan Chen","orcid":"https://orcid.org/0009-0001-4796-9551"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Quan Chen","raw_affiliation_strings":["Zhejiang Magtron Intelligent, Jiaxing, China"],"raw_orcid":"https://orcid.org/0009-0001-4796-9551","affiliations":[{"raw_affiliation_string":"Zhejiang Magtron Intelligent, Jiaxing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4909,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.64358093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"71","issue":"8","first_page":"8771","last_page":"8781"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.7107055187225342},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.625975489616394},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6031183004379272},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5660543441772461},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.560867428779602},{"id":"https://openalex.org/keywords/jfet","display_name":"JFET","score":0.4851444661617279},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42348712682724},{"id":"https://openalex.org/keywords/overcurrent","display_name":"Overcurrent","score":0.41006261110305786},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3663521409034729},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3501381278038025},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.30467045307159424},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.13793033361434937}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.7107055187225342},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.625975489616394},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6031183004379272},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5660543441772461},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.560867428779602},{"id":"https://openalex.org/C2778484494","wikidata":"https://www.wikidata.org/wiki/Q385520","display_name":"JFET","level":5,"score":0.4851444661617279},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42348712682724},{"id":"https://openalex.org/C47949032","wikidata":"https://www.wikidata.org/wiki/Q663542","display_name":"Overcurrent","level":3,"score":0.41006261110305786},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3663521409034729},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3501381278038025},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.30467045307159424},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.13793033361434937}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2023.3321978","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3321978","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1191294113","display_name":null,"funder_award_id":"52177180","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4612429376","display_name":null,"funder_award_id":"52107193","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1509492124","https://openalex.org/W1567863360","https://openalex.org/W1598652397","https://openalex.org/W2016885724","https://openalex.org/W2020753074","https://openalex.org/W2022144424","https://openalex.org/W2119195563","https://openalex.org/W2122579082","https://openalex.org/W2136229594","https://openalex.org/W2395103250","https://openalex.org/W2465881520","https://openalex.org/W2547861699","https://openalex.org/W2586394051","https://openalex.org/W2588273691","https://openalex.org/W2769623822","https://openalex.org/W2798433496","https://openalex.org/W2799225319","https://openalex.org/W2884891942","https://openalex.org/W2914347037","https://openalex.org/W2951601277","https://openalex.org/W2987027517","https://openalex.org/W3007346751","https://openalex.org/W3036507074","https://openalex.org/W3097676011","https://openalex.org/W3163508219","https://openalex.org/W3184723276","https://openalex.org/W4312633767","https://openalex.org/W4312894037"],"related_works":["https://openalex.org/W1965671135","https://openalex.org/W2582132882","https://openalex.org/W2914685182","https://openalex.org/W2041060175","https://openalex.org/W1980580338","https://openalex.org/W2045376873","https://openalex.org/W2092633710","https://openalex.org/W4206833562","https://openalex.org/W2368486130","https://openalex.org/W2318599641"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,55,60],"bidirectional":[4],"normally-":[5],"<sc":[6],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[7],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">on</small>":[8],"SiC":[9],"junction":[10],"field-effect":[11],"transistor":[12],"(JFET)":[13],"based":[14],"supercascode":[15],"high-voltage":[16,65],"dc":[17,182],"solid-state":[18],"circuit":[19,29,122,185],"breaker":[20],"(BSC-SSCB)":[21],"with":[22,167],"sensorless":[23,27],"current\u2013time":[24,77,99,159],"configuration.":[25],"A":[26,113,126],"detection-driving":[28],"(DDC)":[30],"is":[31,72,123,130],"proposed":[32,141,175],"to":[33,105,180],"detect":[34],"the":[35,39,45,49,76,92,103,117,120,140,147,174],"current":[36,149],"and":[37,59,88,119,132,135,150],"drive":[38],"main":[40,121],"switch":[41],"by":[42,83,110],"directly":[43],"utilizing":[44],"forward":[46],"voltage":[47],"of":[48,91,154],"BSC-SSCB.":[50],"The":[51,97,158,170],"DDC":[52,93,118],"only":[53,84],"contains":[54],"few":[56],"passive":[57],"components":[58],"low-voltage":[61],"MOSFET,":[62],"whereas":[63],"no":[64],"input":[66],"or":[67],"high-isolation":[68],"auxiliary":[69],"power":[70,156],"supply":[71],"used.":[73],"In":[74],"addition,":[75],"tripping":[78,100,160],"response":[79,101],"can":[80,143,162,177],"be":[81,163,178],"configured":[82],"setting":[85],"two":[86,89],"resistors":[87],"capacitors":[90],"without":[94],"additional":[95],"controllers.":[96],"configurable":[98],"enables":[102],"BSC-SSCB":[104,128,142,176],"avoid":[106],"unnecessary":[107],"breaking-off":[108],"caused":[109],"impulse":[111],"current.":[112],"design":[114],"procedure":[115],"for":[116,183],"carried":[124],"out.":[125],"4-kV/15-A":[127],"prototype":[129],"designed":[131],"tested.":[133],"Simulation":[134],"experimental":[136],"results":[137,171],"show":[138],"that":[139,173],"quickly":[144],"break":[145],"off":[146],"fault":[148],"achieve":[151],"balanced":[152],"voltages":[153],"all":[155],"JFETs.":[157],"curve":[161],"fine-configured,":[164],"which":[165],"agrees":[166],"theoretical":[168],"analysis.":[169],"indicate":[172],"applied":[179],"medium-voltage":[181],"fast":[184],"breaking.":[186]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}