{"id":"https://openalex.org/W4323338453","doi":"https://doi.org/10.1109/tie.2023.3250764","title":"500-kHz Bandwidth Feedback for Scanning Ion Conductance Microscopy With Nanoresolution","display_name":"500-kHz Bandwidth Feedback for Scanning Ion Conductance Microscopy With Nanoresolution","publication_year":2023,"publication_date":"2023-03-06","ids":{"openalex":"https://openalex.org/W4323338453","doi":"https://doi.org/10.1109/tie.2023.3250764"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2023.3250764","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3250764","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021696316","display_name":"Lei Cheng","orcid":"https://orcid.org/0000-0002-5419-5515"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Cheng","raw_affiliation_strings":["Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0002-5419-5515","affiliations":[{"raw_affiliation_string":"Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069984776","display_name":"Jian Zhuang","orcid":"https://orcid.org/0000-0003-1384-3333"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Zhuang","raw_affiliation_strings":["Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0003-1384-3333","affiliations":[{"raw_affiliation_string":"Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002121694","display_name":"Tianying Wang","orcid":"https://orcid.org/0000-0002-2826-5364"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianying Wang","raw_affiliation_strings":["Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018685761","display_name":"Xiaobo Liao","orcid":"https://orcid.org/0000-0002-1556-3805"},"institutions":[{"id":"https://openalex.org/I1297991670","display_name":"Southwest University of Science and Technology","ror":"https://ror.org/04d996474","country_code":"CN","type":"education","lineage":["https://openalex.org/I1297991670"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaobo Liao","raw_affiliation_strings":["Key Laboratory of Testing Technology for Manufacturing Process in Ministry of Education, Southwest University of Science and Technology, Mianyang, China"],"raw_orcid":"https://orcid.org/0000-0002-1556-3805","affiliations":[{"raw_affiliation_string":"Key Laboratory of Testing Technology for Manufacturing Process in Ministry of Education, Southwest University of Science and Technology, Mianyang, China","institution_ids":["https://openalex.org/I1297991670"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041678181","display_name":"Jiaxin Yu","orcid":"https://orcid.org/0000-0003-3578-5760"},"institutions":[{"id":"https://openalex.org/I1297991670","display_name":"Southwest University of Science and Technology","ror":"https://ror.org/04d996474","country_code":"CN","type":"education","lineage":["https://openalex.org/I1297991670"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaxin Yu","raw_affiliation_strings":["Key Laboratory of Testing Technology for Manufacturing Process in Ministry of Education, Southwest University of Science and Technology, Mianyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Testing Technology for Manufacturing Process in Ministry of Education, Southwest University of Science and Technology, Mianyang, China","institution_ids":["https://openalex.org/I1297991670"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3367,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.36647347,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"71","issue":"2","first_page":"2080","last_page":"2089"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pipette","display_name":"Pipette","score":0.8819282054901123},{"id":"https://openalex.org/keywords/transimpedance-amplifier","display_name":"Transimpedance amplifier","score":0.7264599204063416},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6840744018554688},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6811104416847229},{"id":"https://openalex.org/keywords/ion-current","display_name":"Ion current","score":0.5432504415512085},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5315243005752563},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5031132102012634},{"id":"https://openalex.org/keywords/polydimethylsiloxane","display_name":"Polydimethylsiloxane","score":0.47048333287239075},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.4576389789581299},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.45547816157341003},{"id":"https://openalex.org/keywords/scanning-capacitance-microscopy","display_name":"Scanning capacitance microscopy","score":0.41382575035095215},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.3458574712276459},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2986333966255188},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.29657429456710815},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.21899640560150146},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.2171614170074463},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.18689695000648499},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.17331784963607788},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.16469508409500122},{"id":"https://openalex.org/keywords/scanning-confocal-electron-microscopy","display_name":"Scanning confocal electron microscopy","score":0.11111509799957275},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.10973680019378662}],"concepts":[{"id":"https://openalex.org/C151552171","wikidata":"https://www.wikidata.org/wiki/Q163373","display_name":"Pipette","level":2,"score":0.8819282054901123},{"id":"https://openalex.org/C92631468","wikidata":"https://www.wikidata.org/wiki/Q215437","display_name":"Transimpedance amplifier","level":5,"score":0.7264599204063416},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6840744018554688},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6811104416847229},{"id":"https://openalex.org/C2778220808","wikidata":"https://www.wikidata.org/wiki/Q62536","display_name":"Ion current","level":3,"score":0.5432504415512085},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5315243005752563},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5031132102012634},{"id":"https://openalex.org/C2779849746","wikidata":"https://www.wikidata.org/wiki/Q411955","display_name":"Polydimethylsiloxane","level":2,"score":0.47048333287239075},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.4576389789581299},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45547816157341003},{"id":"https://openalex.org/C99752389","wikidata":"https://www.wikidata.org/wiki/Q9337610","display_name":"Scanning capacitance microscopy","level":4,"score":0.41382575035095215},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.3458574712276459},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2986333966255188},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.29657429456710815},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21899640560150146},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.2171614170074463},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.18689695000648499},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.17331784963607788},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.16469508409500122},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.11111509799957275},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10973680019378662},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2023.3250764","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3250764","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G5866107760","display_name":null,"funder_award_id":"52175515","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7809379760","display_name":null,"funder_award_id":"51375363","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1964539618","https://openalex.org/W2044917307","https://openalex.org/W2075617494","https://openalex.org/W2077813193","https://openalex.org/W2099674667","https://openalex.org/W2142847722","https://openalex.org/W2177988651","https://openalex.org/W2314125320","https://openalex.org/W2751593216","https://openalex.org/W2754515600","https://openalex.org/W2803083542","https://openalex.org/W2903019797","https://openalex.org/W2939592671","https://openalex.org/W2948951813","https://openalex.org/W2969908949","https://openalex.org/W2996410154","https://openalex.org/W3006545642","https://openalex.org/W3009734205","https://openalex.org/W3049192468","https://openalex.org/W3102112048","https://openalex.org/W3104428887","https://openalex.org/W3111847962","https://openalex.org/W3112657285","https://openalex.org/W3187168483","https://openalex.org/W3211504183","https://openalex.org/W3213011286","https://openalex.org/W3217562056","https://openalex.org/W4283398307","https://openalex.org/W4285242180","https://openalex.org/W4288777065","https://openalex.org/W4292505988"],"related_works":["https://openalex.org/W1496401154","https://openalex.org/W2494348853","https://openalex.org/W2393084480","https://openalex.org/W2575211708","https://openalex.org/W50546085","https://openalex.org/W99870850","https://openalex.org/W2616275348","https://openalex.org/W1890184888","https://openalex.org/W2066987752","https://openalex.org/W1646861040"],"abstract_inverted_index":{"Scanning":[0],"ion":[1,51,79,153,188],"conductance":[2],"microscopy":[3],"(SICM)":[4],"has":[5,10,177],"been":[6,11,28],"developing":[7],"rapidly":[8],"and":[9,22,47,69,167],"a":[12,57,70,93,104,178],"versatile":[13],"tool":[14],"for":[15,32,122],"nanoscale":[16],"imaging.":[17],"However,":[18],"the":[19,38,42,50,77,110,114,123,128,142,149,159,174,183],"imaging":[20,201],"quality":[21],"scanning":[23,160],"speed":[24],"of":[25,37,45,49,82,88,96,113,152,162,187],"SICM":[26],"have":[27],"significant":[29,179],"restriction":[30,44],"factors":[31],"its":[33],"various":[34],"applications.":[35],"One":[36],"main":[39],"reasons":[40],"is":[41,92],"mutual":[43],"bandwidth":[46,66],"noise":[48,81,186],"current":[52,80,154,189],"feedback.":[53],"In":[54],"this":[55,137],"paper,":[56],"low-noise":[58],"two-stage":[59],"transimpedance":[60],"amplifier":[61],"(TIA)":[62],"with":[63,202],"500":[64],"kHz":[65],"was":[67,73,99,120,171],"proposed":[68,175],"low-capacitance":[71],"pipette":[72,89,129,143],"combined":[74],"to":[75,126,198],"depress":[76],"high-frequency":[78,97],"SICM's":[83],"feedback":[84],"circuit.":[85],"The":[86],"effect":[87,180],"capacitance,":[90],"which":[91],"major":[94],"cuase":[95],"noise,":[98,155],"significantly":[100],"reduced":[101],"by":[102],"covering":[103],"thin":[105],"polydimethylsiloxane":[106],"(PDMS)":[107],"film":[108],"on":[109],"outer":[111],"wall":[112],"pipette.":[115],"Finite":[116],"element":[117],"method":[118,138,176,193],"(FEM)":[119],"employed":[121],"first":[124],"time":[125],"simulate":[127],"capacitance":[130,144],"model.":[131],"Impedance":[132],"spectroscopy":[133],"experiments":[134,161],"verified":[135],"that":[136,173],"can":[139,194],"greatly":[140],"reduce":[141],"(about":[145],"0.7":[146],"times).":[147],"Through":[148],"comparative":[150],"analysis":[151],"as":[156,158],"well":[157],"standard":[163],"silicon":[164],"material":[165],"sample":[166],"PMDS":[168],"sample,":[169],"it":[170],"demonstrated":[172],"in":[181],"reducing":[182],"high":[184,203],"frequency":[185],"measurement.":[190],"Therefore,":[191],"our":[192],"provide":[195],"an":[196],"avenue":[197],"realize":[199],"high-speed":[200],"positioning":[204],"accuracy.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}