{"id":"https://openalex.org/W4322706886","doi":"https://doi.org/10.1109/tie.2023.3247721","title":"A Simplified Current Feature Extraction and Deployment Method for DC Series Arc Fault Detection","display_name":"A Simplified Current Feature Extraction and Deployment Method for DC Series Arc Fault Detection","publication_year":2023,"publication_date":"2023-02-28","ids":{"openalex":"https://openalex.org/W4322706886","doi":"https://doi.org/10.1109/tie.2023.3247721"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2023.3247721","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3247721","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045976582","display_name":"Junchen Yan","orcid":"https://orcid.org/0000-0003-0184-374X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Junchen Yan","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-0184-374X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071167365","display_name":"Qiqi Li","orcid":"https://orcid.org/0000-0002-6355-4321"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiqi Li","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-6355-4321","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076538694","display_name":"Shanxu Duan","orcid":"https://orcid.org/0000-0001-7329-2487"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shanxu Duan","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-7329-2487","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5045976582"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":6.0045,"has_fulltext":false,"cited_by_count":47,"citation_normalized_percentile":{"value":0.9701393,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"71","issue":"1","first_page":"625","last_page":"634"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10809","display_name":"Occupational Health and Safety Research","score":0.9671000242233276,"subfield":{"id":"https://openalex.org/subfields/3614","display_name":"Radiological and Ultrasound Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6325878500938416},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6123381853103638},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.5805299282073975},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5353811979293823},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5322242975234985},{"id":"https://openalex.org/keywords/dc-bias","display_name":"DC bias","score":0.45049843192100525},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4491337835788727},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43018803000450134},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.42843377590179443},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.4175984859466553},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.41146740317344666},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4090317487716675},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3537972569465637},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3009134829044342},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.11244776844978333},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09435853362083435}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6325878500938416},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6123381853103638},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.5805299282073975},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5353811979293823},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5322242975234985},{"id":"https://openalex.org/C88682704","wikidata":"https://www.wikidata.org/wiki/Q2907415","display_name":"DC bias","level":3,"score":0.45049843192100525},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4491337835788727},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43018803000450134},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.42843377590179443},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.4175984859466553},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.41146740317344666},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4090317487716675},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3537972569465637},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3009134829044342},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.11244776844978333},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09435853362083435},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2023.3247721","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3247721","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8772609584","display_name":null,"funder_award_id":"51977086","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2004365334","https://openalex.org/W2020020709","https://openalex.org/W2074151585","https://openalex.org/W2089468765","https://openalex.org/W2194775991","https://openalex.org/W2296747478","https://openalex.org/W2471618076","https://openalex.org/W2547495662","https://openalex.org/W2557908743","https://openalex.org/W2586446900","https://openalex.org/W2616665904","https://openalex.org/W2768866948","https://openalex.org/W2792764867","https://openalex.org/W2808378779","https://openalex.org/W2908554551","https://openalex.org/W3080240607","https://openalex.org/W3094594436","https://openalex.org/W3115927263","https://openalex.org/W3170516065","https://openalex.org/W3177367985","https://openalex.org/W4205520857","https://openalex.org/W4236107999","https://openalex.org/W6749825310"],"related_works":["https://openalex.org/W2898383381","https://openalex.org/W2782295999","https://openalex.org/W2024367938","https://openalex.org/W2162306796","https://openalex.org/W1970292246","https://openalex.org/W4396575239","https://openalex.org/W2016162169","https://openalex.org/W4247952185","https://openalex.org/W1895367623","https://openalex.org/W1642462315"],"abstract_inverted_index":{"DC":[0],"series":[1],"arc":[2,61,80,136],"fault":[3,137],"is":[4,40,56,67,89,99,115,121,156],"one":[5],"of":[6,10,75,145,151,167],"the":[7,44,71,131,135],"main":[8],"causes":[9],"low-voltage":[11],"dc":[12,60,76,132],"distribution":[13],"system":[14],"fire":[15],"accident.":[16],"Traditional":[17],"methods":[18],"use":[19,28],"time-frequency":[20],"domain":[21],"features":[22,104],"to":[23,31,42,58,69,91,101,105],"make":[24],"judgments":[25],"directly":[26],"or":[27],"machine":[29],"learning":[30],"further":[32],"classify":[33],"them.":[34],"In":[35],"this":[36],"article,":[37],"a":[38,52,109,141,148],"method":[39],"proposed":[41,90],"simplify":[43],"feature":[45],"extraction":[46],"process":[47,55,102],"while":[48],"ensuring":[49],"accuracy.":[50],"First,":[51],"fully":[53],"automated":[54],"used":[57,100,116],"establish":[59],"datasets.":[62],"A":[63],"composite":[64],"bandpass":[65],"filter":[66],"designed":[68],"extract":[70,92],"typical":[72],"frequency":[73],"segment":[74],"arc.":[77],"Besides,":[78],"an":[79,163],"detection":[81,166],"neural":[82,113],"network":[83,88,114],"based":[84],"on":[85,159],"temporal":[86],"convolution":[87],"current":[93],"waveform":[94],"features.":[95],"Principal":[96],"component":[97],"analysis":[98],"these":[103],"reduce":[106],"correlation.":[107],"Finally,":[108],"single":[110],"hidden":[111],"layer":[112],"as":[117],"classifier.":[118],"The":[119,154],"database":[120],"collected":[122],"from":[123],"different":[124],"scenarios":[125],"and":[126],"working":[127],"conditions.":[128],"By":[129],"measuring":[130],"raw":[133],"current,":[134],"detector":[138],"can":[139],"achieve":[140],"test":[142],"set":[143],"accuracy":[144],"99.88%":[146],"at":[147],"sampling":[149],"rate":[150],"250":[152],"kHz.":[153],"model":[155],"also":[157],"deployed":[158],"Jetson":[160],"Nano":[161],"with":[162],"average":[164],"real-time":[165],"0.15":[168],"s/sample.":[169]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":25},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}