{"id":"https://openalex.org/W4319866568","doi":"https://doi.org/10.1109/tie.2023.3239873","title":"A Bidirectional Efficient Circuit Breaker With Automatic and Controllable Shutoff Functions for DC Distribution Network","display_name":"A Bidirectional Efficient Circuit Breaker With Automatic and Controllable Shutoff Functions for DC Distribution Network","publication_year":2023,"publication_date":"2023-01-31","ids":{"openalex":"https://openalex.org/W4319866568","doi":"https://doi.org/10.1109/tie.2023.3239873"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2023.3239873","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3239873","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021004633","display_name":"Xiaoguang Diao","orcid":"https://orcid.org/0000-0003-0516-1818"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoguang Diao","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-0516-1818","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100394680","display_name":"Fei Liu","orcid":"https://orcid.org/0000-0003-1832-8111"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Liu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-1832-8111","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084184774","display_name":"Yizhan Zhuang","orcid":"https://orcid.org/0000-0003-3212-9821"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yizhan Zhuang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-3212-9821","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034145181","display_name":"Shangzhi Pan","orcid":"https://orcid.org/0000-0001-9316-7798"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shangzhi Pan","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-9316-7798","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004508414","display_name":"Xiaoming Zha","orcid":"https://orcid.org/0000-0002-1102-891X"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoming Zha","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-1102-891X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Key Laboratory of Integrated Energy Power Equipment and System Security, Wuhan, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5021004633"],"corresponding_institution_ids":["https://openalex.org/I37461747"],"apc_list":null,"apc_paid":null,"fwci":1.7464,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.84256971,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"70","issue":"8","first_page":"7988","last_page":"7999"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.8777651190757751},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.7613583207130432},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5764129757881165},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5084556341171265},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48196980357170105},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4807053208351135},{"id":"https://openalex.org/keywords/integrated-gate-commutated-thyristor","display_name":"Integrated gate-commutated thyristor","score":0.4425228536128998},{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.4189722239971161},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41771772503852844},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3804287016391754},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3302096128463745},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.24980592727661133},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11607977747917175}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.8777651190757751},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.7613583207130432},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5764129757881165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5084556341171265},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48196980357170105},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4807053208351135},{"id":"https://openalex.org/C194777113","wikidata":"https://www.wikidata.org/wiki/Q1066563","display_name":"Integrated gate-commutated thyristor","level":4,"score":0.4425228536128998},{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.4189722239971161},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41771772503852844},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3804287016391754},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3302096128463745},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.24980592727661133},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11607977747917175},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2023.3239873","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2023.3239873","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G6445786173","display_name":null,"funder_award_id":"51877160","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W2414532974","https://openalex.org/W2547681978","https://openalex.org/W2766847524","https://openalex.org/W2900312780","https://openalex.org/W2901612873","https://openalex.org/W2954966231","https://openalex.org/W3005712307","https://openalex.org/W3017124924","https://openalex.org/W3036507074","https://openalex.org/W3089147441","https://openalex.org/W3089540415","https://openalex.org/W3092121464","https://openalex.org/W3092186870","https://openalex.org/W3107382099","https://openalex.org/W3109095221","https://openalex.org/W3123828880","https://openalex.org/W3166066692","https://openalex.org/W3185023866","https://openalex.org/W3211185831","https://openalex.org/W4205505662","https://openalex.org/W4206085513","https://openalex.org/W4285182429","https://openalex.org/W4285277873","https://openalex.org/W4285283731","https://openalex.org/W4286580136"],"related_works":["https://openalex.org/W1830300994","https://openalex.org/W4235282923","https://openalex.org/W2378476669","https://openalex.org/W2571003122","https://openalex.org/W2099191517","https://openalex.org/W2107671007","https://openalex.org/W2347324961","https://openalex.org/W2393611170","https://openalex.org/W2902864868","https://openalex.org/W2393255129"],"abstract_inverted_index":{"Compared":[0],"with":[1],"the":[2,30,44,61,89,102,109,116,127,149],"solid-state":[3],"circuit":[4,13,32,52,130,142,151],"breakers":[5,14,33,131],"based":[6,15,34,132],"on":[7,16,35,133],"insulated-gate":[8],"bipolar":[9],"transistor":[10],"and":[11,21,40,65,123,157],"MOSFET,":[12],"thyristors":[17,36,134],"have":[18,25,136],"higher":[19],"capacity":[20],"lower":[22],"cost,":[23],"which":[24,59,77],"been":[26],"extensively":[27],"studied.":[28],"However,":[29],"existing":[31,128],"cannot":[37],"achieve":[38],"fast":[39,121],"reliable":[41],"shutoff":[42,84,98],"of":[43,63,118,138,146],"fault":[45,90,103],"current.":[46],"Therefore,":[47],"a":[48],"novel":[49],"efficient":[50],"bidirectional":[51,129],"breaker":[53,143,152],"is":[54,75,153],"proposed":[55,113,150],"in":[56],"this":[57],"article,":[58],"has":[60],"functions":[62],"automatic":[64,83],"controllable":[66,97],"shutoff.":[67],"In":[68],"any":[69],"current":[70,91],"direction,":[71],"only":[72],"one":[73,137],"thyristor":[74],"conductive,":[76],"eliminates":[78],"unnecessary":[79],"power":[80],"losses.":[81],"The":[82,96,112],"function":[85,99],"can":[86,100],"cut":[87],"off":[88],"independently":[92],"without":[93,105],"detection":[94],"delay.":[95],"isolate":[101],"reliably":[104],"being":[106],"affected":[107],"by":[108],"line":[110],"inductance.":[111],"topology":[114],"integrates":[115,144],"advantages":[117],"high":[119,124],"efficiency,":[120],"reaction,":[122],"reliability.":[125],"Although":[126],"may":[135],"these":[139],"advantages,":[140],"no":[141],"all":[145],"them.":[147],"Finally,":[148],"verified":[154],"through":[155],"simulation":[156],"experiment":[158],"at":[159],"1.2":[160],"kW.":[161]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":3}],"updated_date":"2026-05-22T09:01:20.584952","created_date":"2025-10-10T00:00:00"}