{"id":"https://openalex.org/W4312416454","doi":"https://doi.org/10.1109/tie.2022.3220883","title":"Real-Time DC Series Arc Fault Detection Based on Noise Pattern Analysis in Photovoltaic System","display_name":"Real-Time DC Series Arc Fault Detection Based on Noise Pattern Analysis in Photovoltaic System","publication_year":2022,"publication_date":"2022-11-14","ids":{"openalex":"https://openalex.org/W4312416454","doi":"https://doi.org/10.1109/tie.2022.3220883"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2022.3220883","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3220883","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017481059","display_name":"Jae-Beom Ahn","orcid":null},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jae-Beom Ahn","raw_affiliation_strings":["Department of Energy Systems Engineering, Chung-Ang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-2881-8931","affiliations":[{"raw_affiliation_string":"Department of Energy Systems Engineering, Chung-Ang University, Seoul, South Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113936142","display_name":"Hyun-Bin Jo","orcid":null},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun-Bin Jo","raw_affiliation_strings":["Department of Energy Systems Engineering, Chung-Ang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1808-1534","affiliations":[{"raw_affiliation_string":"Department of Energy Systems Engineering, Chung-Ang University, Seoul, South Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029117594","display_name":"Hong-Je Ryoo","orcid":"https://orcid.org/0000-0001-8657-7350"},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hong-Je Ryoo","raw_affiliation_strings":["School of Energy Systems Engineering, Chung-Ang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-8657-7350","affiliations":[{"raw_affiliation_string":"School of Energy Systems Engineering, Chung-Ang University, Seoul, South Korea","institution_ids":["https://openalex.org/I67900169"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5017481059"],"corresponding_institution_ids":["https://openalex.org/I67900169"],"apc_list":null,"apc_paid":null,"fwci":2.1245,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.87488193,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"70","issue":"10","first_page":"10680","last_page":"10689"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.9322999715805054,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.7236337661743164},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.6961116194725037},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4990715980529785},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4670874774456024},{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.45780229568481445},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4483298063278198},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.42592817544937134},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.42389488220214844},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39333927631378174},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3586037755012512},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2951396703720093},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.27499717473983765},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.20178541541099548},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.1624041497707367},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14375773072242737},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.14175215363502502},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11975088715553284}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.7236337661743164},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.6961116194725037},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4990715980529785},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4670874774456024},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.45780229568481445},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4483298063278198},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.42592817544937134},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.42389488220214844},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39333927631378174},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3586037755012512},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2951396703720093},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.27499717473983765},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.20178541541099548},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.1624041497707367},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14375773072242737},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.14175215363502502},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11975088715553284},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2022.3220883","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3220883","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6690912362","display_name":null,"funder_award_id":"NRF2020R1A2C2099663","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320335199","display_name":"Korea Institute of Energy Technology Evaluation and Planning","ror":"https://ror.org/02zq38y32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1643508768","https://openalex.org/W2020020709","https://openalex.org/W2037545067","https://openalex.org/W2039629833","https://openalex.org/W2058254050","https://openalex.org/W2062043581","https://openalex.org/W2073621402","https://openalex.org/W2134535784","https://openalex.org/W2171723112","https://openalex.org/W2478207761","https://openalex.org/W2557908743","https://openalex.org/W2558091148","https://openalex.org/W2594940494","https://openalex.org/W2805756546","https://openalex.org/W2908984067","https://openalex.org/W2947181259","https://openalex.org/W2968579687","https://openalex.org/W3003864893","https://openalex.org/W3118764828","https://openalex.org/W3135237928","https://openalex.org/W4245104830"],"related_works":["https://openalex.org/W2137780917","https://openalex.org/W2798569283","https://openalex.org/W4361855252","https://openalex.org/W1982460678","https://openalex.org/W2357784726","https://openalex.org/W4388647533","https://openalex.org/W2390695630","https://openalex.org/W2808351707","https://openalex.org/W4378801378","https://openalex.org/W2379673631"],"abstract_inverted_index":{"This":[0,40],"article":[1,41],"presents":[2],"a":[3,152,185],"method":[4],"for":[5],"detecting":[6],"series":[7,27,84,154,168],"arc":[8,19,28,38,52,85,95,129,146,155,169,180],"faults":[9],"based":[10,158],"on":[11,159],"noise":[12,36,43,50,53,86,121,130,140],"pattern":[13,44,141],"analysis":[14,45,61,82,142],"in":[15,75,90],"photovoltaic":[16,187],"systems.":[17],"The":[18,115,144],"detection":[20,64,97,147,156,170,173,181],"circuit":[21,183],"is":[22,113,149,175],"required":[23],"to":[24,46,151],"detect":[25,33],"the":[26,34,73,88,125,138,160,164,167,178],"quickly":[29],"and":[30,51,54,108,128,163,171,184],"not":[31],"falsely":[32],"system":[35,49],"as":[37,69],"noise.":[39],"proposes":[42],"distinguish":[47],"between":[48],"prevent":[55],"false":[56,63,172],"detection.":[57],"First,":[58],"periodic":[59,66,76,104],"feature":[60,105],"prevents":[62],"by":[65],"noise,":[67,71],"such":[68],"inverter":[70],"using":[72,87,120,137,177],"difference":[74,89],"characteristics.":[77,92],"Second,":[78],"zero-range":[79],"density":[80],"(ZRD)":[81],"detects":[83],"fluctuation":[91],"An":[93],"integrated":[94],"fault":[96],"algorithm":[98,112,148],"comprising":[99],"discrete":[100],"wavelet":[101],"transform":[102],"decomposition,":[103],"analysis,":[106],"ZRD,":[107],"an":[109],"iterative":[110],"loop":[111],"developed.":[114],"proposed":[116,139],"methods":[117],"are":[118,131],"verified":[119,176],"distinction":[122],"experiments,":[123],"wherein":[124],"injected":[126],"signal":[127],"distinguished":[132],"with":[133],"high":[134],"classification":[135],"precision":[136],"method.":[143],"developed":[145],"applied":[150],"real-time":[153],"board":[157],"TMS320F28335":[161],"DSP,":[162],"performance":[165],"of":[166],"prevention":[174],"UL1699B":[179],"test":[182],"real":[186],"system.":[188]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}