{"id":"https://openalex.org/W4312765799","doi":"https://doi.org/10.1109/tie.2022.3212405","title":"A Novel Model of the Aging Effect on the ON-State Resistance of SiC Power MOSFETs for High-Accuracy Package-Related Aging Evaluation","display_name":"A Novel Model of the Aging Effect on the ON-State Resistance of SiC Power MOSFETs for High-Accuracy Package-Related Aging Evaluation","publication_year":2022,"publication_date":"2022-10-12","ids":{"openalex":"https://openalex.org/W4312765799","doi":"https://doi.org/10.1109/tie.2022.3212405"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2022.3212405","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3212405","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003052424","display_name":"Qinghao Zhang","orcid":"https://orcid.org/0000-0001-8175-4266"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qinghao Zhang","raw_affiliation_strings":["Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8175-4266","affiliations":[{"raw_affiliation_string":"Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031222179","display_name":"Pinjia Zhang","orcid":"https://orcid.org/0000-0002-1288-956X"},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pinjia Zhang","raw_affiliation_strings":["GE Global Research, Niskayuna, NY, USA"],"raw_orcid":"https://orcid.org/0000-0002-1288-956X","affiliations":[{"raw_affiliation_string":"GE Global Research, Niskayuna, NY, USA","institution_ids":["https://openalex.org/I4210134512"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.192,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.77114509,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"70","issue":"9","first_page":"9495","last_page":"9504"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45342114567756653},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3224857747554779}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45342114567756653},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3224857747554779}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2022.3212405","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3212405","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7886376936","display_name":null,"funder_award_id":"52061635102","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W267840210","https://openalex.org/W2024878069","https://openalex.org/W2029699094","https://openalex.org/W2058564794","https://openalex.org/W2071760299","https://openalex.org/W2077760225","https://openalex.org/W2095823567","https://openalex.org/W2150763729","https://openalex.org/W2270656845","https://openalex.org/W2343133302","https://openalex.org/W2498714239","https://openalex.org/W2515108015","https://openalex.org/W2586989731","https://openalex.org/W2740294444","https://openalex.org/W2755161669","https://openalex.org/W2910218467","https://openalex.org/W2960503882","https://openalex.org/W2969481621","https://openalex.org/W2992873428","https://openalex.org/W3013826150","https://openalex.org/W3113391189","https://openalex.org/W3117395369","https://openalex.org/W3133736352","https://openalex.org/W3152982305","https://openalex.org/W4226073571","https://openalex.org/W4245755231"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2130043461","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"Package-related":[0],"aging":[1,12,24,36,48,56,76,114,130,148],"(PRA)":[2],"defects":[3],"can":[4,84,103,172],"cause":[5,140],"severe":[6],"failures":[7],"in":[8],"SiCmosfets,":[9],"so":[10],"an":[11,146],"evaluation":[13,149,158,171],"method":[14,89,95,102,119],"is":[15,19,31,41,59,96,151,159],"essential.on-state":[16],"resistance":[17],"(RON)":[18],"the":[20,44,69,74,81,92,105,138,142,156,169],"most":[21],"widely":[22],"used":[23],"indicator":[25],"for":[26],"SiCmosfets.":[27],"However,":[28],"its":[29],"performance":[30],"limited":[32],"by":[33,122,161],"theRONswing":[34],"as":[35],"levels":[37],"develops.":[38],"This":[39,101],"phenomenon":[40,83],"contradictory":[42],"to":[43,68,73,98],"conventional":[45,166],"model":[46,58,116],"of":[47,107,141,155],"effect":[49,57,106,115],"onRON.":[50,111],"In":[51,78],"this":[52,79],"article,":[53],"a":[54,126],"novel":[55],"proposed,":[60],"whereRONis":[61],"divided":[62],"into":[63],"two":[64],"components":[65],"namedRAGandRSW.RAGis":[66],"related":[67,72],"PRA":[70,108,157],"andRSWis":[71],"chip-related":[75],"(CRA).":[77],"way,":[80],"swing":[82,136,143],"be":[85,173],"eliminated.":[86],"A":[87],"decoupling":[88,118],"based":[90,124],"on":[91,125],"east":[93],"square":[94],"proposed":[97,113],"calculateRAG,RSW,":[99],"andVTH.":[100],"decouple":[104],"and":[109,117,168],"CRA":[110,170],"The":[112,153],"are":[120],"verified":[121],"experiments":[123],"thermal":[127],"cycle":[128],"accelerated":[129],"test.":[131],"Experimental":[132],"results":[133],"indicate":[134],"that":[135],"inRSWis":[137],"root":[139],"inRON.":[144],"Finally,":[145],"online":[147],"strategy":[150],"proposed.":[152],"accuracy":[154],"improved":[160],"five":[162],"times":[163],"compared":[164],"with":[165],"methods,":[167],"conducted":[174],"simultaneously.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":2}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}