{"id":"https://openalex.org/W4285286252","doi":"https://doi.org/10.1109/tie.2022.3181416","title":"Shared Redundancy Strategy to Improve the Reliability and Fault-Tolerant Capability of Modular Multilevel Converter","display_name":"Shared Redundancy Strategy to Improve the Reliability and Fault-Tolerant Capability of Modular Multilevel Converter","publication_year":2022,"publication_date":"2022-06-14","ids":{"openalex":"https://openalex.org/W4285286252","doi":"https://doi.org/10.1109/tie.2022.3181416"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2022.3181416","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3181416","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080102570","display_name":"Saleh Farzamkia","orcid":"https://orcid.org/0000-0001-9177-6506"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Saleh Farzamkia","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Semiconductor Power Electronics Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-9177-6506","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Semiconductor Power Electronics Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087846242","display_name":"Houshang Salimian Rizi","orcid":"https://orcid.org/0000-0001-7224-3501"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Houshang Salimian Rizi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Semiconductor Power Electronics Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-7224-3501","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Semiconductor Power Electronics Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011191579","display_name":"Alex Q. Huang","orcid":"https://orcid.org/0000-0003-3427-0335"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alex Q. Huang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Semiconductor Power Electronics Center, The University of Texas at Austin, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0003-3427-0335","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Semiconductor Power Electronics Center, The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076124766","display_name":"Hossein Iman\u2010Eini","orcid":"https://orcid.org/0000-0003-1118-2877"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Hossein Iman-Eini","raw_affiliation_strings":["School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0003-1118-2877","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5080102570"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":1.5702,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.82435448,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"70","issue":"4","first_page":"3326","last_page":"3336"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9660000205039978,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9502999782562256,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.9161713123321533},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.7908879518508911},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7159347534179688},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6721123456954956},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5822048187255859},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4860997200012207},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.4730830788612366},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3390146493911743},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31411755084991455},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06251901388168335}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.9161713123321533},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.7908879518508911},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7159347534179688},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6721123456954956},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5822048187255859},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4860997200012207},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.4730830788612366},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3390146493911743},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31411755084991455},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06251901388168335},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2022.3181416","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3181416","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1496084898","https://openalex.org/W1574146411","https://openalex.org/W2028144339","https://openalex.org/W2061679071","https://openalex.org/W2098642821","https://openalex.org/W2139885352","https://openalex.org/W2550943922","https://openalex.org/W2622293153","https://openalex.org/W2728506505","https://openalex.org/W2784130885","https://openalex.org/W2795390662","https://openalex.org/W2807821149","https://openalex.org/W2927895504","https://openalex.org/W3015846114","https://openalex.org/W3022074414","https://openalex.org/W3023631577","https://openalex.org/W3093533734","https://openalex.org/W3120084680"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W3008821054","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2000379092","https://openalex.org/W2102525122","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2152497502"],"abstract_inverted_index":{"Utilizing":[0],"redundant":[1,52],"submodules":[2],"is":[3,44],"a":[4,60,86],"well-known":[5],"strategy":[6,22,43,89,114],"to":[7,26,74,93],"improve":[8],"the":[9,15,28,32,35,45,78,112,117,126,129],"reliability":[10,104,118],"and":[11,63,119,133],"fault-tolerant":[12,21],"capability":[13],"of":[14,31,41,77,122,128],"modular":[16],"multilevel":[17],"converter":[18,33],"(MMC).":[19],"Redundancy-based":[20],"makes":[23],"it":[24,64],"possible":[25],"restore":[27],"full":[29],"performance":[30],"in":[34,59,68,80,97,106],"postfault":[36],"condition.":[37],"The":[38,102],"main":[39],"drawback":[40],"this":[42,49],"high":[46],"cost.":[47],"In":[48],"configuration,":[50],"each":[51],"submodule":[53],"(RSM)":[54],"can":[55],"only":[56],"be":[57,66,94],"utilized":[58],"specific":[61],"arm":[62],"cannot":[65],"used":[67,95],"other":[69],"arms.":[70,101],"This":[71,83],"limitation":[72],"leads":[73],"inefficient":[75],"utilization":[76],"RSMs":[79,92],"conventional":[81],"MMC.":[82,123],"article":[84],"proposes":[85],"shared":[87],"redundancy":[88],"which":[90],"allows":[91],"either":[96],"upper":[98],"or":[99],"lower":[100],"derived":[103],"models":[105],"various":[107],"case":[108],"studies":[109],"illustrate":[110],"that":[111],"proposed":[113,130],"significantly":[115],"improves":[116],"useful":[120],"lifetime":[121],"To":[124],"investigate":[125],"effectiveness":[127],"strategy,":[131],"simulation":[132],"experimental":[134],"results":[135],"are":[136],"provided.":[137]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":1}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}