{"id":"https://openalex.org/W4285189373","doi":"https://doi.org/10.1109/tie.2022.3172768","title":"In Situ Diagnosis of Multichip IGBT Module Wire Bonding Faults Based on Collector Voltage Undershoot","display_name":"In Situ Diagnosis of Multichip IGBT Module Wire Bonding Faults Based on Collector Voltage Undershoot","publication_year":2022,"publication_date":"2022-05-11","ids":{"openalex":"https://openalex.org/W4285189373","doi":"https://doi.org/10.1109/tie.2022.3172768"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2022.3172768","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3172768","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://figshare.com/articles/journal_contribution/In_Situ_Diagnosis_of_Multichip_IGBT_Module_Wire_Bonding_Faults_Based_on_Collector_Voltage_Undershoot/19778374","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014263926","display_name":"Wuyu Zhang","orcid":"https://orcid.org/0000-0001-8595-5970"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wuyu Zhang","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8595-5970","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061674785","display_name":"Kun Tan","orcid":"https://orcid.org/0000-0002-1591-2876"},"institutions":[{"id":"https://openalex.org/I153648349","display_name":"University of Leicester","ror":"https://ror.org/04h699437","country_code":"GB","type":"education","lineage":["https://openalex.org/I153648349"]},{"id":"https://openalex.org/I22513266","display_name":"Dynex Semiconductor (United Kingdom)","ror":"https://ror.org/03210bg97","country_code":"GB","type":"company","lineage":["https://openalex.org/I22513266"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Kun Tan","raw_affiliation_strings":["Department of Engineering, University of Leicester, Leicester, U.K","Dynex Semiconductor, Ltd., Lincoln, U.K"],"raw_orcid":"https://orcid.org/0000-0002-1591-2876","affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Leicester, Leicester, U.K","institution_ids":["https://openalex.org/I153648349"]},{"raw_affiliation_string":"Dynex Semiconductor, Ltd., Lincoln, U.K","institution_ids":["https://openalex.org/I22513266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084484593","display_name":"Bing Ji","orcid":"https://orcid.org/0000-0003-0034-6901"},"institutions":[{"id":"https://openalex.org/I153648349","display_name":"University of Leicester","ror":"https://ror.org/04h699437","country_code":"GB","type":"education","lineage":["https://openalex.org/I153648349"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Bing Ji","raw_affiliation_strings":["Department of Engineering, University of Leicester, Leicester, U.K"],"raw_orcid":"https://orcid.org/0000-0003-0034-6901","affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Leicester, Leicester, U.K","institution_ids":["https://openalex.org/I153648349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041144914","display_name":"Lei Qi","orcid":"https://orcid.org/0000-0002-5175-7607"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Qi","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5175-7607","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055905208","display_name":"Xiang Cui","orcid":"https://orcid.org/0000-0003-4779-4365"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiang Cui","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4779-4365","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100362456","display_name":"Xiangyu Zhang","orcid":"https://orcid.org/0000-0002-4858-5429"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangyu Zhang","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4858-5429","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039840502","display_name":"Luchun Du","orcid":null},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Luchun Du","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5014263926"],"corresponding_institution_ids":["https://openalex.org/I153473198"],"apc_list":null,"apc_paid":null,"fwci":2.8634,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.91145423,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"70","issue":"3","first_page":"3045","last_page":"3054"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.9055073261260986},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5049434304237366},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4659154713153839},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42785656452178955},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4092807471752167},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3301636278629303},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3210557699203491},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2410483956336975}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.9055073261260986},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5049434304237366},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4659154713153839},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42785656452178955},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4092807471752167},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3301636278629303},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3210557699203491},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2410483956336975}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2022.3172768","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3172768","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:figshare.com:article/19778374","is_oa":true,"landing_page_url":"https://figshare.com/articles/journal_contribution/In_Situ_Diagnosis_of_Multichip_IGBT_Module_Wire_Bonding_Faults_Based_on_Collector_Voltage_Undershoot/19778374","pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:figshare.com:article/19778374","is_oa":true,"landing_page_url":"https://figshare.com/articles/journal_contribution/In_Situ_Diagnosis_of_Multichip_IGBT_Module_Wire_Bonding_Faults_Based_on_Collector_Voltage_Undershoot/19778374","pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5893107419","display_name":null,"funder_award_id":"51977073","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1533204364","https://openalex.org/W1981115875","https://openalex.org/W1982599175","https://openalex.org/W1992456171","https://openalex.org/W2001140241","https://openalex.org/W2009256068","https://openalex.org/W2013651205","https://openalex.org/W2022242467","https://openalex.org/W2026012753","https://openalex.org/W2062876910","https://openalex.org/W2073386831","https://openalex.org/W2080530062","https://openalex.org/W2090500509","https://openalex.org/W2102575490","https://openalex.org/W2110592902","https://openalex.org/W2111134324","https://openalex.org/W2137379441","https://openalex.org/W2139885352","https://openalex.org/W2147007099","https://openalex.org/W2162398720","https://openalex.org/W2162827174","https://openalex.org/W2566946734","https://openalex.org/W2577274964","https://openalex.org/W2582421809","https://openalex.org/W2612683543","https://openalex.org/W2901771207","https://openalex.org/W2967658260","https://openalex.org/W3037949166","https://openalex.org/W3044480158","https://openalex.org/W3117395369","https://openalex.org/W3200564286","https://openalex.org/W6631675364","https://openalex.org/W6654015745","https://openalex.org/W6666205865","https://openalex.org/W6681936959","https://openalex.org/W6684139912"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2318746575","https://openalex.org/W3164416905","https://openalex.org/W2394855236","https://openalex.org/W2385832380","https://openalex.org/W2060044332","https://openalex.org/W2380046073","https://openalex.org/W2162081524","https://openalex.org/W2149388787","https://openalex.org/W2092374022"],"abstract_inverted_index":{"Condition":[0],"monitoring":[1,33,218],"of":[2,20,57,72,93,123,178],"insulated":[3],"gate":[4],"bipolar":[5],"transistor":[6],"(IGBT)":[7],"modules":[8,39],"is":[9,62,83,110,136,187,194],"an":[10],"effective":[11],"way":[12],"to":[13,85,154],"improve":[14],"the":[15,36,41,58,65,73,86,90,94,117,124,132,138,150,176,197,208],"transient":[16],"performance":[17],"and":[18,98,145,167,184,201,213],"reliability":[19],"modular":[21],"multilevel":[22],"converters":[23],"(MMC).":[24],"This":[25],"article":[26],"proposes":[27],"a":[28,103,113,191],"novel":[29],"bond":[30,96,215],"wire":[31,155,216],"failure":[32],"method":[34],"for":[35],"multichip":[37],"IGBT":[38,60,75,95],"in":[40,137,173],"MMC":[42],"half-bridge":[43,114],"submodule":[44],"(SM)":[45],"structure.":[46],"The":[47,106],"collector":[48],"voltage":[49,88,202],"undershoot":[50],"<italic":[51,77],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[52,55,68,78,81,120,140],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">V</i>":[53,79],"<sub":[54,80],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">CA(np)</sub>":[56,82],"complementary":[59,129],"switch":[61,130],"measured":[63],"during":[64,116],"turn-":[66,118],"<sc":[67,119,139],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">off</small>":[69,121,141],"switching":[70],"transition":[71,122],"controlled":[74,125],"switch.":[76],"sensitive":[84],"induced":[87],"over":[89],"stray":[91],"inductance":[92],"wires":[97],"provides":[99],"high":[100,163],"sensitivity":[101,166],"as":[102],"health":[104],"indicator.":[105],"non-intrusive":[107],"measurement":[108],"technique":[109],"demonstrated":[111],"using":[112],"circuit":[115,193],"IGBT,":[126],"while":[127],"its":[128,171],"(i.e.,":[131],"device":[133],"under":[134],"test)":[135],"state.":[142],"Theoretical":[143],"analysis":[144],"experimental":[146],"results":[147],"show":[148],"that":[149],"parametric":[151],"drift":[152],"due":[153],"bonding":[156],"failures":[157],"can":[158],"be":[159],"effectively":[160],"monitored":[161],"with":[162],"specific":[164],"relative":[165],"granularity.":[168],"To":[169],"ensure":[170],"effectiveness":[172],"practical":[174],"applications,":[175],"influence":[177],"load":[179],"current,":[180],"SM":[181],"capacitor":[182],"voltage,":[183],"junction":[185],"temperature":[186],"discussed.":[188],"In":[189],"addition,":[190],"readout":[192],"designed":[195],"featuring":[196],"integrated":[198],"desaturation":[199],"detection":[200],"peak":[203],"detection,":[204],"which":[205],"offers":[206],"both":[207],"short-term":[209],"overcurrent":[210],"fault":[211],"protection":[212],"long-term":[214],"aging":[217],"functions.":[219]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}