{"id":"https://openalex.org/W4226068325","doi":"https://doi.org/10.1109/tie.2022.3165260","title":"Series Arc Fault Detection Using Regular Signals and Time-Series Reconstruction","display_name":"Series Arc Fault Detection Using Regular Signals and Time-Series Reconstruction","publication_year":2022,"publication_date":"2022-04-12","ids":{"openalex":"https://openalex.org/W4226068325","doi":"https://doi.org/10.1109/tie.2022.3165260"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2022.3165260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3165260","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013601011","display_name":"Run Jiang","orcid":"https://orcid.org/0000-0001-8059-0597"},"institutions":[{"id":"https://openalex.org/I80947539","display_name":"Fuzhou University","ror":"https://ror.org/011xvna82","country_code":"CN","type":"education","lineage":["https://openalex.org/I80947539"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Run Jiang","raw_affiliation_strings":["College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","Fujian Key Laboratory of New Energy Generation and Power Conversion, Fuzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-8059-0597","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","institution_ids":["https://openalex.org/I80947539"]},{"raw_affiliation_string":"Fujian Key Laboratory of New Energy Generation and Power Conversion, Fuzhou, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102784496","display_name":"Yuesheng Zheng","orcid":"https://orcid.org/0000-0002-4498-8001"},"institutions":[{"id":"https://openalex.org/I80947539","display_name":"Fuzhou University","ror":"https://ror.org/011xvna82","country_code":"CN","type":"education","lineage":["https://openalex.org/I80947539"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuesheng Zheng","raw_affiliation_strings":["College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","Fujian Key Laboratory of New Energy Generation and Power Conversion, Fuzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-4498-8001","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","institution_ids":["https://openalex.org/I80947539"]},{"raw_affiliation_string":"Fujian Key Laboratory of New Energy Generation and Power Conversion, Fuzhou, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.5241,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.95404621,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"70","issue":"2","first_page":"2026","last_page":"2036"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7883146405220032},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.6175355911254883},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5884113311767578},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5557088255882263},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5271995663642883},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5231101512908936},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.5016262531280518},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.48272940516471863},{"id":"https://openalex.org/keywords/signal-reconstruction","display_name":"Signal reconstruction","score":0.4148370623588562},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.4108070731163025},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.40754708647727966},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3843455910682678},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25131863355636597},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23085272312164307},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.1394229233264923},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.13331818580627441},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11799168586730957},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10470888018608093}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7883146405220032},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.6175355911254883},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5884113311767578},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5557088255882263},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5271995663642883},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5231101512908936},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5016262531280518},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.48272940516471863},{"id":"https://openalex.org/C70958404","wikidata":"https://www.wikidata.org/wiki/Q7512728","display_name":"Signal reconstruction","level":4,"score":0.4148370623588562},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.4108070731163025},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.40754708647727966},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3843455910682678},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25131863355636597},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23085272312164307},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.1394229233264923},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.13331818580627441},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11799168586730957},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10470888018608093},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2022.3165260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2022.3165260","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.5299999713897705,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1932847118","https://openalex.org/W2139212933","https://openalex.org/W2572569838","https://openalex.org/W2800598202","https://openalex.org/W2893906376","https://openalex.org/W2900706455","https://openalex.org/W2903738303","https://openalex.org/W2906189315","https://openalex.org/W2914298094","https://openalex.org/W2921108624","https://openalex.org/W2950619806","https://openalex.org/W2957590092","https://openalex.org/W2963568967","https://openalex.org/W2967732995","https://openalex.org/W2996455563","https://openalex.org/W2996833514","https://openalex.org/W2998423323","https://openalex.org/W3006920857","https://openalex.org/W3080376411","https://openalex.org/W3082299565","https://openalex.org/W3090166999","https://openalex.org/W3115927263","https://openalex.org/W3136186546","https://openalex.org/W3177367985","https://openalex.org/W3192032765","https://openalex.org/W4213433538","https://openalex.org/W4231129907"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2176409448","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2364769705","https://openalex.org/W4367555392","https://openalex.org/W2374664672","https://openalex.org/W2367940508","https://openalex.org/W2908649630","https://openalex.org/W2390337724"],"abstract_inverted_index":{"This":[0],"article":[1,76],"investigates":[2],"into":[3],"signal":[4],"regularity":[5,14],"in":[6,27,48,55,68,142],"ac":[7],"series":[8,109],"arc":[9],"fault":[10,96],"(SAF)":[11],"detection.":[12],"The":[13,41,146],"can":[15],"solve":[16],"the":[17,46,53,59,73,87,100,104,107,116,126,130,149],"vital":[18],"problem":[19],"that":[20,45],"SAF":[21],"current":[22],"characteristics":[23],"change":[24],"or":[25],"disappear":[26],"unknown":[28,143],"multiload":[29,56,144],"circuits.":[30,161],"A":[31],"coupling":[32,42,60],"method":[33,61,81,132],"is":[34,110,119,137],"adopted":[35],"to":[36,99,121,139],"capture":[37],"high-frequency":[38],"differential":[39],"signals.":[40,97,128],"signals":[43,64,94],"show":[44,148],"waveform":[47,54],"single-load":[49,135],"circuits":[50,136],"closely":[51],"resembles":[52],"ones.":[57,145],"However,":[58],"confuses":[62],"normal":[63],"with":[65],"arcing":[66,123],"ones":[67],"dimmer":[69],"loads.":[70],"To":[71],"address":[72],"issue,":[74],"this":[75],"presents":[77],"a":[78],"time-series":[79],"reconstruction":[80],"based":[82],"on":[83],"spectral":[84,88,101],"features.":[85],"First,":[86],"features":[89,102,124],"are":[90],"analyzed":[91],"between":[92],"fault-like":[93],"and":[95,103,113,156],"According":[98],"desirable":[105],"margin,":[106],"time":[108],"self-adaptively":[111],"decomposed":[112],"reconstructed.":[114],"Then,":[115],"pulse-recognition":[117],"algorithm":[118],"used":[120,138],"extract":[122],"of":[125],"reconstructed":[127],"Finally,":[129],"detection":[131],"determined":[133],"by":[134],"identify":[140],"SAFs":[141],"results":[147],"presented":[150],"approach":[151],"has":[152],"good":[153],"generalization":[154],"performance":[155],"identification":[157],"precision":[158],"under":[159],"arbitrary":[160]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":21},{"year":2024,"cited_by_count":16},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}