{"id":"https://openalex.org/W3197119588","doi":"https://doi.org/10.1109/tie.2021.3109542","title":"A 80x60 Microbolometer CMOS Thermal Imager Integrated With a Low-Noise 12-B DAC","display_name":"A 80x60 Microbolometer CMOS Thermal Imager Integrated With a Low-Noise 12-B DAC","publication_year":2021,"publication_date":"2021-09-08","ids":{"openalex":"https://openalex.org/W3197119588","doi":"https://doi.org/10.1109/tie.2021.3109542","mag":"3197119588"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2021.3109542","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2021.3109542","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091246475","display_name":"Ki-Duk Kim","orcid":"https://orcid.org/0000-0002-9633-0789"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Ki-Duk Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","C&Tech, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"C&Tech, Daejeon, South Korea","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103008586","display_name":"Seunghyun Park","orcid":"https://orcid.org/0000-0003-4044-5349"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seunghyun Park","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","C&Tech, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4044-5349","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"C&Tech, Daejeon, South Korea","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014872199","display_name":"Byunghun Lee","orcid":"https://orcid.org/0000-0002-4331-8380"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byunghun Lee","raw_affiliation_strings":["Department of Biomedical Engineering and the Department of Electronic Engineering, Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-4331-8380","affiliations":[{"raw_affiliation_string":"Department of Biomedical Engineering and the Department of Electronic Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042373004","display_name":"Hyung\u2010Min Lee","orcid":"https://orcid.org/0000-0003-1191-3553"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyung-Min Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1191-3553","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060752633","display_name":"Gyu\u2010Hyeong Cho","orcid":"https://orcid.org/0000-0003-3875-7538"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gyu-Hyeong Cho","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-3875-7538","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5091246475"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.2799,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.48242051,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"69","issue":"8","first_page":"8604","last_page":"8608"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7482612133026123},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5863738656044006},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5701677203178406},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5044628381729126},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.45008862018585205},{"id":"https://openalex.org/keywords/johnson\u2013nyquist-noise","display_name":"Johnson\u2013Nyquist noise","score":0.41811835765838623},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3992856442928314},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34513866901397705},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2909879684448242},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28899216651916504},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.1988196074962616},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1808129847049713},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12900015711784363},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09098890423774719}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7482612133026123},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5863738656044006},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5701677203178406},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5044628381729126},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.45008862018585205},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.41811835765838623},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3992856442928314},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34513866901397705},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2909879684448242},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28899216651916504},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.1988196074962616},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1808129847049713},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12900015711784363},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09098890423774719},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2021.3109542","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2021.3109542","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4000000059604645}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1976321739","https://openalex.org/W2055450933","https://openalex.org/W2745194520","https://openalex.org/W2788317857","https://openalex.org/W2976005030","https://openalex.org/W2993063017","https://openalex.org/W3094342211","https://openalex.org/W3095176342"],"related_works":["https://openalex.org/W2074931360","https://openalex.org/W1584582224","https://openalex.org/W2608033247","https://openalex.org/W2120279355","https://openalex.org/W2149541910","https://openalex.org/W2534791637","https://openalex.org/W4250906080","https://openalex.org/W2064765858","https://openalex.org/W2144149754","https://openalex.org/W3197119588"],"abstract_inverted_index":{"A":[0],"low-cost":[1],"80\u00d760":[2],"microbolometer":[3],"CMOS":[4,71],"(complementary":[5],"metal-oxide-semiconductor)":[6],"thermal":[7],"imager":[8,12,72],"is":[9,29],"presented.":[10],"The":[11,43,60],"system":[13],"integrated":[14],"with":[15],"a":[16,48,53,65,75],"proposed":[17],"12-b":[18,61],"biasing":[19,45,62],"digital-to-analog":[20],"converter":[21],"(DAC)":[22],"has":[23,74],"100":[24,38],"ms":[25],"start-up":[26],"time,":[27],"which":[28],"300\u00d7":[30],"faster":[31],"than":[32],"commercial":[33],"products,":[34],"while":[35],"ensuring":[36],"comparable":[37],"mK":[39],"noise-equivalent":[40],"temperature":[41],"difference.":[42],"low-noise":[44],"DAC":[46,63],"adopts":[47],"current-mode":[49],"divider-stacking":[50],"structure":[51],"and":[52,87],"bit-inversion":[54],"technique,":[55],"leading":[56],"to":[57],"mismatch-insensitive":[58],"operation.":[59],"in":[64],"0.18":[66],"<italic":[67,80],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[68,81,85],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">\u03bc</i>":[69,82],"m":[70],"IC":[73],"low":[76],"noise":[77],"of":[78,93],"1.89":[79],"V":[83],"<sub":[84],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">rms</sub>":[86],"INL":[88],"(integral":[89],"non-linearity)/DNL":[90],"(differential":[91],"non-linearity)":[92],"0.14/0.09":[94],"LSB,":[95],"respectively.":[96]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}