{"id":"https://openalex.org/W3136440491","doi":"https://doi.org/10.1109/tie.2021.3065617","title":"High-Resistance Connection Diagnosis in Five-Phase PMSMs Based on the Method of Magnetic Field Pendulous Oscillation and Symmetrical Components","display_name":"High-Resistance Connection Diagnosis in Five-Phase PMSMs Based on the Method of Magnetic Field Pendulous Oscillation and Symmetrical Components","publication_year":2021,"publication_date":"2021-03-17","ids":{"openalex":"https://openalex.org/W3136440491","doi":"https://doi.org/10.1109/tie.2021.3065617","mag":"3136440491"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2021.3065617","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2021.3065617","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://dr.ntu.edu.sg/bitstream/10356/153657/3/20-TIE-3926.R1_Proof_hi.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100353640","display_name":"Hao Chen","orcid":"https://orcid.org/0000-0003-1777-3459"},"institutions":[{"id":"https://openalex.org/I102461120","display_name":"Marquette University","ror":"https://ror.org/04gr4te78","country_code":"US","type":"education","lineage":["https://openalex.org/I102461120"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hao Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Marquette University, Milwaukee, WI, USA"],"raw_orcid":"https://orcid.org/0000-0003-1777-3459","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Marquette University, Milwaukee, WI, USA","institution_ids":["https://openalex.org/I102461120"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006148299","display_name":"Jiangbiao He","orcid":"https://orcid.org/0000-0001-5456-5320"},"institutions":[{"id":"https://openalex.org/I143302722","display_name":"University of Kentucky","ror":"https://ror.org/02k3smh20","country_code":"US","type":"education","lineage":["https://openalex.org/I143302722"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jiangbiao He","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Kentucky, Lexington, KY, USA"],"raw_orcid":"https://orcid.org/0000-0001-5456-5320","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Kentucky, Lexington, KY, USA","institution_ids":["https://openalex.org/I143302722"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030653299","display_name":"Xing Guan","orcid":null},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Guan","raw_affiliation_strings":["School of Automation, Beijing Institute of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111898341","display_name":"Nabeel A. O. Demerdash","orcid":null},"institutions":[{"id":"https://openalex.org/I102461120","display_name":"Marquette University","ror":"https://ror.org/04gr4te78","country_code":"US","type":"education","lineage":["https://openalex.org/I102461120"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nabeel A. O. Demerdash","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Marquette University, Milwaukee, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Marquette University, Milwaukee, WI, USA","institution_ids":["https://openalex.org/I102461120"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003744734","display_name":"Ayman El\u2010Refaie","orcid":"https://orcid.org/0000-0002-0598-8703"},"institutions":[{"id":"https://openalex.org/I102461120","display_name":"Marquette University","ror":"https://ror.org/04gr4te78","country_code":"US","type":"education","lineage":["https://openalex.org/I102461120"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ayman M. EL-Refaie","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Marquette University, Milwaukee, WI, USA"],"raw_orcid":"https://orcid.org/0000-0002-0598-8703","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Marquette University, Milwaukee, WI, USA","institution_ids":["https://openalex.org/I102461120"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100461247","display_name":"Christopher H. T. Lee","orcid":"https://orcid.org/0000-0001-5132-4126"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Christopher H. T. Lee","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0001-5132-4126","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100353640"],"corresponding_institution_ids":["https://openalex.org/I102461120"],"apc_list":null,"apc_paid":null,"fwci":1.5251,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.82122631,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"69","issue":"3","first_page":"2288","last_page":"2299"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7468502521514893},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5836486220359802},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5549755096435547},{"id":"https://openalex.org/keywords/oscillation","display_name":"Oscillation (cell signaling)","score":0.5113622546195984},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4733738303184509},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.4460856020450592},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3881887197494507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3782818913459778},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3373908996582031},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20534738898277283},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1600068211555481},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.11377841234207153},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08505254983901978}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7468502521514893},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5836486220359802},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5549755096435547},{"id":"https://openalex.org/C2778439541","wikidata":"https://www.wikidata.org/wiki/Q7106412","display_name":"Oscillation (cell signaling)","level":2,"score":0.5113622546195984},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4733738303184509},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.4460856020450592},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3881887197494507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3782818913459778},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3373908996582031},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20534738898277283},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1600068211555481},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.11377841234207153},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08505254983901978},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tie.2021.3065617","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2021.3065617","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/153657","is_oa":true,"landing_page_url":"https://hdl.handle.net/10356/153657","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/153657/3/20-TIE-3926.R1_Proof_hi.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},{"id":"pmh:oai:epublications.marquette.edu:electric_fac-1752","is_oa":false,"landing_page_url":"https://epublications.marquette.edu/electric_fac/746","pdf_url":null,"source":{"id":"https://openalex.org/S4306401682","display_name":"e-Publications@Marquette (Marquette University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I102461120","host_organization_name":"Marquette University","host_organization_lineage":["https://openalex.org/I102461120"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Electrical and Computer Engineering Faculty Research and Publications","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:dr.ntu.edu.sg:10356/153657","is_oa":true,"landing_page_url":"https://hdl.handle.net/10356/153657","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/153657/3/20-TIE-3926.R1_Proof_hi.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3115957285","display_name":null,"funder_award_id":"04INS000705C140","funder_id":"https://openalex.org/F4320320766","funder_display_name":"Nanyang Technological University"}],"funders":[{"id":"https://openalex.org/F4320320766","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3136440491.pdf","grobid_xml":"https://content.openalex.org/works/W3136440491.grobid-xml"},"referenced_works_count":35,"referenced_works":["https://openalex.org/W1548744654","https://openalex.org/W1976715895","https://openalex.org/W1993957783","https://openalex.org/W1997636875","https://openalex.org/W2014526686","https://openalex.org/W2017528957","https://openalex.org/W2022731643","https://openalex.org/W2033528083","https://openalex.org/W2085888257","https://openalex.org/W2101487263","https://openalex.org/W2106715603","https://openalex.org/W2121678898","https://openalex.org/W2129353080","https://openalex.org/W2130088008","https://openalex.org/W2141369983","https://openalex.org/W2153388156","https://openalex.org/W2154077047","https://openalex.org/W2158054222","https://openalex.org/W2166489289","https://openalex.org/W2180015593","https://openalex.org/W2247177755","https://openalex.org/W2258432577","https://openalex.org/W2468328740","https://openalex.org/W2536626230","https://openalex.org/W2580835476","https://openalex.org/W2597309992","https://openalex.org/W2625869391","https://openalex.org/W2896695022","https://openalex.org/W2944757520","https://openalex.org/W2945262540","https://openalex.org/W2952118611","https://openalex.org/W2954071886","https://openalex.org/W2962852271","https://openalex.org/W2986635026","https://openalex.org/W3034607768"],"related_works":["https://openalex.org/W2575775159","https://openalex.org/W2517701025","https://openalex.org/W2026330267","https://openalex.org/W4311537696","https://openalex.org/W2050630979","https://openalex.org/W2386166483","https://openalex.org/W2620568181","https://openalex.org/W2387459476","https://openalex.org/W3015409655","https://openalex.org/W2350226881"],"abstract_inverted_index":{"An":[0],"online":[1],"approach":[2,25,173],"for":[3,153],"diagnosing":[4],"high-resistance":[5],"connection":[6],"(HRC)":[7],"faults":[8],"in":[9,18,62,84,92,101,148],"five-phase":[10],"permanent":[11],"magnet":[12],"synchronous":[13],"motor":[14],"drives":[15,152],"is":[16,26,49,110,117,128,134,174],"presented":[17,171],"this":[19,24,120],"article.":[20],"The":[21,167],"development":[22],"of":[23,106,124,141,169],"based":[27],"on":[28],"a":[29,45],"so-called":[30],"\u201cmagnetic":[31],"field":[32],"pendulous":[33],"oscillation":[34],"(MFPO)\u201d":[35],"technique":[36],"and":[37,73,94,113,156,178],"symmetrical":[38,63],"components":[39,64],"method.":[40],"Under":[41],"HRC":[42,67,82,90,99],"fault":[43,68,76,83,91,100,115],"condition,":[44],"\u201cswing-like\u201d":[46],"MFPO":[47],"phenomenon":[48],"observed":[50],"compared":[51],"to":[52],"the":[53,58,104,107,114,125,131,138,142,149,170],"healthy":[54],"condition.":[55],"Furthermore,":[56],"with":[57],"extracted":[59],"current":[60],"features":[61],"domain,":[65],"different":[66],"types":[69,77],"are":[70,144,165],"successfully":[71],"identified":[72],"distinguished.":[74],"These":[75],"include":[78],"single-phase":[79],"faults,":[80,88,97],"e.g.,":[81,89,98],"phase-A;":[85],"two-phase":[86,95],"nonadjacent":[87],"phase-A&C;":[93],"adjacent":[96],"phase-A&B.":[102],"Meanwhile,":[103],"localization":[105],"faulty":[108],"phase/phases":[109],"also":[111],"accomplished,":[112],"severity":[116],"estimated.":[118],"In":[119],"approach,":[121],"only":[122],"sensing":[123],"phase":[126],"currents":[127,143],"needed.":[129],"Hence,":[130],"implementation":[132],"cost":[133],"very":[135],"low":[136],"since":[137],"sensory":[139],"data":[140],"typically":[145],"already":[146],"available":[147],"closed-loop":[150],"vector-controlled":[151],"control":[154],"purpose":[155],"no":[157],"additional":[158],"sensors":[159],"or":[160],"related":[161],"signal":[162],"conditioning":[163],"circuits":[164],"required.":[166],"effectiveness":[168],"diagnostic":[172],"verified":[175],"by":[176],"simulations":[177],"experimental":[179],"results.":[180]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2021-03-29T00:00:00"}