{"id":"https://openalex.org/W3138698531","doi":"https://doi.org/10.1109/tie.2021.3063958","title":"Receiver Signal Analysis on Geometry and Excitation Parameters of Remote Field Eddy Current Probe","display_name":"Receiver Signal Analysis on Geometry and Excitation Parameters of Remote Field Eddy Current Probe","publication_year":2021,"publication_date":"2021-03-10","ids":{"openalex":"https://openalex.org/W3138698531","doi":"https://doi.org/10.1109/tie.2021.3063958","mag":"3138698531"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2021.3063958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2021.3063958","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100699345","display_name":"Qi Xiao","orcid":"https://orcid.org/0000-0003-0199-9170"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qi Xiao","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010565829","display_name":"Jian Feng","orcid":"https://orcid.org/0000-0001-6813-6754"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Feng","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102897990","display_name":"Zhiyuan Xu","orcid":"https://orcid.org/0000-0001-8955-8358"},"institutions":[{"id":"https://openalex.org/I4610292","display_name":"Xiangtan University","ror":"https://ror.org/00xsfaz62","country_code":"CN","type":"education","lineage":["https://openalex.org/I4610292"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyuan Xu","raw_affiliation_strings":["College of Mechanical Engineering, Xiangtan University, Xiangtan, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering, Xiangtan University, Xiangtan, China","institution_ids":["https://openalex.org/I4610292"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100625792","display_name":"Huaguang Zhang","orcid":"https://orcid.org/0000-0002-2375-9824"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaguang Zhang","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100699345"],"corresponding_institution_ids":["https://openalex.org/I9224756"],"apc_list":null,"apc_paid":null,"fwci":3.8137,"has_fulltext":false,"cited_by_count":47,"citation_normalized_percentile":{"value":0.93951706,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"69","issue":"3","first_page":"3088","last_page":"3098"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.7622377872467041},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.7485008239746094},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7417194843292236},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.7021675705909729},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6447615027427673},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5990279912948608},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5352339148521423},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.49845314025878906},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4365840554237366},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.4362889528274536},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40982961654663086},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3050384521484375},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2730620503425598},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.27260130643844604},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.264828622341156},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2230575978755951},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16402873396873474},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10323449969291687}],"concepts":[{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.7622377872467041},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.7485008239746094},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7417194843292236},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.7021675705909729},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6447615027427673},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5990279912948608},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5352339148521423},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.49845314025878906},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4365840554237366},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.4362889528274536},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40982961654663086},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3050384521484375},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2730620503425598},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.27260130643844604},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.264828622341156},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2230575978755951},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16402873396873474},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10323449969291687},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2021.3063958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2021.3063958","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1654361107","display_name":null,"funder_award_id":"61673093","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2036897366","display_name":null,"funder_award_id":"61627809","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2558483501","display_name":null,"funder_award_id":"62003080","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7953127930","display_name":null,"funder_award_id":"51505406","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329895","display_name":"Liaoning Revitalization Talents Program","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1484638608","https://openalex.org/W1987228304","https://openalex.org/W1989921891","https://openalex.org/W1997540800","https://openalex.org/W2023806777","https://openalex.org/W2026979666","https://openalex.org/W2048995131","https://openalex.org/W2077814815","https://openalex.org/W2086222404","https://openalex.org/W2089293035","https://openalex.org/W2090051524","https://openalex.org/W2104425625","https://openalex.org/W2132606653","https://openalex.org/W2160251174","https://openalex.org/W2166207675","https://openalex.org/W2298070562","https://openalex.org/W2339071018","https://openalex.org/W2505556671","https://openalex.org/W2529815979","https://openalex.org/W2585879381","https://openalex.org/W2595750449","https://openalex.org/W2744670083","https://openalex.org/W2794714840","https://openalex.org/W2902952618","https://openalex.org/W2903779506","https://openalex.org/W2986280842","https://openalex.org/W3047189548","https://openalex.org/W3144614814","https://openalex.org/W6649841848","https://openalex.org/W6792745702"],"related_works":["https://openalex.org/W2085805524","https://openalex.org/W4296871629","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2003522138","https://openalex.org/W2102849516","https://openalex.org/W2369672268","https://openalex.org/W1680801918","https://openalex.org/W1972402538","https://openalex.org/W4230069654"],"abstract_inverted_index":{"The":[0],"traditional":[1],"remote":[2],"field":[3],"eddy":[4],"current":[5,56],"(RFEC)":[6],"testing":[7],"is":[8,44,93,125,189],"a":[9,21,102],"method":[10,92,188],"widely":[11],"applied":[12],"for":[13,194],"detecting":[14],"the":[15,35,48,72,78,106,115,122,131,134,145,151,163,167,172,186,195],"corrosion":[16],"and":[17,25,66,111,127,137,150,156],"wall":[18],"thinning":[19],"in":[20,29,82,147],"ferromagnetic":[22],"pipe":[23,83],"system":[24],"shows":[26],"intrinsic":[27],"deficiencies":[28],"axial":[30,51],"defects":[31,52,70,158],"quantification":[32],"due":[33],"to":[34,46,50,77,95,129,153,179],"distinct":[36],"probe":[37,42,109,148],"structure.":[38],"A":[39],"circumferential":[40],"alignment":[41],"structure":[43],"used":[45,128,178],"improve":[47],"sensitivity":[49],"of":[53,61,71,80,105,108,166],"pipes.":[54],"Meanwhile,":[55],"approaches":[57],"typically":[58],"are":[59,159],"incapable":[60],"classifying":[62],"inner":[63],"diameter":[64,68],"(ID)":[65],"outer":[67],"(OD)":[69],"pipe,":[73],"which":[74],"brings":[75],"difficulties":[76],"formulation":[79],"strategies":[81],"repair.":[84],"In":[85],"this":[86],"article,":[87],"an":[88,190],"external":[89],"pulsed":[90],"RFEC":[91,197],"proposed":[94,187],"address":[96],"these":[97],"issues.":[98],"First,":[99],"we":[100],"give":[101],"thorough":[103],"analysis":[104],"effects":[107],"geometry":[110],"excitation":[112,142],"parameters":[113,119],"on":[114],"output":[116],"signal,":[117],"targeting":[118],"optimization.":[120],"Second,":[121],"finite-element":[123],"model":[124],"built":[126],"analyze":[130],"relationships":[132],"between":[133],"defect":[135,164],"size":[136],"signal":[138],"features":[139],"under":[140],"different":[141],"types.":[143],"Finally,":[144],"improvements":[146],"performance":[149],"ability":[152],"classify":[154],"ID":[155,181],"OD":[157,183],"validated":[160],"by":[161],"measuring":[162],"depths":[165],"pipe.":[168],"Results":[169],"showed":[170],"that":[171],"zero-crossing":[173],"time":[174],"feature":[175],"can":[176],"be":[177],"distinguish":[180],"from":[182],"defects.":[184],"Thus,":[185],"effective":[191],"complementary":[192],"measure":[193],"existing":[196],"tools.":[198]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":16},{"year":2022,"cited_by_count":10}],"updated_date":"2026-03-17T09:09:15.849793","created_date":"2025-10-10T00:00:00"}