{"id":"https://openalex.org/W3092459809","doi":"https://doi.org/10.1109/tie.2020.3028808","title":"Switch Open-Circuit Fault Localization Strategy for MMCs Using Sliding-Time Window Based Features Extraction Algorithm","display_name":"Switch Open-Circuit Fault Localization Strategy for MMCs Using Sliding-Time Window Based Features Extraction Algorithm","publication_year":2020,"publication_date":"2020-10-09","ids":{"openalex":"https://openalex.org/W3092459809","doi":"https://doi.org/10.1109/tie.2020.3028808","mag":"3092459809"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2020.3028808","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.3028808","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055654426","display_name":"Fujin Deng","orcid":"https://orcid.org/0000-0002-9832-004X"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fujin Deng","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, and Jiangsu Key Laboratory of Smart Grid Technology and Equipment, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-9832-004X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, and Jiangsu Key Laboratory of Smart Grid Technology and Equipment, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044186922","display_name":"Ming Jin","orcid":"https://orcid.org/0000-0003-3464-0623"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Jin","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103102734","display_name":"Chengkai Liu","orcid":"https://orcid.org/0000-0003-0494-7501"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengkai Liu","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053880143","display_name":"Marco Liserre","orcid":"https://orcid.org/0000-0002-0818-2684"},"institutions":[{"id":"https://openalex.org/I32021983","display_name":"Christian-Albrechts-Universit\u00e4t zu Kiel","ror":"https://ror.org/04v76ef78","country_code":"DE","type":"education","lineage":["https://openalex.org/I32021983"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marco Liserre","raw_affiliation_strings":["Department of Power Electronics, Christian-Albrechts-University of Kiel, Kiel, Germany"],"raw_orcid":"https://orcid.org/0000-0002-0818-2684","affiliations":[{"raw_affiliation_string":"Department of Power Electronics, Christian-Albrechts-University of Kiel, Kiel, Germany","institution_ids":["https://openalex.org/I32021983"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071475574","display_name":"Wu Chen","orcid":"https://orcid.org/0000-0002-1835-7564"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wu Chen","raw_affiliation_strings":["School of Electrical Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-1835-7564","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.1219,"has_fulltext":false,"cited_by_count":67,"citation_normalized_percentile":{"value":0.92300729,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"68","issue":"10","first_page":"10193","last_page":"10206"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9857000112533569,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6779789328575134},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6707432866096497},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6557012796401978},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.6244747042655945},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5852741003036499},{"id":"https://openalex.org/keywords/sliding-window-protocol","display_name":"Sliding window protocol","score":0.583551287651062},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5728436708450317},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5441795587539673},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.45866528153419495},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4245571494102478},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37915927171707153},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.36022791266441345},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.335435688495636},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.30074217915534973},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26361531019210815},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14619728922843933},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.09290340542793274}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6779789328575134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6707432866096497},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6557012796401978},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.6244747042655945},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5852741003036499},{"id":"https://openalex.org/C102392041","wikidata":"https://www.wikidata.org/wiki/Q592860","display_name":"Sliding window protocol","level":3,"score":0.583551287651062},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5728436708450317},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5441795587539673},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.45866528153419495},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4245571494102478},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37915927171707153},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.36022791266441345},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.335435688495636},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.30074217915534973},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26361531019210815},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14619728922843933},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.09290340542793274},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2020.3028808","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.3028808","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5043971560","display_name":null,"funder_award_id":"BK20180395","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"},{"id":"https://openalex.org/G5141470604","display_name":"\u67d4\u6027\u76f4\u6d41\u8f93\u7535\u7cfb\u7edf\u5206\u5c42\u534f\u540c\u6545\u969c\u8bca\u65ad\u548c\u5bb9\u9519\u63a7\u5236\u7814\u7a76","funder_award_id":"61873062","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2029681577","https://openalex.org/W2061146253","https://openalex.org/W2080361276","https://openalex.org/W2091010708","https://openalex.org/W2096626066","https://openalex.org/W2120533977","https://openalex.org/W2129242370","https://openalex.org/W2138331510","https://openalex.org/W2168344259","https://openalex.org/W2174980551","https://openalex.org/W2215529216","https://openalex.org/W2284778013","https://openalex.org/W2331730087","https://openalex.org/W2343375316","https://openalex.org/W2511880925","https://openalex.org/W2521237211","https://openalex.org/W2605820745","https://openalex.org/W2765565573","https://openalex.org/W2769017812","https://openalex.org/W2791294457","https://openalex.org/W2800911105","https://openalex.org/W2809330748","https://openalex.org/W2903369950","https://openalex.org/W2916122751","https://openalex.org/W2995102745","https://openalex.org/W3040090953"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W4386859288","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2042495646","https://openalex.org/W3014558862"],"abstract_inverted_index":{"Fault":[0],"localization":[1,27,83],"is":[2,42],"one":[3],"of":[4,16,18,48,125,132,146],"the":[5,10,30,46,49,53,61,64,67,74,92,106,115,123,141,144,147],"most":[6],"important":[7],"issues":[8],"for":[9,29,91,114],"modular":[11],"multilevel":[12],"converters":[13],"(MMC)":[14],"consisting":[15],"lots":[17],"switches.":[19],"This":[20],"article":[21],"proposes":[22],"a":[23,33],"switch":[24],"open-circuit":[25],"fault":[26,65,82,107],"strategy":[28,84],"MMC,":[31],"where":[32],"sliding-time":[34],"window":[35],"(STW)":[36],"based":[37,51],"features":[38,47,89],"extraction":[39],"algorithm":[40],"(FEA)":[41],"proposed":[43,80,148],"to":[44],"extract":[45],"MMC":[50,68,93],"on":[52,60],"feature":[54],"relationship":[55],"between":[56],"neighboring":[57],"STWs.":[58],"Based":[59],"extracted":[62],"features,":[63],"in":[66,94],"can":[69,85,104],"be":[70],"easily":[71],"located":[72],"with":[73,108],"2-D":[75],"convolutional":[76],"neural":[77],"networks.":[78],"The":[79],"STW-FEA-based":[81],"constructs":[86],"concise":[87],"low-data-volume":[88],"samples":[90],"both":[95],"time":[96,110],"domain":[97],"and":[98,101,111,129,136,140],"frequency":[99],"domain,":[100],"accordingly":[102],"it":[103,119],"locate":[105],"short":[109],"high":[112],"accuracy":[113],"MMC.":[116],"In":[117],"addition,":[118],"does":[120],"not":[121],"require":[122],"creation":[124],"complex":[126],"mathematical":[127],"models":[128],"manual":[130],"setting":[131],"empirical":[133],"thresholds.":[134],"Simulation":[135],"experiment":[137],"are":[138],"conducted,":[139],"results":[142],"confirm":[143],"effectiveness":[145],"strategy.":[149]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":18},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":16},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}