{"id":"https://openalex.org/W3085142425","doi":"https://doi.org/10.1109/tie.2020.3021651","title":"Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation","display_name":"Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation","publication_year":2020,"publication_date":"2020-09-10","ids":{"openalex":"https://openalex.org/W3085142425","doi":"https://doi.org/10.1109/tie.2020.3021651","mag":"3085142425"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2020.3021651","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.3021651","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062117879","display_name":"Lei Su","orcid":"https://orcid.org/0000-0003-1190-5916"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lei Su","raw_affiliation_strings":["Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China"],"raw_orcid":"https://orcid.org/0000-0003-1190-5916","affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107748514","display_name":"Xiaonan Yu","orcid":"https://orcid.org/0009-0001-9293-7858"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaonan Yu","raw_affiliation_strings":["Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100343439","display_name":"Ke Li","orcid":"https://orcid.org/0000-0001-5467-7218"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Li","raw_affiliation_strings":["Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016991019","display_name":"Jiefei Gu","orcid":"https://orcid.org/0000-0002-6017-3363"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiefei Gu","raw_affiliation_strings":["Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013287421","display_name":"Michael Pecht","orcid":"https://orcid.org/0000-0003-1126-8662"},"institutions":[{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Pecht","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering, University of Maryland, College Park, MD, USA"],"raw_orcid":"https://orcid.org/0000-0003-1126-8662","affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5062117879"],"corresponding_institution_ids":["https://openalex.org/I111599522"],"apc_list":null,"apc_paid":null,"fwci":0.7577,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.66241459,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"68","issue":"10","first_page":"10154","last_page":"10161"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12015","display_name":"Photoacoustic and Ultrasonic Imaging","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.7281272411346436},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7252856492996216},{"id":"https://openalex.org/keywords/point-spread-function","display_name":"Point spread function","score":0.6195731163024902},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5839563012123108},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.5489164590835571},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5142597556114197},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5116234421730042},{"id":"https://openalex.org/keywords/maximum-a-posteriori-estimation","display_name":"Maximum a posteriori estimation","score":0.4932820200920105},{"id":"https://openalex.org/keywords/image-restoration","display_name":"Image restoration","score":0.4865497648715973},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3922806978225708},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3414527475833893},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34100770950317383},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.28704124689102173}],"concepts":[{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.7281272411346436},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7252856492996216},{"id":"https://openalex.org/C69179731","wikidata":"https://www.wikidata.org/wiki/Q510427","display_name":"Point spread function","level":2,"score":0.6195731163024902},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5839563012123108},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.5489164590835571},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5142597556114197},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5116234421730042},{"id":"https://openalex.org/C9810830","wikidata":"https://www.wikidata.org/wiki/Q635384","display_name":"Maximum a posteriori estimation","level":3,"score":0.4932820200920105},{"id":"https://openalex.org/C106430172","wikidata":"https://www.wikidata.org/wiki/Q6002272","display_name":"Image restoration","level":4,"score":0.4865497648715973},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3922806978225708},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3414527475833893},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34100770950317383},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.28704124689102173},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2020.3021651","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.3021651","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1827769424","display_name":null,"funder_award_id":"51705203","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3847905167","display_name":null,"funder_award_id":"11902124","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4565864590","display_name":null,"funder_award_id":"B18027","funder_id":"https://openalex.org/F4320327912","funder_display_name":"Higher Education Discipline Innovation Project"},{"id":"https://openalex.org/G5589028268","display_name":null,"funder_award_id":"51775243","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327912","display_name":"Higher Education Discipline Innovation Project","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1968970249","https://openalex.org/W1973871508","https://openalex.org/W1975596389","https://openalex.org/W1983457454","https://openalex.org/W1987075379","https://openalex.org/W2023732254","https://openalex.org/W2026019078","https://openalex.org/W2030628285","https://openalex.org/W2036682493","https://openalex.org/W2039877224","https://openalex.org/W2046971278","https://openalex.org/W2048779615","https://openalex.org/W2056370875","https://openalex.org/W2097237857","https://openalex.org/W2098535678","https://openalex.org/W2100556411","https://openalex.org/W2116138963","https://openalex.org/W2138204001","https://openalex.org/W2146782367","https://openalex.org/W2157276652","https://openalex.org/W2205399408","https://openalex.org/W2217017124","https://openalex.org/W2409217845","https://openalex.org/W2536232320","https://openalex.org/W2742095546","https://openalex.org/W2908637681","https://openalex.org/W3098429676"],"related_works":["https://openalex.org/W2808332603","https://openalex.org/W2974904990","https://openalex.org/W2018534838","https://openalex.org/W1522749619","https://openalex.org/W2555730586","https://openalex.org/W2144336166","https://openalex.org/W189037341","https://openalex.org/W2079262912","https://openalex.org/W2888591766","https://openalex.org/W2997591215"],"abstract_inverted_index":{"The":[0,98,153],"sparse":[1,74,89,108,158],"reconstruction":[2,159],"of":[3,21,25,33,145,164,183],"two-dimensional":[4],"(2-D)":[5],"ultrasound":[6,167],"images":[7,144],"has":[8],"proven":[9],"effective":[10,175],"in":[11,14,19,132],"detecting":[12],"microdefects":[13],"acoustic":[15],"microimaging":[16],"(AMI).":[17],"However,":[18],"terms":[20],"the":[22,30,39,49,69,88,106,117,123,133,138,149,157,161,171],"acquisition":[23],"method":[24,41,51],"a":[26,44,79,165],"blur":[27,70,112,118,150],"kernel":[28,71,113,119,151],"for":[29,38,58,73,84,160,176],"AMI":[31,85],"detection":[32,163],"microdefects,":[34],"it":[35],"is":[36,102,130,174],"difficult":[37],"experimental":[40],"to":[42,53,86,91,110],"prepare":[43],"micrometer-level":[45],"point":[46],"source,":[47],"and":[48,67,96,179],"simulation":[50,56],"needs":[52],"build":[54],"different":[55,59,92],"models":[57],"ultrasonic":[60,93],"probes.":[61,97],"These":[62],"two":[63],"methods":[64],"are":[65],"troublesome":[66],"limit":[68],"function":[72,120],"reconstruction.":[75],"This":[76],"article":[77],"develops":[78],"super-resolution":[80],"blind":[81,172],"estimation":[82,114,129,173],"algorithm":[83],"generalize":[87],"model":[90],"imaging":[94],"devices":[95],"original":[99],"blurred":[100],"image":[101,168],"denoised":[103,134],"based":[104,121,169],"on":[105,122,170],"2-D":[107,166],"representation":[109],"perform":[111],"normally.":[115],"Then,":[116],"maximum":[124],"<italic":[125,140],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[126,141],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">a":[127],"posteriori</i>":[128],"estimated":[131],"image.":[135],"We":[136],"reconstruct":[137],"deblurred":[139],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">C</i>":[142],"-scan":[143],"complex":[146],"defects":[147],"with":[148],"function.":[152],"results":[154],"indicate":[155],"that":[156],"microdefect":[162,184],"resolution":[177],"improvement":[178],"signal-to-noise":[180],"ratio":[181],"enhancement":[182],"detection.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2}],"updated_date":"2026-05-19T08:33:51.333923","created_date":"2025-10-10T00:00:00"}