{"id":"https://openalex.org/W3040565717","doi":"https://doi.org/10.1109/tie.2020.3005073","title":"Online Condition Monitoring for Bond Wire Degradation of IGBT Modules in Three-Level Neutral-Point-Clamped Converters","display_name":"Online Condition Monitoring for Bond Wire Degradation of IGBT Modules in Three-Level Neutral-Point-Clamped Converters","publication_year":2020,"publication_date":"2020-07-01","ids":{"openalex":"https://openalex.org/W3040565717","doi":"https://doi.org/10.1109/tie.2020.3005073","mag":"3040565717"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2020.3005073","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.3005073","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101451964","display_name":"Xulong Wang","orcid":"https://orcid.org/0000-0003-3840-4900"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xulong Wang","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044588691","display_name":"Pengju Sun","orcid":"https://orcid.org/0000-0003-2849-7373"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengju Sun","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101525088","display_name":"Sun Lin","orcid":"https://orcid.org/0000-0002-9333-3968"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Sun","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046728500","display_name":"Quanming Luo","orcid":"https://orcid.org/0000-0002-1458-2801"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quanming Luo","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055871568","display_name":"Xiong Du","orcid":"https://orcid.org/0000-0002-0212-1653"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiong Du","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101451964"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":null,"apc_paid":null,"fwci":1.8494,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.85674751,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"68","issue":"8","first_page":"7474","last_page":"7484"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.9399706125259399},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5801857113838196},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5422893166542053},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5247688293457031},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.49088770151138306},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.4840216338634491},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46591025590896606},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.43899115920066833},{"id":"https://openalex.org/keywords/idle","display_name":"Idle","score":0.4376314878463745},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3804941177368164},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3679141104221344},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3561597168445587},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2507251501083374},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0978037416934967}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.9399706125259399},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5801857113838196},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5422893166542053},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5247688293457031},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.49088770151138306},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.4840216338634491},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46591025590896606},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.43899115920066833},{"id":"https://openalex.org/C16320812","wikidata":"https://www.wikidata.org/wiki/Q1812200","display_name":"Idle","level":2,"score":0.4376314878463745},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3804941177368164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3679141104221344},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3561597168445587},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2507251501083374},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0978037416934967},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2020.3005073","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.3005073","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1533581791","https://openalex.org/W1970530341","https://openalex.org/W1973857030","https://openalex.org/W1979238143","https://openalex.org/W1981115875","https://openalex.org/W1982599175","https://openalex.org/W2000224440","https://openalex.org/W2001912741","https://openalex.org/W2008706439","https://openalex.org/W2011089588","https://openalex.org/W2022783635","https://openalex.org/W2024878069","https://openalex.org/W2026012753","https://openalex.org/W2030973541","https://openalex.org/W2046657456","https://openalex.org/W2060589885","https://openalex.org/W2083048944","https://openalex.org/W2091204867","https://openalex.org/W2102575490","https://openalex.org/W2116231191","https://openalex.org/W2116444921","https://openalex.org/W2120246139","https://openalex.org/W2134660036","https://openalex.org/W2150763729","https://openalex.org/W2156124999","https://openalex.org/W2162827174","https://openalex.org/W2167320299","https://openalex.org/W2321308786","https://openalex.org/W2463480369","https://openalex.org/W2464895101","https://openalex.org/W2546726487","https://openalex.org/W2577274964","https://openalex.org/W6683011494","https://openalex.org/W6719391817"],"related_works":["https://openalex.org/W2318746575","https://openalex.org/W3164416905","https://openalex.org/W2394855236","https://openalex.org/W2385832380","https://openalex.org/W2974485871","https://openalex.org/W2060044332","https://openalex.org/W2380046073","https://openalex.org/W1577119738","https://openalex.org/W2146642246","https://openalex.org/W4324123959"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"an":[3,100],"online":[4,78],"condition":[5],"monitoring":[6],"(CM)":[7],"method":[8,35,173],"is":[9,70,106],"proposed":[10,34,172],"for":[11,93,130,136],"the":[12,37,41,51,56,75,90,110,119,127,143,160,168,171,175,178],"bond":[13,102],"wire":[14,103],"degradation":[15],"of":[16,64,77,170,177],"insulated-gate":[17],"bipolar":[18],"transistor":[19],"(IGBT)":[20],"modules":[21],"in":[22,44],"a":[23,45,65],"single-phase":[24],"or":[25],"three-phase":[26],"three-level":[27],"neutral-point-clamped":[28],"(3LNPC)":[29],"dc-ac,":[30],"ac-dc":[31],"converter.":[32],"The":[33,67],"has":[36],"ability":[38],"to":[39,108,166],"detect":[40],"whole":[42],"IGBTs":[43,54],"3LNPC":[46],"converter,":[47],"based":[48],"on":[49,80],"finding":[50],"idle":[52],"on-state":[53,145],"under":[55],"specific":[57],"load":[58,81],"current":[59,82,120,129,135],"direction":[60],"and":[61,74,117,133,141,157,174],"switching":[62],"sequence":[63],"leg.":[66],"detection":[68],"time":[69],"short":[71],"(0.2":[72],"ms)":[73],"influence":[76],"CM":[79,94,104,111,131,180],"can":[83,115],"be":[84],"completely":[85],"neglected":[86],"as":[87,89],"long":[88],"insertion":[91],"areas":[92],"test":[95,132],"are":[96],"chosen":[97],"reasonably.":[98],"Meanwhile,":[99],"advanced":[101],"module":[105,114],"designed":[107],"conduct":[109],"test.":[112],"This":[113],"generate":[116],"inject":[118],"pulse":[121],"trains":[122],"into":[123],"IGBT":[124],"modules,":[125],"with":[126],"high":[128],"low":[134],"temperature-sensitive":[137],"electrical":[138],"parameter":[139],"measurement,":[140],"sample":[142],"collector-emitter":[144],"voltage":[146],"(V":[147],"<sub":[148,152],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[149,153],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">CE</sub>":[150],"_":[151],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">ON</sub>":[154],")":[155],"stably":[156],"precisely.":[158],"Finally,":[159],"experimental":[161],"work":[162],"was":[163],"carried":[164],"out":[165],"verify":[167],"effectiveness":[169],"practicality":[176],"developed":[179],"module.":[181]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}