{"id":"https://openalex.org/W3030371815","doi":"https://doi.org/10.1109/tie.2020.2996148","title":"A 20 MHz On-Chip All-NMOS 3-Level DC\u2013DC Converter With Interception Coupling Dead-Time Control and 3-Switch Bootstrap Gate Driver","display_name":"A 20 MHz On-Chip All-NMOS 3-Level DC\u2013DC Converter With Interception Coupling Dead-Time Control and 3-Switch Bootstrap Gate Driver","publication_year":2020,"publication_date":"2020-05-27","ids":{"openalex":"https://openalex.org/W3030371815","doi":"https://doi.org/10.1109/tie.2020.2996148","mag":"3030371815"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2020.2996148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.2996148","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008767582","display_name":"Bumkil Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bumkil Lee","raw_affiliation_strings":["University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033855567","display_name":"D. Brian","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Brian Ma","raw_affiliation_strings":["University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-4457-7157","affiliations":[{"raw_affiliation_string":"University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I162577319"],"apc_list":null,"apc_paid":null,"fwci":0.3256,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.53289916,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"68","issue":"7","first_page":"6339","last_page":"6347"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.9030909538269043},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6002979278564453},{"id":"https://openalex.org/keywords/dead-time","display_name":"Dead time","score":0.5395142436027527},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.48722901940345764},{"id":"https://openalex.org/keywords/power-density","display_name":"Power density","score":0.4725574851036072},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.45637476444244385},{"id":"https://openalex.org/keywords/power-factor","display_name":"Power factor","score":0.4396023750305176},{"id":"https://openalex.org/keywords/switched-mode-power-supply","display_name":"Switched-mode power supply","score":0.4168049991130829},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41481226682662964},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3827250599861145},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3748396635055542},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3423748314380646},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32636308670043945},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.20984703302383423},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14852887392044067}],"concepts":[{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.9030909538269043},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6002979278564453},{"id":"https://openalex.org/C159484563","wikidata":"https://www.wikidata.org/wiki/Q628723","display_name":"Dead time","level":2,"score":0.5395142436027527},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.48722901940345764},{"id":"https://openalex.org/C21881925","wikidata":"https://www.wikidata.org/wiki/Q3503313","display_name":"Power density","level":3,"score":0.4725574851036072},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.45637476444244385},{"id":"https://openalex.org/C64424096","wikidata":"https://www.wikidata.org/wiki/Q750454","display_name":"Power factor","level":3,"score":0.4396023750305176},{"id":"https://openalex.org/C151799858","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply","level":3,"score":0.4168049991130829},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41481226682662964},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3827250599861145},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3748396635055542},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3423748314380646},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32636308670043945},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.20984703302383423},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14852887392044067},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2020.2996148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2020.2996148","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1968363789","https://openalex.org/W1990884219","https://openalex.org/W2001442398","https://openalex.org/W2006345331","https://openalex.org/W2011300777","https://openalex.org/W2017216250","https://openalex.org/W2038509324","https://openalex.org/W2051230585","https://openalex.org/W2085827389","https://openalex.org/W2121930884","https://openalex.org/W2126521451","https://openalex.org/W2148191224"],"related_works":["https://openalex.org/W2352046881","https://openalex.org/W2361439205","https://openalex.org/W1626347822","https://openalex.org/W2363071667","https://openalex.org/W2350932543","https://openalex.org/W2362489109","https://openalex.org/W2185400004","https://openalex.org/W2001796080","https://openalex.org/W2032396695","https://openalex.org/W2355292337"],"abstract_inverted_index":{"In":[0],"mobile":[1],"applications,":[2],"power":[3,16,27,35,57,62,71,102,132,142,149,157],"density":[4,158],"highly":[5,23],"affects":[6],"mobility,":[7],"cost,":[8],"form":[9],"factor,":[10],"and":[11,41,64,74,154],"battery":[12,42],"time.":[13,43],"To":[14,67],"improve":[15],"density,":[17],"high":[18,31],"switching":[19,32,34,61],"frequency":[20],"operation":[21,73],"is":[22,87,96],"desirable":[24],"for":[25],"a":[26,82,111,119,130,140,147,155,169,174],"converter.":[28],"However,":[29],"with":[30,118,139],"frequency,":[33],"loss":[36,63],"increases":[37],"significantly,":[38],"compromising":[39],"efficiency":[40,143],"This":[44],"article":[45],"presents":[46],"an":[47,90],"on-chip":[48],"3-level":[49],"DC-DC":[50],"converter,":[51],"using":[52,110],"all":[53],"NMOS":[54],"devices":[55],"as":[56],"switches,":[58],"which":[59],"reduces":[60],"silicon":[65],"cost.":[66],"facilitate":[68],"the":[69,76,164],"all-NMOS":[70],"stage":[72],"enhance":[75],"robustness":[77],"to":[78,98,125,136,163],"input":[79,121],"supply":[80],"variation,":[81],"3-switch":[83],"boost-strap":[84],"gate":[85],"driver":[86],"designed.":[88],"Meanwhile,":[89],"interception":[91],"coupling":[92],"dead-time":[93,100,172],"(ICDT)":[94],"control":[95],"introduced":[97],"minimize":[99],"related":[101],"loss.":[103],"An":[104],"integrated":[105],"circuit":[106],"prototype":[107],"was":[108],"fabricated":[109],"0.35":[112],"\u03bcm":[113],"CMOS":[114],"process.":[115],"Robustly":[116],"working":[117],"variable":[120],"voltage":[122],"from":[123,134],"3":[124],"6":[126],"V,":[127,138],"it":[128,167],"regulates":[129],"programmable":[131],"output":[133],"0.4":[135],"1.6":[137],"maximum":[141,156],"of":[144,151,159,177],"85.5%":[145],"over":[146,173],"full":[148],"range":[150,176],"800":[152],"mW":[153],"1.07":[160],"W/mm2.":[161],"Thanks":[162],"ICDT":[165],"control,":[166],"achieves":[168],"0.5":[170],"ns":[171],"full-load":[175],"500":[178],"mA.":[179]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}