{"id":"https://openalex.org/W2971827664","doi":"https://doi.org/10.1109/tie.2019.2938476","title":"A Novel Fast Resonance Frequency Tracking Method Based on the Admittance Circle for Ultrasonic Transducers","display_name":"A Novel Fast Resonance Frequency Tracking Method Based on the Admittance Circle for Ultrasonic Transducers","publication_year":2019,"publication_date":"2019-09-05","ids":{"openalex":"https://openalex.org/W2971827664","doi":"https://doi.org/10.1109/tie.2019.2938476","mag":"2971827664"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2019.2938476","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2938476","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100700955","display_name":"Jindong Wang","orcid":"https://orcid.org/0000-0001-7789-3204"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jin-dong Wang","raw_affiliation_strings":["State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0001-7789-3204","affiliations":[{"raw_affiliation_string":"State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035473587","display_name":"Jiajia Jiang","orcid":"https://orcid.org/0000-0002-0611-6501"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia-jia Jiang","raw_affiliation_strings":["State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-0611-6501","affiliations":[{"raw_affiliation_string":"State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081309310","display_name":"Fajie Duan","orcid":"https://orcid.org/0000-0002-2151-0785"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fa-jie Duan","raw_affiliation_strings":["State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-2151-0785","affiliations":[{"raw_affiliation_string":"State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101870596","display_name":"Fumin Zhang","orcid":"https://orcid.org/0000-0002-4516-5912"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fu-min Zhang","raw_affiliation_strings":["State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-4516-5912","affiliations":[{"raw_affiliation_string":"State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062908102","display_name":"Wei Liu","orcid":"https://orcid.org/0000-0003-2968-2888"},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Wei liu","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, U.K"],"raw_orcid":"https://orcid.org/0000-0003-2968-2888","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, U.K","institution_ids":["https://openalex.org/I91136226"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048340011","display_name":"Xinghua Qu","orcid":"https://orcid.org/0000-0001-8072-2019"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing-hua Qu","raw_affiliation_strings":["State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6861,"has_fulltext":false,"cited_by_count":57,"citation_normalized_percentile":{"value":0.84650377,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"67","issue":"8","first_page":"6864","last_page":"6873"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.8614109754562378},{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.7454107999801636},{"id":"https://openalex.org/keywords/transducer","display_name":"Transducer","score":0.6235673427581787},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5643988251686096},{"id":"https://openalex.org/keywords/mechanical-resonance","display_name":"Mechanical resonance","score":0.5367236137390137},{"id":"https://openalex.org/keywords/piezoelectricity","display_name":"Piezoelectricity","score":0.5301238894462585},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5271596312522888},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.5230268239974976},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.4978039264678955},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4647502303123474},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4597416818141937},{"id":"https://openalex.org/keywords/resonance","display_name":"Resonance (particle physics)","score":0.4574221670627594},{"id":"https://openalex.org/keywords/admittance-parameters","display_name":"Admittance parameters","score":0.4565252363681793},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39236706495285034},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32523712515830994},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.26981890201568604},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2062956690788269},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1957380473613739},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1360374093055725},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.11252370476722717}],"concepts":[{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.8614109754562378},{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.7454107999801636},{"id":"https://openalex.org/C56318395","wikidata":"https://www.wikidata.org/wiki/Q215928","display_name":"Transducer","level":2,"score":0.6235673427581787},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5643988251686096},{"id":"https://openalex.org/C196348190","wikidata":"https://www.wikidata.org/wiki/Q3744733","display_name":"Mechanical resonance","level":3,"score":0.5367236137390137},{"id":"https://openalex.org/C100082104","wikidata":"https://www.wikidata.org/wiki/Q183759","display_name":"Piezoelectricity","level":2,"score":0.5301238894462585},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5271596312522888},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.5230268239974976},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.4978039264678955},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4647502303123474},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4597416818141937},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.4574221670627594},{"id":"https://openalex.org/C133833761","wikidata":"https://www.wikidata.org/wiki/Q16001847","display_name":"Admittance parameters","level":3,"score":0.4565252363681793},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39236706495285034},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32523712515830994},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.26981890201568604},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2062956690788269},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1957380473613739},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1360374093055725},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.11252370476722717},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2019.2938476","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2938476","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:eprints.whiterose.ac.uk:151014","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400854","display_name":"White Rose Research Online (University of Leeds, The University of Sheffield, University of York)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2800616092","host_organization_name":"White Rose University Consortium","host_organization_lineage":["https://openalex.org/I2800616092"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2258247568","display_name":null,"funder_award_id":"51775377","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6895945203","display_name":null,"funder_award_id":"18YFZCGX00920","funder_id":"https://openalex.org/F4320335774","funder_display_name":"Key Technologies Research and Development Program"},{"id":"https://openalex.org/G8242947359","display_name":null,"funder_award_id":"61501319","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8606675874","display_name":null,"funder_award_id":"2018YFF0212702","funder_id":"https://openalex.org/F4320336026","funder_display_name":"National Key Research and Development Program of China Stem Cell and Translational Research"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335774","display_name":"Key Technologies Research and Development Program","ror":null},{"id":"https://openalex.org/F4320336026","display_name":"National Key Research and Development Program of China Stem Cell and Translational Research","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W435075100","https://openalex.org/W1651238782","https://openalex.org/W1966488154","https://openalex.org/W2026794591","https://openalex.org/W2029555919","https://openalex.org/W2039121198","https://openalex.org/W2041032277","https://openalex.org/W2050238854","https://openalex.org/W2075745980","https://openalex.org/W2092859225","https://openalex.org/W2094529919","https://openalex.org/W2096722476","https://openalex.org/W2100296417","https://openalex.org/W2117843083","https://openalex.org/W2134805348","https://openalex.org/W2139298570","https://openalex.org/W2173506180","https://openalex.org/W2257595636","https://openalex.org/W2296231858","https://openalex.org/W2471258782","https://openalex.org/W2558810891","https://openalex.org/W2593907788","https://openalex.org/W2747824414","https://openalex.org/W2773469136","https://openalex.org/W2780972582","https://openalex.org/W2807169075","https://openalex.org/W2807990436","https://openalex.org/W2981932169","https://openalex.org/W6656930887","https://openalex.org/W6657657762"],"related_works":["https://openalex.org/W2563111511","https://openalex.org/W2913402129","https://openalex.org/W2161728531","https://openalex.org/W2044195815","https://openalex.org/W2541620444","https://openalex.org/W2057151759","https://openalex.org/W2368309484","https://openalex.org/W2066729819","https://openalex.org/W2460740512","https://openalex.org/W2163540231"],"abstract_inverted_index":{"For":[0],"ultrasonic":[1,140],"systems,":[2],"the":[3,9,25,41,50,53,62,70,78,90,94,98,103,112,115,135,139,144],"resonance":[4,73,145],"frequency":[5,74,146],"tracking":[6,125],"(RFT)":[7],"is":[8,55,65,75,86,126],"most":[10],"critical":[11],"step.":[12],"The":[13,83],"rapid":[14],"development":[15],"in":[16,108,147],"advanced":[17],"material":[18],"processing":[19],"and":[20,61,67,93,130],"microelectronics":[21],"package":[22],"has":[23],"increased":[24],"demand":[26],"of":[27,43,102,114],"high-speed":[28],"RFT.":[29],"Therefore,":[30],"this":[31],"article":[32],"proposes":[33],"a":[34,148],"fast":[35],"RFT":[36],"(FRFT)":[37],"method":[38,85,121],"according":[39],"to":[40,110],"characteristics":[42],"piezoelectric":[44],"transducers'":[45],"(PT)":[46],"admittance":[47,64,79],"circle.":[48],"In":[49],"proposed":[51,84,116,136],"method,":[52,138],"PT":[54],"driven":[56],"at":[57],"two":[58],"different":[59],"frequencies,":[60],"PT's":[63,71],"collected":[66],"calibrated.":[68],"Then,":[69],"mechanical":[72],"derived":[76],"using":[77,134],"information":[80],"after":[81],"calibration.":[82],"not":[87],"affected":[88],"by":[89],"parallel":[91],"capacitor":[92],"matching":[95],"circuit.":[96],"Additionally,":[97],"optimal":[99],"initial":[100],"values":[101],"involved":[104],"parameters":[105],"are":[106],"determined":[107],"order":[109],"improve":[111],"accuracy":[113],"method.":[117],"Furthermore,":[118],"an":[119],"improved":[120],"based":[122],"on":[123],"multiple":[124],"also":[127],"provided.":[128],"Simulations":[129],"experiments":[131],"demonstrate":[132],"that":[133],"FRFT":[137],"system":[141],"can":[142],"track":[143],"short":[149],"time":[150],"with":[151],"high":[152],"accuracy.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":15},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":16},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}