{"id":"https://openalex.org/W2935987343","doi":"https://doi.org/10.1109/tie.2019.2905830","title":"Learning Representations With Local and Global Geometries Preserved for Machine Fault Diagnosis","display_name":"Learning Representations With Local and Global Geometries Preserved for Machine Fault Diagnosis","publication_year":2019,"publication_date":"2019-03-22","ids":{"openalex":"https://openalex.org/W2935987343","doi":"https://doi.org/10.1109/tie.2019.2905830","mag":"2935987343"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2019.2905830","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2905830","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100387821","display_name":"Yue Li","orcid":"https://orcid.org/0000-0002-8519-2114"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yue Li","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-8519-2114","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066761950","display_name":"Chamara Kasun Liyanaarachchi Lekamalage","orcid":"https://orcid.org/0000-0002-4078-3877"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Chamara Kasun Liyanaarachchi Lekamalage","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-4078-3877","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101486718","display_name":"Tianchi Liu","orcid":"https://orcid.org/0000-0001-6733-3924"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Tianchi Liu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0001-6733-3924","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031061311","display_name":"Pin-An Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129657","display_name":"Delta Electronics (Taiwan)","ror":"https://ror.org/03acb7p04","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210129657"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Pin-An Chen","raw_affiliation_strings":["Delta Electronics, Taipei, R.O.C"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delta Electronics, Taipei, R.O.C","institution_ids":["https://openalex.org/I4210129657"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061746912","display_name":"Guang-Bin Huang","orcid":"https://orcid.org/0000-0002-2480-4965"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Guang-Bin Huang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-2480-4965","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.1846,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.96602629,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"67","issue":"3","first_page":"2360","last_page":"2370"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11652","display_name":"Imbalanced Data Classification Techniques","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.7866450548171997},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6940929293632507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.672006368637085},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.5997719764709473},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5889613628387451},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.584140956401825},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5584852695465088},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.5345543622970581},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5344886779785156},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3513873815536499},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.32285988330841064}],"concepts":[{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.7866450548171997},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6940929293632507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.672006368637085},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.5997719764709473},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5889613628387451},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.584140956401825},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5584852695465088},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5345543622970581},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5344886779785156},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3513873815536499},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32285988330841064},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2019.2905830","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2905830","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/155210","is_oa":false,"landing_page_url":"https://hdl.handle.net/10356/155210","pdf_url":null,"source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":57,"referenced_works":["https://openalex.org/W1507417347","https://openalex.org/W1622676895","https://openalex.org/W1930624869","https://openalex.org/W1967352108","https://openalex.org/W2001141328","https://openalex.org/W2002106843","https://openalex.org/W2002616799","https://openalex.org/W2003205626","https://openalex.org/W2019505419","https://openalex.org/W2025768430","https://openalex.org/W2026131661","https://openalex.org/W2040070030","https://openalex.org/W2051669046","https://openalex.org/W2053186076","https://openalex.org/W2058514560","https://openalex.org/W2064535781","https://openalex.org/W2072128103","https://openalex.org/W2098887028","https://openalex.org/W2101491865","https://openalex.org/W2104290444","https://openalex.org/W2110798204","https://openalex.org/W2112796928","https://openalex.org/W2119821739","https://openalex.org/W2121647436","https://openalex.org/W2140336071","https://openalex.org/W2140833774","https://openalex.org/W2156718197","https://openalex.org/W2166856083","https://openalex.org/W2170505850","https://openalex.org/W2184192902","https://openalex.org/W2187089797","https://openalex.org/W2218318129","https://openalex.org/W2317595875","https://openalex.org/W2412781046","https://openalex.org/W2461729787","https://openalex.org/W2480364715","https://openalex.org/W2618530766","https://openalex.org/W2621038831","https://openalex.org/W2731659850","https://openalex.org/W2746106790","https://openalex.org/W2766736793","https://openalex.org/W2789535000","https://openalex.org/W2979473749","https://openalex.org/W2983923309","https://openalex.org/W2997701990","https://openalex.org/W4231109964","https://openalex.org/W4236796448","https://openalex.org/W4239510810","https://openalex.org/W6636489938","https://openalex.org/W6640462745","https://openalex.org/W6675747103","https://openalex.org/W6676481782","https://openalex.org/W6680887930","https://openalex.org/W6682755970","https://openalex.org/W6684218820","https://openalex.org/W6688386640","https://openalex.org/W6715967793"],"related_works":["https://openalex.org/W2965546495","https://openalex.org/W2153315159","https://openalex.org/W3103844505","https://openalex.org/W4205463238","https://openalex.org/W259157601","https://openalex.org/W2761785940","https://openalex.org/W2378211422","https://openalex.org/W2110523656","https://openalex.org/W1482209366","https://openalex.org/W2521627374"],"abstract_inverted_index":{"Recently,":[0],"deep":[1],"learning-based":[2],"representation":[3],"learning":[4],"methods":[5,17],"have":[6],"attracted":[7],"increasing":[8],"attention":[9],"in":[10],"machine":[11,151],"fault":[12,131],"diagnosis.":[13],"However,":[14],"few":[15],"existing":[16],"consider":[18],"the":[19,37,51,66,72,83,92,100,110,126],"geometry":[20,38,104],"of":[21,39,56,105],"data":[22,107],"samples.":[23],"In":[24],"this":[25],"paper,":[26],"we":[27,44,75],"propose":[28],"a":[29,77],"novel":[30],"method":[31,93,112,128],"to":[32,49,64,70,146],"obtain":[33,114],"representations":[34,98,116],"that":[35],"preserve":[36,50],"input":[40,57,67,106],"data.":[41,68],"More":[42],"specifically,":[43],"formulate":[45,76],"two":[46,123],"cost":[47,62,79,90],"functions":[48],"local":[52,101],"and":[53,60,102,134,137,157],"global":[54,103],"geometries":[55],"data,":[58],"respectively":[59],"another":[61],"function":[63,80],"reconstruct":[65],"Furthermore,":[69,109],"simplify":[71],"training":[73,136],"process,":[74],"discrimination":[78],"based":[81],"on":[82],"label":[84],"information.":[85],"By":[86],"jointly":[87],"optimizing":[88],"all":[89],"functions,":[91],"can":[94,113],"efficiently":[95],"learn":[96],"discriminative":[97],"with":[99],"preserved.":[108],"proposed":[111,127],"hierarchical":[115],"without":[117],"any":[118],"additional":[119],"tuning":[120],"step.":[121],"On":[122],"benchmark":[124],"datasets,":[125],"demonstrates":[129],"better":[130],"classification":[132],"performance":[133],"shorter":[135],"test":[138],"time.":[139],"Therefore,":[140],"it":[141],"is":[142],"an":[143],"efficient":[144],"tool":[145],"provide":[147],"accurate":[148],"information":[149],"about":[150],"conditions":[152],"for":[153],"making":[154],"maintenance":[155],"decision":[156],"saving":[158],"costs.":[159]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}