{"id":"https://openalex.org/W2918459517","doi":"https://doi.org/10.1109/tie.2019.2901655","title":"Imbalance Current Analysis and Its Suppression Methodology for Parallel SiC MOSFETs with Aid of a Differential Mode Choke","display_name":"Imbalance Current Analysis and Its Suppression Methodology for Parallel SiC MOSFETs with Aid of a Differential Mode Choke","publication_year":2019,"publication_date":"2019-03-04","ids":{"openalex":"https://openalex.org/W2918459517","doi":"https://doi.org/10.1109/tie.2019.2901655","mag":"2918459517"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2019.2901655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2901655","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://orbit.dtu.dk/en/publications/73b1ea42-1b86-4823-8ed7-53fefbb18e79","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002421623","display_name":"Zheng Zeng","orcid":"https://orcid.org/0000-0002-1501-4400"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Zheng Zeng","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-1501-4400","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Xin Zhang","orcid":"https://orcid.org/0000-0002-4968-2722"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Xin Zhang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-4968-2722","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100442950","display_name":"Zhe Zhang","orcid":"https://orcid.org/0000-0001-8407-3167"},"institutions":[{"id":"https://openalex.org/I96673099","display_name":"Technical University of Denmark","ror":"https://ror.org/04qtj9h94","country_code":"DK","type":"education","lineage":["https://openalex.org/I96673099"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Zhe Zhang","raw_affiliation_strings":["Department of Electrical Engineering, Technical University of Denmark, Kgs. Lyngby, Denmark"],"raw_orcid":"https://orcid.org/0000-0001-8407-3167","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Technical University of Denmark, Kgs. Lyngby, Denmark","institution_ids":["https://openalex.org/I96673099"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5002421623"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":8.4747,"has_fulltext":false,"cited_by_count":147,"citation_normalized_percentile":{"value":0.9821866,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"67","issue":"2","first_page":"1508","last_page":"1519"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/choke","display_name":"Choke","score":0.9610415697097778},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.576676070690155},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.5148400664329529},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5116803646087646},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.48842373490333557},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4864030182361603},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46975019574165344},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4497320055961609},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.42962753772735596},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2898675203323364},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2554265558719635},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2410740852355957},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14815306663513184},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.08653578162193298}],"concepts":[{"id":"https://openalex.org/C29049376","wikidata":"https://www.wikidata.org/wiki/Q864746","display_name":"Choke","level":2,"score":0.9610415697097778},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.576676070690155},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.5148400664329529},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5116803646087646},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.48842373490333557},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4864030182361603},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46975019574165344},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4497320055961609},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.42962753772735596},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2898675203323364},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2554265558719635},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2410740852355957},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14815306663513184},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.08653578162193298},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tie.2019.2901655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2901655","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/155209","is_oa":false,"landing_page_url":"https://hdl.handle.net/10356/155209","pdf_url":null,"source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},{"id":"pmh:oai:pure.atira.dk:publications/73b1ea42-1b86-4823-8ed7-53fefbb18e79","is_oa":true,"landing_page_url":"https://orbit.dtu.dk/en/publications/73b1ea42-1b86-4823-8ed7-53fefbb18e79","pdf_url":null,"source":{"id":"https://openalex.org/S4306400705","display_name":"Technical University of Denmark, DTU Orbit (Technical University of Denmark, DTU)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I96673099","host_organization_name":"Technical University of Denmark","host_organization_lineage":["https://openalex.org/I96673099"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Zeng , Z , Zhang , X & Zhang , Z 2020 , ' Imbalance Current Analysis and Its Suppression Methodology for Parallel SiC MOSFETs With Aid of a Differential Mode Choke ' , IEEE Transactions on Industrial Electronics , vol. 67 , no. 2 , pp. 1508-1519 . https://doi.org/10.1109/TIE.2019.2901655","raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:pure.atira.dk:publications/73b1ea42-1b86-4823-8ed7-53fefbb18e79","is_oa":true,"landing_page_url":"https://orbit.dtu.dk/en/publications/73b1ea42-1b86-4823-8ed7-53fefbb18e79","pdf_url":null,"source":{"id":"https://openalex.org/S4306400705","display_name":"Technical University of Denmark, DTU Orbit (Technical University of Denmark, DTU)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I96673099","host_organization_name":"Technical University of Denmark","host_organization_lineage":["https://openalex.org/I96673099"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Zeng , Z , Zhang , X & Zhang , Z 2020 , ' Imbalance Current Analysis and Its Suppression Methodology for Parallel SiC MOSFETs With Aid of a Differential Mode Choke ' , IEEE Transactions on Industrial Electronics , vol. 67 , no. 2 , pp. 1508-1519 . https://doi.org/10.1109/TIE.2019.2901655","raw_type":"article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.75,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G8662590338","display_name":null,"funder_award_id":"51607016","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W267840210","https://openalex.org/W1535617060","https://openalex.org/W1966208559","https://openalex.org/W2014494050","https://openalex.org/W2109738051","https://openalex.org/W2138812810","https://openalex.org/W2147283595","https://openalex.org/W2157725583","https://openalex.org/W2166315761","https://openalex.org/W2206202081","https://openalex.org/W2241932945","https://openalex.org/W2290511012","https://openalex.org/W2307833529","https://openalex.org/W2332887221","https://openalex.org/W2336181604","https://openalex.org/W2339162265","https://openalex.org/W2467836566","https://openalex.org/W2519318517","https://openalex.org/W2556002624","https://openalex.org/W2566790682","https://openalex.org/W2573837945","https://openalex.org/W2577976329","https://openalex.org/W2591925045","https://openalex.org/W2607845296","https://openalex.org/W2611885665","https://openalex.org/W2624731621","https://openalex.org/W2725694903","https://openalex.org/W2747182495","https://openalex.org/W2753989068","https://openalex.org/W2767757025","https://openalex.org/W2768359321","https://openalex.org/W2768443967","https://openalex.org/W2789135245","https://openalex.org/W2889089416","https://openalex.org/W2902427678","https://openalex.org/W2972215046","https://openalex.org/W6687787693","https://openalex.org/W6698312611","https://openalex.org/W6748633330","https://openalex.org/W6756505574"],"related_works":["https://openalex.org/W2354295004","https://openalex.org/W573863345","https://openalex.org/W1973546292","https://openalex.org/W2323489882","https://openalex.org/W2612941909","https://openalex.org/W2349594491","https://openalex.org/W2322572077","https://openalex.org/W2361748912","https://openalex.org/W2143584606","https://openalex.org/W628482809"],"abstract_inverted_index":{"Parallel":[0],"connection":[1],"of":[2,29,40,58,66,93,112,117,135,154,160,198],"silicon":[3],"carbide":[4],"(SiC)":[5],"MOSFETs":[6],"is":[7,75,167,173,187],"a":[8,67,188],"cost-effective":[9,189],"solution":[10],"for":[11],"high-capacity":[12],"power":[13],"converters.":[14],"However,":[15],"transient":[16],"imbalance":[17,60,80],"current,":[18],"during":[19],"turn-on":[20],"and":[21,27,45,90,108,123,129,142,157,177,194],"-off":[22],"processes,":[23],"challenges":[24],"the":[25,37,55,59,64,79,94,104,113,118,133,152,158,161,170],"safety":[26],"stability":[28],"parallel":[30,83,110,199],"SiC":[31,84,200],"MOSFETs.":[32,85,201],"In":[33],"this":[34],"paper,":[35],"considering":[36],"impact":[38],"factors":[39],"device":[41],"parameters,":[42],"circuit":[43],"parasitics,":[44],"junction":[46,143],"temperatures,":[47,144],"in-depth":[48],"mathematical":[49],"models":[50,156],"are":[51,98,120,147],"created":[52],"to":[53,77,102,125,150,175,191],"reveal":[54],"electrothermal":[56],"mechanisms":[57],"current.":[61],"Moreover,":[62],"with":[63],"incorporation":[65],"differential":[68],"mode":[69],"choke":[70],"(DMC),":[71],"an":[72],"effective":[73],"approach":[74],"proposed":[76,162],"suppress":[78,126],"current":[81],"among":[82],"Physics":[86],"concepts,":[87],"operation":[88],"principles,":[89],"design":[91,176],"guidelines":[92],"DMC-based":[95,163],"suppression":[96,164],"method":[97],"fully":[99],"presented.":[100],"Besides,":[101],"reduce":[103],"equivalent":[105,109],"leakage":[106],"inductance":[107],"capacitance":[111],"DMC,":[114],"winding":[115,136],"patterns":[116],"DMC":[119,172],"comparatively":[121],"studied":[122],"optimized":[124],"turn-off":[127],"over-voltage":[128],"switching":[130],"ringing.":[131],"Concerning":[132],"influence":[134],"patterns,":[137],"load":[138],"currents,":[139],"gate":[140],"resistances,":[141],"experimental":[145],"results":[146],"comprehensively":[148],"demonstrated":[149],"confirm":[151],"validity":[153],"theoretical":[155],"function":[159],"method.":[165],"It":[166],"turned":[168],"out":[169],"low-cost":[171],"easy":[174],"utilize":[178],"without":[179],"complex":[180],"feedback":[181],"circuits":[182],"or":[183],"control":[184],"schemes,":[185],"which":[186],"component":[190],"guarantee":[192],"consistent":[193],"synchronous":[195],"on\u00b1off":[196],"trajectories":[197]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":30},{"year":2024,"cited_by_count":24},{"year":2023,"cited_by_count":21},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":21},{"year":2020,"cited_by_count":22},{"year":2019,"cited_by_count":19}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}