{"id":"https://openalex.org/W2911600220","doi":"https://doi.org/10.1109/tie.2019.2896109","title":"A Novel Statistical Time-Frequency Analysis for Rotating Machine Condition Monitoring","display_name":"A Novel Statistical Time-Frequency Analysis for Rotating Machine Condition Monitoring","publication_year":2019,"publication_date":"2019-02-05","ids":{"openalex":"https://openalex.org/W2911600220","doi":"https://doi.org/10.1109/tie.2019.2896109","mag":"2911600220"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2019.2896109","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2896109","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015912576","display_name":"Teng Wang","orcid":"https://orcid.org/0000-0002-4836-1740"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Teng Wang","raw_affiliation_strings":["Key Laboratory of High-Efficiency and Clean Mechanical Manufacture of MOE, National Demonstration Center for Experimental Mechanical Engineering, School of Mechanical Engineering, Shandong University, Jinan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Efficiency and Clean Mechanical Manufacture of MOE, National Demonstration Center for Experimental Mechanical Engineering, School of Mechanical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040895765","display_name":"Guoliang Lu","orcid":"https://orcid.org/0000-0003-4843-2841"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoliang Lu","raw_affiliation_strings":["Key Laboratory of High-Efficiency and Clean Mechanical Manufacture of MOE, National Demonstration Center for Experimental Mechanical Engineering, School of Mechanical Engineering, Shandong University, Jinan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Efficiency and Clean Mechanical Manufacture of MOE, National Demonstration Center for Experimental Mechanical Engineering, School of Mechanical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008297765","display_name":"Peng Yan","orcid":"https://orcid.org/0000-0002-8854-0217"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Yan","raw_affiliation_strings":["Key Laboratory of High-Efficiency and Clean Mechanical Manufacture of MOE, National Demonstration Center for Experimental Mechanical Engineering, School of Mechanical Engineering, Shandong University, Jinan, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Efficiency and Clean Mechanical Manufacture of MOE, National Demonstration Center for Experimental Mechanical Engineering, School of Mechanical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5015912576"],"corresponding_institution_ids":["https://openalex.org/I154099455"],"apc_list":null,"apc_paid":null,"fwci":8.4036,"has_fulltext":false,"cited_by_count":89,"citation_normalized_percentile":{"value":0.9805181,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"67","issue":"1","first_page":"531","last_page":"541"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5370728969573975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5346341133117676},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.5334679484367371},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.50911945104599},{"id":"https://openalex.org/keywords/frequency-analysis","display_name":"Frequency analysis","score":0.439267635345459},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4143243432044983},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3288143575191498},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.248392254114151},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21870455145835876},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1737808883190155}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5370728969573975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5346341133117676},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.5334679484367371},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.50911945104599},{"id":"https://openalex.org/C97118885","wikidata":"https://www.wikidata.org/wiki/Q565636","display_name":"Frequency analysis","level":2,"score":0.439267635345459},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4143243432044983},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3288143575191498},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.248392254114151},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21870455145835876},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1737808883190155},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2019.2896109","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2896109","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.800000011920929}],"awards":[{"id":"https://openalex.org/G2309226086","display_name":null,"funder_award_id":"51775319","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2596837249","display_name":null,"funder_award_id":"61327003","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4265447885","display_name":null,"funder_award_id":"61403232","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1074407407","https://openalex.org/W1500921805","https://openalex.org/W1597576211","https://openalex.org/W1672197616","https://openalex.org/W1967559043","https://openalex.org/W1984042753","https://openalex.org/W1985437849","https://openalex.org/W2005523062","https://openalex.org/W2006169073","https://openalex.org/W2013913072","https://openalex.org/W2021842066","https://openalex.org/W2027176154","https://openalex.org/W2028465481","https://openalex.org/W2039917709","https://openalex.org/W2042641006","https://openalex.org/W2051196068","https://openalex.org/W2053741029","https://openalex.org/W2059295424","https://openalex.org/W2060536267","https://openalex.org/W2068336800","https://openalex.org/W2086514731","https://openalex.org/W2089554624","https://openalex.org/W2091613287","https://openalex.org/W2095820133","https://openalex.org/W2097572183","https://openalex.org/W2098039475","https://openalex.org/W2102832680","https://openalex.org/W2109147247","https://openalex.org/W2113327167","https://openalex.org/W2114801315","https://openalex.org/W2118623933","https://openalex.org/W2121642616","https://openalex.org/W2145487065","https://openalex.org/W2158958729","https://openalex.org/W2163605054","https://openalex.org/W2179051909","https://openalex.org/W2472378253","https://openalex.org/W2489173095","https://openalex.org/W2511643845","https://openalex.org/W2568819930","https://openalex.org/W2624924254","https://openalex.org/W2763269460","https://openalex.org/W2891865803","https://openalex.org/W6677460657"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W4246352526","https://openalex.org/W2121910908","https://openalex.org/W915438175","https://openalex.org/W2182091536"],"abstract_inverted_index":{"The":[0,88,112],"key":[1],"function":[2],"of":[3,127],"rotating":[4],"machine":[5,15,37,67],"condition":[6,38],"monitoring":[7],"(CM)":[8],"is":[9,33,47,59,71],"to":[10,63,73,80,94,99],"detect":[11],"structural":[12],"changes":[13],"during":[14],"operations.":[16],"This":[17],"paper":[18],"presents":[19],"a":[20],"novel":[21],"statistical":[22],"time-frequency":[23],"analysis":[24,70],"method":[25,90,130],"for":[26,84],"this":[27],"purpose.":[28],"In":[29],"particular,":[30],"frequency":[31],"spectrum":[32],"extracted":[34],"from":[35,50],"the":[36,51,55,65,81,122,128],"signals":[39],"based":[40],"on":[41],"periodogram":[42],"estimation.":[43],"Undirected":[44],"weighted":[45],"graph":[46,58,83],"then":[48],"constructed":[49],"resulting":[52],"periodograms,":[53],"where":[54,124],"so-called":[56],"median":[57,82],"introduced":[60],"and":[61,109],"adopted":[62],"describe":[64],"normal":[66],"status.":[68],"Statistical":[69],"performed":[72],"investigate":[74],"newly":[75],"observed":[76],"data":[77],"with":[78,116],"respect":[79],"change":[85],"decision":[86],"making.":[87],"proposed":[89,129],"has":[91],"been":[92],"applied":[93],"three":[95],"different":[96],"engineering":[97,138],"applications":[98],"evaluate":[100],"its":[101,134],"effectiveness:":[102],"load":[103],"CM;":[104],"early":[105],"bearing":[106],"failure":[107],"detection;":[108],"speed":[110],"CM.":[111],"results":[113],"were":[114,131],"compared":[115],"some":[117],"benchmark":[118],"methods":[119],"reported":[120],"in":[121,137],"literature,":[123],"significant":[125],"improvements":[126],"demonstrated,":[132],"indicating":[133],"good":[135],"potentials":[136],"applications.":[139]},"counts_by_year":[{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":18},{"year":2022,"cited_by_count":16},{"year":2021,"cited_by_count":17},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":4}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}