{"id":"https://openalex.org/W2910205270","doi":"https://doi.org/10.1109/tie.2019.2891455","title":"An Ultrasonic Transmission/Reflection Tomography System for Industrial Multiphase Flow Imaging","display_name":"An Ultrasonic Transmission/Reflection Tomography System for Industrial Multiphase Flow Imaging","publication_year":2019,"publication_date":"2019-01-16","ids":{"openalex":"https://openalex.org/W2910205270","doi":"https://doi.org/10.1109/tie.2019.2891455","mag":"2910205270"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2019.2891455","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2891455","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068911557","display_name":"Chao Tan","orcid":"https://orcid.org/0000-0001-5146-4807"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chao Tan","raw_affiliation_strings":["Key Laboratory of Efficient Utilization of Low and Medium Grade Energy, Ministry of Education, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Efficient Utilization of Low and Medium Grade Energy, Ministry of Education, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100648913","display_name":"Li Xiao","orcid":"https://orcid.org/0000-0003-4118-7994"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Li","raw_affiliation_strings":["Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100458761","display_name":"Hao Liu","orcid":"https://orcid.org/0000-0001-9013-4026"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Liu","raw_affiliation_strings":["Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025279788","display_name":"Feng Dong","orcid":"https://orcid.org/0000-0002-8478-8928"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Dong","raw_affiliation_strings":["Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5068911557"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":7.3589,"has_fulltext":false,"cited_by_count":100,"citation_normalized_percentile":{"value":0.97745375,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"66","issue":"12","first_page":"9539","last_page":"9548"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.6001153588294983},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.5359407663345337},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.5353584289550781},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.535333514213562},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5203049182891846},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.508557915687561},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4827798902988434},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4780498147010803},{"id":"https://openalex.org/keywords/multiphase-flow","display_name":"Multiphase flow","score":0.4749617278575897},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.43678343296051025},{"id":"https://openalex.org/keywords/ultrasonic-testing","display_name":"Ultrasonic testing","score":0.4243369698524475},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.4194726049900055},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3298652768135071},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2654860019683838},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2020449936389923},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1375742256641388},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10827624797821045}],"concepts":[{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.6001153588294983},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.5359407663345337},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.5353584289550781},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.535333514213562},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5203049182891846},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.508557915687561},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4827798902988434},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4780498147010803},{"id":"https://openalex.org/C2779379648","wikidata":"https://www.wikidata.org/wiki/Q1559665","display_name":"Multiphase flow","level":2,"score":0.4749617278575897},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.43678343296051025},{"id":"https://openalex.org/C139730468","wikidata":"https://www.wikidata.org/wiki/Q1779355","display_name":"Ultrasonic testing","level":3,"score":0.4243369698524475},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.4194726049900055},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3298652768135071},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2654860019683838},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2020449936389923},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1375742256641388},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10827624797821045},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2019.2891455","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2019.2891455","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G1715636809","display_name":null,"funder_award_id":"61473206","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8268187737","display_name":null,"funder_award_id":"17JCZDJC38400","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323993","display_name":"Natural Science Foundation of Tianjin City","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W5941359","https://openalex.org/W1595025288","https://openalex.org/W1965417376","https://openalex.org/W1984189038","https://openalex.org/W2002303224","https://openalex.org/W2003612747","https://openalex.org/W2004450262","https://openalex.org/W2007090477","https://openalex.org/W2014617880","https://openalex.org/W2019333404","https://openalex.org/W2027931553","https://openalex.org/W2033150186","https://openalex.org/W2062255995","https://openalex.org/W2072331156","https://openalex.org/W2109435165","https://openalex.org/W2141402885","https://openalex.org/W2150061455","https://openalex.org/W2160640157","https://openalex.org/W2161376452","https://openalex.org/W2262070310","https://openalex.org/W2521032168","https://openalex.org/W2564226817","https://openalex.org/W2575872241","https://openalex.org/W2621294055","https://openalex.org/W2732126315","https://openalex.org/W2734458234","https://openalex.org/W2738033462","https://openalex.org/W6600257374","https://openalex.org/W6653951267","https://openalex.org/W6692952741"],"related_works":["https://openalex.org/W2111241003","https://openalex.org/W4200391368","https://openalex.org/W2210979487","https://openalex.org/W2074043759","https://openalex.org/W3042736233","https://openalex.org/W2082487009","https://openalex.org/W2373535795","https://openalex.org/W2350916690","https://openalex.org/W2378223409","https://openalex.org/W1968187366"],"abstract_inverted_index":{"Monitoring":[0],"multiphase":[1,56],"flow":[2,31],"process":[3,22],"and":[4,46,81,102,118,134,167,172,181,187,200],"measuring":[5],"its":[6],"parameters":[7],"have":[8],"been":[9],"a":[10,74,91,129],"research":[11],"topic":[12],"that":[13,77,96,156],"received":[14],"broad":[15],"attentions":[16],"for":[17,144],"the":[18,26,29,43,55,59,79,100,138,157,161,164,170,175,179,184,191],"past":[19],"decades.":[20],"Ultrasonic":[21],"tomography":[23],"(UPT)":[24],"obtains":[25],"distribution":[27],"of":[28,54,62,83,131,163,174,190,203],"two-phase":[30],"based":[32,136],"on":[33,68,137],"ultrasound":[34,84,108],"propagation":[35],"in":[36],"different":[37,165,204],"fluids,":[38],"making":[39],"it":[40],"valuable":[41],"to":[42,148],"industrial":[44,150],"monitoring":[45],"measurement.":[47],"UPT":[48,76,94],"can":[49,159],"nonintrusively":[50],"explore":[51],"transient":[52],"hydrodynamics":[53],"flow,":[57],"but":[58],"reconstruction":[60],"quality":[61],"single":[63],"modality":[64],"is":[65,85,104,112,115,135],"always":[66],"dependent":[67],"phase":[69],"distribution.":[70],"In":[71],"this":[72,89],"paper,":[73],"dual-mode":[75,93],"fuses":[78],"attenuation":[80],"time-of-flight":[82],"presented.":[86],"To":[87],"implement":[88],"scheme,":[90],"digital":[92],"system":[95,111,127,158],"works":[97],"under":[98],"both":[99],"transmission-mode":[101],"reflection-mode":[103],"designed.":[105],"A":[106],"16-channel":[107],"data":[109,146],"acquisition":[110],"proposed,":[113],"which":[114,197],"flexibly":[116],"programmable":[117],"reconfigurable":[119],"through":[120,177],"an":[121],"field-programmable":[122],"gate":[123],"array":[124],"(FPGA).":[125],"The":[126],"includes":[128],"series":[130],"functional":[132],"modules,":[133],"compact":[139],"peripheral":[140],"component":[141],"interconnect":[142],"bus":[143],"real-time":[145],"transmission":[147,180],"meet":[149],"field":[151],"requirements.":[152],"Static":[153],"experiments":[154],"show":[155,198],"distinguish":[160],"interface":[162],"inclusions":[166,176],"preferably":[168],"reconstruct":[169],"position":[171],"area":[173],"fusing":[178],"reflection":[182],"reconstruction,":[183],"relative":[185],"error":[186],"correlation":[188],"coefficient":[189],"reconstructed":[192],"images":[193],"are":[194],"presented,":[195],"respectively,":[196],"preferable":[199],"stable":[201],"distinguishability":[202],"inclusions.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":18},{"year":2021,"cited_by_count":22},{"year":2020,"cited_by_count":16},{"year":2019,"cited_by_count":5}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}