{"id":"https://openalex.org/W2905248130","doi":"https://doi.org/10.1109/tie.2018.2885740","title":"Online Condition Monitoring for Diagnosis and Prognosis of Insulation Degradation of Inverter-Fed Machines","display_name":"Online Condition Monitoring for Diagnosis and Prognosis of Insulation Degradation of Inverter-Fed Machines","publication_year":2018,"publication_date":"2018-12-13","ids":{"openalex":"https://openalex.org/W2905248130","doi":"https://doi.org/10.1109/tie.2018.2885740","mag":"2905248130"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2018.2885740","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2018.2885740","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062538460","display_name":"Igor Tsyokhla","orcid":"https://orcid.org/0000-0002-7212-9781"},"institutions":[{"id":"https://openalex.org/I4210125634","display_name":"Sphere Medical (United Kingdom)","ror":"https://ror.org/02tkzjy36","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210125634"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Igor Tsyokhla","raw_affiliation_strings":["Sphere Fluidics Ltd., Cambridge, U.K"],"raw_orcid":"https://orcid.org/0000-0002-7212-9781","affiliations":[{"raw_affiliation_string":"Sphere Fluidics Ltd., Cambridge, U.K","institution_ids":["https://openalex.org/I4210125634"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057615108","display_name":"Antonio Griffo","orcid":"https://orcid.org/0000-0001-5642-2921"},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Antonio Griffo","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K"],"raw_orcid":"https://orcid.org/0000-0001-5642-2921","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K","institution_ids":["https://openalex.org/I91136226"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100731525","display_name":"Jiabin Wang","orcid":"https://orcid.org/0000-0003-4870-3744"},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Jiabin Wang","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K"],"raw_orcid":"https://orcid.org/0000-0003-4870-3744","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, The University of Sheffield, Sheffield, U.K","institution_ids":["https://openalex.org/I91136226"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.9672,"has_fulltext":false,"cited_by_count":100,"citation_normalized_percentile":{"value":0.94219913,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"66","issue":"10","first_page":"8126","last_page":"8135"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.8508895635604858},{"id":"https://openalex.org/keywords/stator","display_name":"Stator","score":0.7253825068473816},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7078782320022583},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.6946409940719604},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6735100746154785},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.6653948426246643},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5967666506767273},{"id":"https://openalex.org/keywords/dissipation-factor","display_name":"Dissipation factor","score":0.565147340297699},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.4739798903465271},{"id":"https://openalex.org/keywords/insulation-system","display_name":"Insulation system","score":0.4613615870475769},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.45881256461143494},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4481033682823181},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4354841709136963},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43013519048690796},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4197390079498291},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.36003583669662476},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08924752473831177},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07713383436203003}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.8508895635604858},{"id":"https://openalex.org/C2776529397","wikidata":"https://www.wikidata.org/wiki/Q190312","display_name":"Stator","level":2,"score":0.7253825068473816},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7078782320022583},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.6946409940719604},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6735100746154785},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.6653948426246643},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5967666506767273},{"id":"https://openalex.org/C97274863","wikidata":"https://www.wikidata.org/wiki/Q1040795","display_name":"Dissipation factor","level":3,"score":0.565147340297699},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.4739798903465271},{"id":"https://openalex.org/C2776152135","wikidata":"https://www.wikidata.org/wiki/Q467898","display_name":"Insulation system","level":2,"score":0.4613615870475769},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.45881256461143494},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4481033682823181},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4354841709136963},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43013519048690796},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4197390079498291},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.36003583669662476},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08924752473831177},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07713383436203003},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2018.2885740","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2018.2885740","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:eprints.whiterose.ac.uk:139492","is_oa":false,"landing_page_url":"https://eprints.whiterose.ac.uk/139492/1/ALL_18-TIE-1176.pdf","pdf_url":"https://eprints.whiterose.ac.uk/139492/1/ALL_18-TIE-1176.pdf","source":{"id":"https://openalex.org/S4306400854","display_name":"White Rose Research Online (University of Leeds, The University of Sheffield, University of York)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2800616092","host_organization_name":"White Rose University Consortium","host_organization_lineage":["https://openalex.org/I2800616092"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8600000143051147}],"awards":[{"id":"https://openalex.org/G1626095559","display_name":"Underpinning Power Electronics - Integrated Drives","funder_award_id":"EP/K034987/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G3006119282","display_name":null,"funder_award_id":"EP/S00081X/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G3617638149","display_name":"Condition monitoring and lifetime prognosis of electrical machines","funder_award_id":"EP/P010350/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G5327781182","display_name":null,"funder_award_id":"EP/P010350/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G7798944434","display_name":null,"funder_award_id":"EP/K034987/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G8916886069","display_name":"Insulation degradation and lifetime of inverter-fed machines with fast switching (high dv/dt) converters","funder_award_id":"EP/S00081X/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1520293206","https://openalex.org/W1557034988","https://openalex.org/W1689644469","https://openalex.org/W2007838911","https://openalex.org/W2008938646","https://openalex.org/W2088302359","https://openalex.org/W2095317108","https://openalex.org/W2101823115","https://openalex.org/W2121413289","https://openalex.org/W2121522191","https://openalex.org/W2146269586","https://openalex.org/W2148223322","https://openalex.org/W2288311228","https://openalex.org/W2304917528","https://openalex.org/W2327391180","https://openalex.org/W2482454242","https://openalex.org/W2840040729","https://openalex.org/W2999442896","https://openalex.org/W4237335638","https://openalex.org/W4253290211","https://openalex.org/W6637677622","https://openalex.org/W7018450042"],"related_works":["https://openalex.org/W2901525733","https://openalex.org/W2391252711","https://openalex.org/W2903695628","https://openalex.org/W3048224311","https://openalex.org/W2374542831","https://openalex.org/W2120433379","https://openalex.org/W2161712605","https://openalex.org/W2969849863","https://openalex.org/W2220627853","https://openalex.org/W2945406054"],"abstract_inverted_index":{"Real-time":[0],"winding":[1],"insulation":[2,35,47,83],"condition":[3],"monitoring":[4,54],"is":[5,30,55,70,88,103],"becoming":[6],"an":[7],"important":[8],"research":[9],"topic":[10],"in":[11,15,21],"response":[12],"to":[13,32,57,63,105],"increase":[14],"high":[16],"availability":[17],"and":[18,50,76,85,95],"reliability":[19],"demands":[20],"modern":[22],"drives.":[23],"In":[24],"this":[25],"paper,":[26],"a":[27,42,107],"novel":[28],"method":[29,108],"proposed":[31],"monitor":[33],"ground-wall":[34,48,82],"of":[36,45,112],"low-voltage":[37],"inverter-fed":[38],"machines":[39],"based":[40],"on":[41],"multifrequency":[43],"measurement":[44],"equivalent":[46],"capacitance":[49,75,84,93],"dissipation":[51,77],"factor.":[52],"The":[53,90],"applied":[56],"four":[58],"machine":[59,101],"stator":[60],"samples":[61],"subjected":[62],"accelerated":[64],"aging":[65],"until":[66],"failure.":[67],"Insulation":[68],"degradation":[69],"continuously":[71],"tracked":[72],"via":[73],"the":[74,99,110,113],"parameters.":[78],"A":[79],"link":[80],"between":[81,92],"final":[86,100,114],"lifetime":[87],"established.":[89],"relationship":[91],"progression":[94],"its":[96],"value":[97],"at":[98],"failure":[102,115],"used":[104],"develop":[106],"for":[109],"prognosis":[111],"time.":[116]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":23},{"year":2024,"cited_by_count":21},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":12},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":6}],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2025-10-10T00:00:00"}