{"id":"https://openalex.org/W2769663693","doi":"https://doi.org/10.1109/tie.2017.2777383","title":"Assessment of Data Suitability for Machine Prognosis Using Maximum Mean Discrepancy","display_name":"Assessment of Data Suitability for Machine Prognosis Using Maximum Mean Discrepancy","publication_year":2017,"publication_date":"2017-11-24","ids":{"openalex":"https://openalex.org/W2769663693","doi":"https://doi.org/10.1109/tie.2017.2777383","mag":"2769663693"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2777383","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2777383","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043519647","display_name":"Xiaodong Jia","orcid":"https://orcid.org/0000-0002-0456-3105"},"institutions":[{"id":"https://openalex.org/I1311060795","display_name":"U.S. National Science Foundation","ror":"https://ror.org/021nxhr62","country_code":"US","type":"government","lineage":["https://openalex.org/I1311060795"]},{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaodong Jia","raw_affiliation_strings":["National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I1311060795","https://openalex.org/I63135867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078956553","display_name":"Ming Zhao","orcid":"https://orcid.org/0000-0001-5989-5580"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Zhao","raw_affiliation_strings":["School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0001-5989-5580","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014947562","display_name":"Di Yuan","orcid":"https://orcid.org/0000-0003-2113-270X"},"institutions":[{"id":"https://openalex.org/I1311060795","display_name":"U.S. National Science Foundation","ror":"https://ror.org/021nxhr62","country_code":"US","type":"government","lineage":["https://openalex.org/I1311060795"]},{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuan Di","raw_affiliation_strings":["National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I1311060795","https://openalex.org/I63135867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067852287","display_name":"Qibo Yang","orcid":"https://orcid.org/0000-0003-2246-4677"},"institutions":[{"id":"https://openalex.org/I1311060795","display_name":"U.S. National Science Foundation","ror":"https://ror.org/021nxhr62","country_code":"US","type":"government","lineage":["https://openalex.org/I1311060795"]},{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qibo Yang","raw_affiliation_strings":["National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I1311060795","https://openalex.org/I63135867"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100686648","display_name":"Jay Lee","orcid":"https://orcid.org/0000-0002-4022-4274"},"institutions":[{"id":"https://openalex.org/I1311060795","display_name":"U.S. National Science Foundation","ror":"https://ror.org/021nxhr62","country_code":"US","type":"government","lineage":["https://openalex.org/I1311060795"]},{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jay Lee","raw_affiliation_strings":["National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Science Foundation Industry/University Cooperative Research Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I1311060795","https://openalex.org/I63135867"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.3894,"has_fulltext":false,"cited_by_count":132,"citation_normalized_percentile":{"value":0.98545455,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"65","issue":"7","first_page":"5872","last_page":"5881"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.9671558737754822},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6138117909431458},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5271952748298645},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5008273124694824},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4961739480495453},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.44448965787887573},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.4435999393463135},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4191790819168091},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4167196750640869},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.41127365827560425},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.41068288683891296},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3914368450641632},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37354525923728943},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3543224632740021},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09084555506706238}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.9671558737754822},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6138117909431458},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5271952748298645},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5008273124694824},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4961739480495453},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.44448965787887573},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.4435999393463135},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4191790819168091},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4167196750640869},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.41127365827560425},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.41068288683891296},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3914368450641632},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37354525923728943},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3543224632740021},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09084555506706238},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2017.2777383","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2777383","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320310256","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W1457965568","https://openalex.org/W1487641199","https://openalex.org/W1569822278","https://openalex.org/W1974561605","https://openalex.org/W1994387548","https://openalex.org/W1996125472","https://openalex.org/W2002106843","https://openalex.org/W2005523062","https://openalex.org/W2033800551","https://openalex.org/W2033918639","https://openalex.org/W2039375105","https://openalex.org/W2044049559","https://openalex.org/W2067640009","https://openalex.org/W2075949491","https://openalex.org/W2100668822","https://openalex.org/W2125865219","https://openalex.org/W2136578782","https://openalex.org/W2140142253","https://openalex.org/W2141482776","https://openalex.org/W2149956719","https://openalex.org/W2183704914","https://openalex.org/W2212660284","https://openalex.org/W2261750843","https://openalex.org/W2282861635","https://openalex.org/W2317595875","https://openalex.org/W2318680928","https://openalex.org/W2463319845","https://openalex.org/W2551879329","https://openalex.org/W2556013418","https://openalex.org/W2562221994","https://openalex.org/W2591645937","https://openalex.org/W2598246375","https://openalex.org/W2637187594","https://openalex.org/W2950863313","https://openalex.org/W2952050759","https://openalex.org/W2962860143","https://openalex.org/W3035630051","https://openalex.org/W4299785240","https://openalex.org/W6628669898","https://openalex.org/W6629354409","https://openalex.org/W6634239167","https://openalex.org/W6678814708","https://openalex.org/W6680896890","https://openalex.org/W6681045557","https://openalex.org/W6686218113","https://openalex.org/W6688325169","https://openalex.org/W6692836109","https://openalex.org/W6729788535","https://openalex.org/W6731175945","https://openalex.org/W6735542852","https://openalex.org/W6779330718"],"related_works":["https://openalex.org/W2908973203","https://openalex.org/W2801712269","https://openalex.org/W1872896676","https://openalex.org/W2156691445","https://openalex.org/W2045186954","https://openalex.org/W3000986292","https://openalex.org/W1502469213","https://openalex.org/W2568310397","https://openalex.org/W2123638926","https://openalex.org/W2991483587"],"abstract_inverted_index":{"As":[0],"more":[1,3],"and":[2,42,55,75,90,150],"data":[4,14,17,27,46,63,130,174],"become":[5,21],"available":[6],"for":[7,31,45,65,184],"machine":[8,112],"prognostic":[9],"analysis":[10],"in":[11,108,140,156],"the":[12,51,62,70,80,100,109,126,135,157,162,173,178],"big":[13],"environment,":[15],"effective":[16],"suitability":[18,47,64],"assessment":[19,48],"methods":[20],"highly":[22],"desired":[23],"to":[24,79,124,170],"help":[25],"locate":[26],"with":[28],"sufficient":[29],"quality":[30],"analysis.":[32],"Driven":[33],"by":[34],"this":[35,37,60],"purpose,":[36],"paper":[38],"proposes":[39],"a":[40,116,167],"novel":[41],"systematic":[43],"methodology":[44,95,137,164],"based":[49],"on":[50,104],"needs":[52],"of":[53,72,84,111,118,134],"prognostics":[54],"health":[56],"management":[57],"(PHM).":[58],"In":[59],"study,":[61],"PHM":[66,185],"is":[67,96,138,182],"assessed":[68],"from":[69],"aspects":[71],"detectability,":[73],"diagnosability,":[74],"trendability,":[76],"which":[77,114,144],"correspond":[78],"three":[81],"major":[82],"tasks":[83],"PHM:":[85],"fault":[86,88],"detection,":[87],"diagnosis,":[89],"degradation":[91],"assessment.":[92],"The":[93,132,154],"proposed":[94,136,163],"mainly":[97],"built":[98],"upon":[99],"recent":[101],"research":[102],"studies":[103,159],"maximum":[105],"mean":[106],"discrepancy":[107],"field":[110],"learning,":[113],"include":[115,145],"family":[117],"test":[119,125],"statistics":[120],"that":[121,161],"are":[122],"used":[123],"difference":[127],"between":[128],"two":[129],"distributions.":[131],"effectiveness":[133],"demonstrated":[139],"diverse":[141],"industrial":[142],"applications,":[143],"semiconductors,":[146],"boring":[147],"tool":[148,169],"degradation,":[149],"sensorless":[151],"drive":[152],"diagnosis.":[153],"results":[155],"case":[158],"indicate":[160],"can":[165],"be":[166],"promising":[168],"evaluate":[171],"whether":[172],"under":[175],"study":[176],"or":[177],"extracted":[179],"feature":[180],"set":[181],"suitable":[183],"tasks.":[186]},"counts_by_year":[{"year":2026,"cited_by_count":10},{"year":2025,"cited_by_count":15},{"year":2024,"cited_by_count":25},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":14},{"year":2021,"cited_by_count":22},{"year":2020,"cited_by_count":18},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}