{"id":"https://openalex.org/W2769525464","doi":"https://doi.org/10.1109/tie.2017.2777378","title":"Fault Detection Methods for Three-Level NPC Inverter Based on DC-Bus Electromagnetic Signatures","display_name":"Fault Detection Methods for Three-Level NPC Inverter Based on DC-Bus Electromagnetic Signatures","publication_year":2017,"publication_date":"2017-11-24","ids":{"openalex":"https://openalex.org/W2769525464","doi":"https://doi.org/10.1109/tie.2017.2777378","mag":"2769525464"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2777378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2777378","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022720042","display_name":"Ibtissem Abari","orcid":"https://orcid.org/0000-0002-3811-8720"},"institutions":[{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Ibtissem Abari","raw_affiliation_strings":["Sousse, Tunisia","Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia"],"raw_orcid":"https://orcid.org/0000-0002-3811-8720","affiliations":[{"raw_affiliation_string":"Sousse, Tunisia","institution_ids":[]},{"raw_affiliation_string":"Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010225481","display_name":"Ali Lahouar","orcid":"https://orcid.org/0000-0003-3794-7284"},"institutions":[{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Ali Lahouar","raw_affiliation_strings":["Sousse, Tunisia","Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia"],"raw_orcid":"https://orcid.org/0000-0003-3794-7284","affiliations":[{"raw_affiliation_string":"Sousse, Tunisia","institution_ids":[]},{"raw_affiliation_string":"Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068725785","display_name":"Mahmoud Hamouda","orcid":"https://orcid.org/0000-0003-2919-1819"},"institutions":[{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Mahmoud Hamouda","raw_affiliation_strings":["Sousse, Tunisia","Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia"],"raw_orcid":"https://orcid.org/0000-0003-2919-1819","affiliations":[{"raw_affiliation_string":"Sousse, Tunisia","institution_ids":[]},{"raw_affiliation_string":"Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005970426","display_name":"Jaleleddine Ben Hadj Slama","orcid":"https://orcid.org/0000-0003-1817-1521"},"institutions":[{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Jaleleddine Ben Hadj Slama","raw_affiliation_strings":["Sousse, Tunisia","Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia"],"raw_orcid":"https://orcid.org/0000-0003-1817-1521","affiliations":[{"raw_affiliation_string":"Sousse, Tunisia","institution_ids":[]},{"raw_affiliation_string":"Research Laboratory LATIS, National Engineering School of Sousse, University of Sousse, Technopole of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053052626","display_name":"Kamal Al\u2010Haddad","orcid":"https://orcid.org/0000-0003-0276-4277"},"institutions":[{"id":"https://openalex.org/I159129438","display_name":"Universit\u00e9 du Qu\u00e9bec \u00e0 Montr\u00e9al","ror":"https://ror.org/002rjbv21","country_code":"CA","type":"education","lineage":["https://openalex.org/I159129438","https://openalex.org/I49663120"]},{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Kamal Al-Haddad","raw_affiliation_strings":["Montreal, QC, Canada","Ecole de Technologie Superieure, University of Quebec, Montreal, QC, Canada"],"raw_orcid":"https://orcid.org/0000-0003-0276-4277","affiliations":[{"raw_affiliation_string":"Montreal, QC, Canada","institution_ids":[]},{"raw_affiliation_string":"Ecole de Technologie Superieure, University of Quebec, Montreal, QC, Canada","institution_ids":["https://openalex.org/I9736820","https://openalex.org/I159129438"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.7873,"has_fulltext":false,"cited_by_count":110,"citation_normalized_percentile":{"value":0.95664477,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"65","issue":"7","first_page":"5224","last_page":"5236"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.7137888669967651},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.6779953837394714},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6024248003959656},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6012650728225708},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4802408814430237},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.47743090987205505},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4752083718776703},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.4687640368938446},{"id":"https://openalex.org/keywords/common-mode-signal","display_name":"Common-mode signal","score":0.4658653736114502},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.46510180830955505},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.4454020857810974},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4385658800601959},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4366011619567871},{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.426133394241333},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15167677402496338}],"concepts":[{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.7137888669967651},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.6779953837394714},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6024248003959656},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6012650728225708},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4802408814430237},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.47743090987205505},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4752083718776703},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.4687640368938446},{"id":"https://openalex.org/C189714311","wikidata":"https://www.wikidata.org/wiki/Q1530371","display_name":"Common-mode signal","level":4,"score":0.4658653736114502},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.46510180830955505},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.4454020857810974},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4385658800601959},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4366011619567871},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.426133394241333},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15167677402496338},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2017.2777378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2777378","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:espace2.etsmtl.ca:16163","is_oa":false,"landing_page_url":"http://espace2.etsmtl.ca/id/eprint/16163/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402392","display_name":"Espace \u00c9TS (ETS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1341030882","host_organization_name":"Educational Testing Service","host_organization_lineage":["https://openalex.org/I1341030882"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article publi\u00e9 dans une revue, r\u00e9vis\u00e9 par les pairs"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1974259851","https://openalex.org/W1984008622","https://openalex.org/W1988224651","https://openalex.org/W2020032342","https://openalex.org/W2021862577","https://openalex.org/W2051044060","https://openalex.org/W2052737679","https://openalex.org/W2067411086","https://openalex.org/W2074398081","https://openalex.org/W2102747891","https://openalex.org/W2121674342","https://openalex.org/W2125239084","https://openalex.org/W2126842398","https://openalex.org/W2131816393","https://openalex.org/W2136155934","https://openalex.org/W2142351866","https://openalex.org/W2150763729","https://openalex.org/W2161004549","https://openalex.org/W2167467654","https://openalex.org/W2174980551","https://openalex.org/W2177982779","https://openalex.org/W2323552613","https://openalex.org/W2323712839","https://openalex.org/W2344926255","https://openalex.org/W2574674596","https://openalex.org/W2590567059"],"related_works":["https://openalex.org/W1921091955","https://openalex.org/W2542938167","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W2160921373","https://openalex.org/W2077896430","https://openalex.org/W2124450871","https://openalex.org/W2105800046","https://openalex.org/W2071764837","https://openalex.org/W2076345965"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"two":[3,132],"new":[4,125],"open-circuit":[5,85,89,157],"fault":[6,90],"detection":[7],"methods":[8,65,133],"suitable":[9],"for":[10,159],"the":[11,30,47,60,78,82,92,97,100,105,121],"diagnosis":[12],"of":[13,29,104,111,123,130],"power":[14],"electronics":[15],"converters.":[16],"The":[17,36,51,128],"faulty":[18],"semiconductor":[19],"devices":[20],"are":[21,66],"identified":[22],"using":[23],"conducted":[24],"and":[25,120,140],"radiated":[26],"electromagnetic":[27,42],"signatures":[28],"dc":[31],"bus":[32],"through":[33,137],"nonintrusive":[34],"measurements.":[35],"first":[37],"method":[38],"uses":[39],"a":[40,69,115,124],"low-cost":[41],"interference":[43],"filter":[44],"to":[45,58,80],"collect":[46,59],"common-mode":[48,93],"emissions":[49],"signature.":[50,63],"second":[52],"one":[53],"utilizes":[54],"an":[55],"external":[56],"antenna":[57],"emitted":[61,106],"near-field":[62,107],"Both":[64],"tested":[67,136],"on":[68],"three-level":[70,160],"neutral":[71],"point":[72],"clamped":[73],"inverter":[74,76],"(NPC)":[75],"with":[77],"aim":[79],"identify":[81],"clamping":[83],"diodes":[84],"faults.":[86],"Indeed,":[87],"each":[88],"affects":[91],"emission":[94],"signature":[95],"in":[96,150],"time-domain,":[98],"while":[99],"fast":[101],"Fourier":[102],"transform":[103],"showed":[108],"substantial":[109],"reduction":[110],"spectrum":[112],"amplitude":[113],"at":[114],"specific":[116],"radio":[117],"frequency":[118],"range":[119],"appearance":[122],"spectral":[126],"rail.":[127],"effectiveness":[129],"these":[131],"has":[134],"been":[135],"numerical":[138],"simulations":[139],"validated":[141],"by":[142],"experimental":[143],"results":[144],"which":[145],"confirmed":[146],"its":[147],"high":[148],"performance":[149],"detecting":[151],"single":[152],"as":[153,155],"well":[154],"multiple":[156],"faults":[158],"NPC":[161],"inverter.":[162]},"counts_by_year":[{"year":2025,"cited_by_count":12},{"year":2024,"cited_by_count":17},{"year":2023,"cited_by_count":16},{"year":2022,"cited_by_count":18},{"year":2021,"cited_by_count":13},{"year":2020,"cited_by_count":14},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":9}],"updated_date":"2025-11-19T23:35:23.961156","created_date":"2025-10-10T00:00:00"}