{"id":"https://openalex.org/W2763524503","doi":"https://doi.org/10.1109/tie.2017.2758745","title":"Short-Time Fourier Transform Based Transient Analysis of VSC Interfaced Point-to-Point DC System","display_name":"Short-Time Fourier Transform Based Transient Analysis of VSC Interfaced Point-to-Point DC System","publication_year":2017,"publication_date":"2017-10-02","ids":{"openalex":"https://openalex.org/W2763524503","doi":"https://doi.org/10.1109/tie.2017.2758745","mag":"2763524503"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2758745","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2758745","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://dr.ntu.edu.sg/bitstream/10356/90241/1/ALL_17-TIE-1276-ls.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060773538","display_name":"Kuntal Satpathi","orcid":"https://orcid.org/0000-0003-3188-2344"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kuntal Satpathi","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0003-3188-2344","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064193434","display_name":"Yew Ming Yeap","orcid":"https://orcid.org/0000-0002-7553-3675"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yew Ming Yeap","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-7553-3675","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086713046","display_name":"Abhisek Ukil","orcid":"https://orcid.org/0000-0003-3100-7865"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Abhisek Ukil","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0003-3100-7865","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050757487","display_name":"Nagesh Geddada","orcid":"https://orcid.org/0000-0001-6687-1691"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Nagesh Geddada","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":"https://orcid.org/0000-0001-6687-1691","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.087,"has_fulltext":true,"cited_by_count":194,"citation_normalized_percentile":{"value":0.98572163,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"65","issue":"5","first_page":"4080","last_page":"4091"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/short-time-fourier-transform","display_name":"Short-time Fourier transform","score":0.6946181058883667},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6327709555625916},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6140491366386414},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5009777545928955},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46810245513916016},{"id":"https://openalex.org/keywords/dc-bias","display_name":"DC bias","score":0.4377824366092682},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.43624699115753174},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.43157458305358887},{"id":"https://openalex.org/keywords/voltage-source","display_name":"Voltage source","score":0.42878901958465576},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3516188859939575},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3074987530708313},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.3070308566093445},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23979759216308594},{"id":"https://openalex.org/keywords/fourier-analysis","display_name":"Fourier analysis","score":0.21996289491653442},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11720168590545654}],"concepts":[{"id":"https://openalex.org/C166386157","wikidata":"https://www.wikidata.org/wiki/Q1477735","display_name":"Short-time Fourier transform","level":4,"score":0.6946181058883667},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6327709555625916},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6140491366386414},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5009777545928955},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46810245513916016},{"id":"https://openalex.org/C88682704","wikidata":"https://www.wikidata.org/wiki/Q2907415","display_name":"DC bias","level":3,"score":0.4377824366092682},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.43624699115753174},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.43157458305358887},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.42878901958465576},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3516188859939575},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3074987530708313},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.3070308566093445},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23979759216308594},{"id":"https://openalex.org/C203024314","wikidata":"https://www.wikidata.org/wiki/Q1365258","display_name":"Fourier analysis","level":3,"score":0.21996289491653442},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11720168590545654},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tie.2017.2758745","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2758745","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/90241","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/48775","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/90241/1/ALL_17-TIE-1276-ls.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},{"id":"pmh:oai:researchspace.auckland.ac.nz:2292/42096","is_oa":false,"landing_page_url":"https://hdl.handle.net/2292/42096","pdf_url":null,"source":{"id":"https://openalex.org/S7407055463","display_name":"ResearchSpace (University of Auckland)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I154130895","host_organization_name":"University of Auckland","host_organization_lineage":["https://openalex.org/I154130895"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":{"id":"pmh:oai:dr.ntu.edu.sg:10356/90241","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/48775","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/90241/1/ALL_17-TIE-1276-ls.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1002005146","display_name":null,"funder_award_id":"M4081547.040","funder_id":"https://openalex.org/F4320320766","funder_display_name":"Nanyang Technological University"}],"funders":[{"id":"https://openalex.org/F4320320766","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2763524503.pdf","grobid_xml":"https://content.openalex.org/works/W2763524503.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W1590929132","https://openalex.org/W1619305823","https://openalex.org/W1967553926","https://openalex.org/W1973743698","https://openalex.org/W1989721074","https://openalex.org/W1994226822","https://openalex.org/W2033005616","https://openalex.org/W2065920845","https://openalex.org/W2071336398","https://openalex.org/W2073887634","https://openalex.org/W2132265582","https://openalex.org/W2148895869","https://openalex.org/W2314304300","https://openalex.org/W2339766197","https://openalex.org/W2411354668","https://openalex.org/W2464856455","https://openalex.org/W2478884216","https://openalex.org/W2497855708","https://openalex.org/W2549570176","https://openalex.org/W2558283485","https://openalex.org/W2565962614","https://openalex.org/W2586856580","https://openalex.org/W2593289701","https://openalex.org/W2593318455","https://openalex.org/W2593806287","https://openalex.org/W2739755411"],"related_works":["https://openalex.org/W4229441739","https://openalex.org/W4303411445","https://openalex.org/W4207040089","https://openalex.org/W2384455639","https://openalex.org/W1519622926","https://openalex.org/W3109306766","https://openalex.org/W4225639054","https://openalex.org/W1967434260","https://openalex.org/W2143985734","https://openalex.org/W2574021307"],"abstract_inverted_index":{"The":[0,19,52,158],"transient":[1,44,75,92,151],"response":[2],"of":[3,30,73,82,108,208],"the":[4,16,24,28,31,35,43,58,74,83,101,109,181,197,206,209],"voltage":[5],"source":[6],"converter":[7],"(VSC)":[8],"interfaced":[9],"dc":[10,39,59,111,171],"system":[11],"is":[12,61,124,141,161,175],"significantly":[13],"different":[14],"from":[15,23,187],"ac":[17],"counterpart.":[18],"rapid":[20],"discharge":[21],"current":[22,56,184],"dc-link":[25],"capacitors":[26],"and":[27,113,116,133,148,164,178,194],"vulnerability":[29],"freewheeling":[32],"diodes":[33],"during":[34,91],"short":[36],"circuit":[37],"in":[38,57,136],"grid":[40,60],"demand":[41],"that":[42],"detection":[45],"algorithm":[46,123,160],"executes":[47],"within":[48,130],"a":[49,168,188],"few":[50],"milliseconds.":[51],"rapidly":[53],"rising":[54],"fault":[55,147,183],"expected":[62],"to":[63,126,143,167,204],"have":[64,118],"high-frequency":[65,84],"components":[66,85],"which":[67],"might":[68],"be":[69],"an":[70],"effective":[71],"indicator":[72],"condition.":[76],"This":[77],"paper":[78],"presents":[79],"quantitative":[80],"investigation":[81],"utilizing":[86],"short-time":[87],"Fourier":[88],"transform":[89],"(STFT)":[90],"conditions.":[93],"Detailed":[94],"operating":[95],"principles":[96],"with":[97,180,196],"various":[98],"factors":[99],"affecting":[100],"STFT":[102,122,159],"operation":[103],"such":[104,153],"as":[105,154],"ripple":[106],"content":[107],"input":[110],"signal":[112],"window":[114],"type":[115],"length":[117],"been":[119],"thoroughly":[120],"investigated.":[121],"able":[125,142],"detect":[127],"low-impedance":[128],"faults":[129,135],"1":[131],"ms":[132],"high-impedance":[134],"2":[137],"ms.":[138],"Moreover,":[139],"it":[140],"distinguish":[144],"between":[145],"short-circuit":[146],"less":[149],"severe":[150],"conditions":[152],"sudden":[155],"load":[156],"change.":[157],"evaluated":[162],"analytically":[163],"subsequently":[165],"applied":[166],"MATLAB/Simulink":[169],"based":[170],"test":[172],"system.":[173],"It":[174],"further":[176],"validated":[177],"substantiated":[179],"real":[182],"data":[185],"obtained":[186],"scaled-down":[189],"experimental":[190],"testbed.":[191],"Sensitivity":[192],"analysis":[193],"comparison":[195],"existing":[198],"frequency-domain-based":[199],"fault-detection":[200],"method":[201],"are":[202],"done":[203],"support":[205],"efficacy":[207],"proposed":[210],"method.":[211]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":21},{"year":2024,"cited_by_count":20},{"year":2023,"cited_by_count":27},{"year":2022,"cited_by_count":28},{"year":2021,"cited_by_count":22},{"year":2020,"cited_by_count":29},{"year":2019,"cited_by_count":30},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}