{"id":"https://openalex.org/W2618709819","doi":"https://doi.org/10.1109/tie.2017.2708036","title":"Comprehensive Correlation Analysis of Industrial Process","display_name":"Comprehensive Correlation Analysis of Industrial Process","publication_year":2017,"publication_date":"2017-05-25","ids":{"openalex":"https://openalex.org/W2618709819","doi":"https://doi.org/10.1109/tie.2017.2708036","mag":"2618709819"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2708036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2708036","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101808276","display_name":"Yingwei Zhang","orcid":"https://orcid.org/0000-0001-9736-6583"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingwei Zhang","raw_affiliation_strings":["State Laboratory of Synthesis Automation of Process Industry, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0001-9736-6583","affiliations":[{"raw_affiliation_string":"State Laboratory of Synthesis Automation of Process Industry, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026818073","display_name":"Wenyou Du","orcid":"https://orcid.org/0000-0002-8457-8103"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenyou Du","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101848492","display_name":"Yunpeng Fan","orcid":"https://orcid.org/0000-0002-5206-5186"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunpeng Fan","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100704690","display_name":"Xu-Guang Li","orcid":"https://orcid.org/0000-0003-1739-5371"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuguang Li","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I9224756"],"apc_list":null,"apc_paid":null,"fwci":1.1903,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.79635525,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"64","issue":"12","first_page":"9461","last_page":"9468"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.98089998960495,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9624999761581421,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6902317404747009},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6541129350662231},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5636571049690247},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5207107663154602},{"id":"https://openalex.org/keywords/linear-subspace","display_name":"Linear subspace","score":0.5192025303840637},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4987304210662842},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.42399293184280396},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40212681889533997},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39138662815093994},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.367439866065979},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.35103315114974976},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2493358552455902},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23421722650527954}],"concepts":[{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6902317404747009},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6541129350662231},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5636571049690247},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5207107663154602},{"id":"https://openalex.org/C12362212","wikidata":"https://www.wikidata.org/wiki/Q728435","display_name":"Linear subspace","level":2,"score":0.5192025303840637},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4987304210662842},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42399293184280396},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40212681889533997},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39138662815093994},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.367439866065979},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.35103315114974976},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2493358552455902},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23421722650527954},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2017.2708036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2708036","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.46000000834465027,"id":"https://metadata.un.org/sdg/11"}],"awards":[{"id":"https://openalex.org/G5035868569","display_name":null,"funder_award_id":"61273163","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5789518476","display_name":null,"funder_award_id":"61325015","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1597576211","https://openalex.org/W1984672166","https://openalex.org/W1995586095","https://openalex.org/W2001781226","https://openalex.org/W2005051528","https://openalex.org/W2012921684","https://openalex.org/W2015436473","https://openalex.org/W2024616301","https://openalex.org/W2044124619","https://openalex.org/W2050274333","https://openalex.org/W2060901689","https://openalex.org/W2069672128","https://openalex.org/W2079013017","https://openalex.org/W2081506936","https://openalex.org/W2083856839","https://openalex.org/W2100028154","https://openalex.org/W2103711750","https://openalex.org/W2116492734","https://openalex.org/W2128921897","https://openalex.org/W2135817882","https://openalex.org/W2137922462","https://openalex.org/W2141879504","https://openalex.org/W2158958729","https://openalex.org/W2159554686","https://openalex.org/W2169347809","https://openalex.org/W2334600712","https://openalex.org/W2342664609","https://openalex.org/W2413579316","https://openalex.org/W2470068462","https://openalex.org/W2560234987","https://openalex.org/W4250236131"],"related_works":["https://openalex.org/W2391321755","https://openalex.org/W2896134808","https://openalex.org/W2949110394","https://openalex.org/W4211228991","https://openalex.org/W2353790329","https://openalex.org/W2279743781","https://openalex.org/W3019634500","https://openalex.org/W140666874","https://openalex.org/W1978233018","https://openalex.org/W2383699822"],"abstract_inverted_index":{"In":[0],"this":[1,100],"paper,":[2],"a":[3],"reconstruction-based":[4],"method":[5],"is":[6,66,89],"proposed":[7,94],"to":[8,25,52,68,91],"monitor":[9],"nonlinear":[10],"processes":[11],"and":[12,20,30,96],"isolate":[13],"their":[14],"fault":[15,18,33,44,64,80],"types.":[16],"The":[17,35,63],"direction":[19,65],"enhanced":[21],"statistics":[22],"are":[23,38,49,56],"introduced":[24,90],"improve":[26],"the":[27,53,59,70,76,79,93,97],"monitoring":[28],"results":[29,98],"effectiveness":[31],"of":[32,99],"isolation.":[34],"main":[36],"contributions":[37],"given":[39],"as":[40],"follows:":[41],"1)":[42],"For":[43],"detection,":[45],"two":[46],"statistics,":[47],"which":[48],"decomposed":[50],"according":[51],"load":[54],"directions,":[55],"defined":[57],"in":[58],"complementary":[60],"subspaces.":[61],"2)":[62],"used":[67],"obtain":[69],"reconstruction":[71,77],"model.":[72],"3)":[73],"Based":[74],"on":[75],"model,":[78],"type":[81],"can":[82],"be":[83],"isolated.":[84],"An":[85],"electro-fused":[86],"magnesia":[87],"furnace":[88],"test":[92,101],"method,":[95],"validate":[102],"its":[103],"effectiveness.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}