{"id":"https://openalex.org/W2610930014","doi":"https://doi.org/10.1109/tie.2017.2701790","title":"Uncertainty Management in Lebesgue-Sampling-Based Diagnosis and Prognosis for Lithium-Ion Battery","display_name":"Uncertainty Management in Lebesgue-Sampling-Based Diagnosis and Prognosis for Lithium-Ion Battery","publication_year":2017,"publication_date":"2017-05-05","ids":{"openalex":"https://openalex.org/W2610930014","doi":"https://doi.org/10.1109/tie.2017.2701790","mag":"2610930014"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2701790","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2701790","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075400593","display_name":"Wuzhao Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wuzhao Yan","raw_affiliation_strings":["Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA","institution_ids":["https://openalex.org/I155781252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100392843","display_name":"Bin Zhang","orcid":"https://orcid.org/0000-0002-4879-0211"},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bin Zhang","raw_affiliation_strings":["Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA","institution_ids":["https://openalex.org/I155781252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080499531","display_name":"Guangquang Zhao","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangquang Zhao","raw_affiliation_strings":["Harbin Institution of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institution of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016388074","display_name":"John Weddington","orcid":null},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Weddington","raw_affiliation_strings":["Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA","institution_ids":["https://openalex.org/I155781252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077784565","display_name":"Guangxing Niu","orcid":"https://orcid.org/0000-0002-1589-7055"},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Guangxing Niu","raw_affiliation_strings":["Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA","institution_ids":["https://openalex.org/I155781252"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5075400593"],"corresponding_institution_ids":["https://openalex.org/I155781252"],"apc_list":null,"apc_paid":null,"fwci":4.3876,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.9453967,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"64","issue":"10","first_page":"8158","last_page":"8166"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.582044243812561},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5339983701705933},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5171603560447693},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4952014982700348},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4929215908050537},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4907115697860718},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4195181429386139},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38491755723953247},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.36034703254699707},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22857028245925903},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16100823879241943},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.1401400864124298},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.12690642476081848},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.11094188690185547}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.582044243812561},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5339983701705933},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5171603560447693},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4952014982700348},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4929215908050537},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4907115697860718},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4195181429386139},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38491755723953247},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.36034703254699707},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22857028245925903},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16100823879241943},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.1401400864124298},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.12690642476081848},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.11094188690185547},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2017.2701790","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2701790","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W591732527","https://openalex.org/W1556459174","https://openalex.org/W1963987835","https://openalex.org/W1972375419","https://openalex.org/W1985821278","https://openalex.org/W1989937845","https://openalex.org/W1990111037","https://openalex.org/W2007536021","https://openalex.org/W2019732711","https://openalex.org/W2027979864","https://openalex.org/W2033969310","https://openalex.org/W2044254621","https://openalex.org/W2051940462","https://openalex.org/W2062167409","https://openalex.org/W2062530405","https://openalex.org/W2062553140","https://openalex.org/W2088378662","https://openalex.org/W2096825952","https://openalex.org/W2118680859","https://openalex.org/W2124128849","https://openalex.org/W2140313748","https://openalex.org/W2149836458","https://openalex.org/W2162992926","https://openalex.org/W2266656317","https://openalex.org/W2554540404","https://openalex.org/W2623650797","https://openalex.org/W2902260176","https://openalex.org/W2902534304","https://openalex.org/W3145379374","https://openalex.org/W3148480311","https://openalex.org/W3159214003","https://openalex.org/W6633355566","https://openalex.org/W6666231699","https://openalex.org/W6739554867","https://openalex.org/W6756476962","https://openalex.org/W6757128489","https://openalex.org/W6792650085","https://openalex.org/W6795206767"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W3147033875","https://openalex.org/W2033512842","https://openalex.org/W2764722704","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W2125334247","https://openalex.org/W4200081019","https://openalex.org/W3116723889"],"abstract_inverted_index":{"Lebesgue-sampling-based":[0],"fault":[1],"diagnosis":[2],"and":[3,15,23,28,38,43,93,102,109,136],"prognosis":[4],"(LS-FDP)":[5],"is":[6,61,82],"developed":[7],"with":[8,69,116],"the":[9,26,36,41,86,98,125],"advantage":[10],"of":[11,30,49,76],"less":[12],"computation":[13],"requirement":[14],"smaller":[16],"uncertainty":[17,75],"accumulation.":[18],"Same":[19],"as":[20],"other":[21],"diagnostic":[22,42],"prognostic":[24,44],"approaches,":[25],"accuracy":[27],"precision":[29],"LS-FDP":[31,114],"are":[32,107],"significantly":[33],"influenced":[34],"by":[35,63,84],"parameters":[37],"uncertainties":[39],"in":[40,111],"models.":[45],"To":[46,96],"improve":[47],"performance":[48],"LS-FDP,":[50],"this":[51],"paper":[52],"introduces":[53],"an":[54],"online":[55],"model":[56,87],"parameter":[57,100],"adaptation":[58,101],"scheme,":[59],"which":[60],"realized":[62],"a":[64,70,90,112],"recursive":[65],"least":[66],"square":[67],"method":[68],"forgetting":[71],"factor.":[72],"In":[73],"addition,":[74],"remaining":[77],"useful":[78],"life":[79],"(RUL)":[80],"prediction":[81,92],"managed":[83],"adjusting":[85],"noises":[88],"through":[89],"short-term":[91],"correction":[94],"loop.":[95],"verify":[97],"proposed":[99,126],"noise":[103],"adjustment":[104],"methods,":[105],"they":[106],"designed":[108],"implemented":[110],"particle-filtering-based":[113],"algorithm":[115],"applications":[117],"to":[118],"Li-ion":[119],"batteries.":[120],"Experimental":[121],"results":[122],"show":[123],"that":[124],"approach":[127],"has":[128],"significant":[129],"improvement":[130],"on":[131],"both":[132],"battery":[133],"capacity":[134],"estimation":[135],"RUL":[137],"prediction.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":13},{"year":2018,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
