{"id":"https://openalex.org/W2608112722","doi":"https://doi.org/10.1109/tie.2017.2696481","title":"Highly Efficient and Reliable SiC-Based DC\u2013DC Converter for Smart Transformer","display_name":"Highly Efficient and Reliable SiC-Based DC\u2013DC Converter for Smart Transformer","publication_year":2017,"publication_date":"2017-04-24","ids":{"openalex":"https://openalex.org/W2608112722","doi":"https://doi.org/10.1109/tie.2017.2696481","mag":"2608112722"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2696481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2696481","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://nbn-resolving.org/urn:nbn:de:gbv:8-publ-17961","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078834086","display_name":"Levy F. Costa","orcid":"https://orcid.org/0000-0001-7372-8041"},"institutions":[{"id":"https://openalex.org/I32021983","display_name":"Christian-Albrechts-Universit\u00e4t zu Kiel","ror":"https://ror.org/04v76ef78","country_code":"DE","type":"education","lineage":["https://openalex.org/I32021983"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Levy Ferreira Costa","raw_affiliation_strings":["Christian-Albrecht-University of Kiel, Kiel, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Christian-Albrecht-University of Kiel, Kiel, Germany","institution_ids":["https://openalex.org/I32021983"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023412621","display_name":"Giampaolo Buticchi","orcid":"https://orcid.org/0000-0003-0470-3259"},"institutions":[{"id":"https://openalex.org/I32021983","display_name":"Christian-Albrechts-Universit\u00e4t zu Kiel","ror":"https://ror.org/04v76ef78","country_code":"DE","type":"education","lineage":["https://openalex.org/I32021983"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Giampaolo Buticchi","raw_affiliation_strings":["Christian-Albrecht-University of Kiel, Kiel, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Christian-Albrecht-University of Kiel, Kiel, Germany","institution_ids":["https://openalex.org/I32021983"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053880143","display_name":"Marco Liserre","orcid":"https://orcid.org/0000-0002-0818-2684"},"institutions":[{"id":"https://openalex.org/I32021983","display_name":"Christian-Albrechts-Universit\u00e4t zu Kiel","ror":"https://ror.org/04v76ef78","country_code":"DE","type":"education","lineage":["https://openalex.org/I32021983"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marco Liserre","raw_affiliation_strings":["Christian-Albrecht-University of Kiel, Kiel, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Christian-Albrecht-University of Kiel, Kiel, Germany","institution_ids":["https://openalex.org/I32021983"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.5318,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.95128848,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"64","issue":"10","first_page":"8383","last_page":"8392"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11249","display_name":"Wireless Power Transfer Systems","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.695152759552002},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5875754356384277},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5292659997940063},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.5212134122848511},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44713518023490906},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4438108801841736},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42672210931777954},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3440587520599365},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.24183771014213562},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1742633879184723},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07458370923995972}],"concepts":[{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.695152759552002},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5875754356384277},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5292659997940063},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.5212134122848511},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44713518023490906},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4438108801841736},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42672210931777954},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3440587520599365},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.24183771014213562},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1742633879184723},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07458370923995972},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tie.2017.2696481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2696481","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:macau.uni-kiel.de:publ_mods_00001796","is_oa":true,"landing_page_url":"https://macau.uni-kiel.de/receive/publ_mods_00001796","pdf_url":"https://nbn-resolving.org/urn:nbn:de:gbv:8-publ-17961","source":{"id":"https://openalex.org/S4306401923","display_name":"Multimedialer Archiv- und Publikationsserver der Christian-Albrechts-Universit\u00e4t zu Kiel (Christian-Albrechts-Universit\u00e4t zu Kiel)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I151221077","host_organization_name":"Chung Yuan Christian University","host_organization_lineage":["https://openalex.org/I151221077"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"doc-type:Article"},{"id":"pmh:oai:macau.uni-kiel.de:macau_publ_00001796","is_oa":true,"landing_page_url":"https://macau.uni-kiel.de/receive/macau_publ_00001796","pdf_url":null,"source":{"id":"https://openalex.org/S4306401923","display_name":"Multimedialer Archiv- und Publikationsserver der Christian-Albrechts-Universit\u00e4t zu Kiel (Christian-Albrechts-Universit\u00e4t zu Kiel)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I151221077","host_organization_name":"Chung Yuan Christian University","host_organization_lineage":["https://openalex.org/I151221077"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Industrial Electronics. - USA : IEEE; 2017. - S.8383-8392.","raw_type":"doc-type:article"}],"best_oa_location":{"id":"pmh:oai:macau.uni-kiel.de:publ_mods_00001796","is_oa":true,"landing_page_url":"https://macau.uni-kiel.de/receive/publ_mods_00001796","pdf_url":"https://nbn-resolving.org/urn:nbn:de:gbv:8-publ-17961","source":{"id":"https://openalex.org/S4306401923","display_name":"Multimedialer Archiv- und Publikationsserver der Christian-Albrechts-Universit\u00e4t zu Kiel (Christian-Albrechts-Universit\u00e4t zu Kiel)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I151221077","host_organization_name":"Chung Yuan Christian University","host_organization_lineage":["https://openalex.org/I151221077"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"doc-type:Article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7799999713897705,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G3519227077","display_name":null,"funder_award_id":"FP/2007-2013","funder_id":"https://openalex.org/F4320334960","funder_display_name":"Seventh Framework Programme"},{"id":"https://openalex.org/G5266322050","display_name":null,"funder_award_id":"616344\u2014HEART","funder_id":"https://openalex.org/F4320334678","funder_display_name":"European Research Council"}],"funders":[{"id":"https://openalex.org/F4320334678","display_name":"European Research Council","ror":"https://ror.org/0472cxd90"},{"id":"https://openalex.org/F4320334960","display_name":"Seventh Framework Programme","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2608112722.pdf"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W110319546","https://openalex.org/W1561421330","https://openalex.org/W1950329819","https://openalex.org/W1978262178","https://openalex.org/W1980245553","https://openalex.org/W1981844906","https://openalex.org/W1985066888","https://openalex.org/W1993612181","https://openalex.org/W1995817072","https://openalex.org/W1997564337","https://openalex.org/W2001873707","https://openalex.org/W2039511829","https://openalex.org/W2048111226","https://openalex.org/W2065133835","https://openalex.org/W2077711491","https://openalex.org/W2082893611","https://openalex.org/W2089839769","https://openalex.org/W2097036926","https://openalex.org/W2109185194","https://openalex.org/W2138084019","https://openalex.org/W2151261431","https://openalex.org/W2158674666","https://openalex.org/W2213978322","https://openalex.org/W2296737711","https://openalex.org/W2320581734","https://openalex.org/W2330073160","https://openalex.org/W2333012428","https://openalex.org/W2442002586","https://openalex.org/W2509345931","https://openalex.org/W2525013347","https://openalex.org/W6604531544"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489","https://openalex.org/W1607054433"],"abstract_inverted_index":{"The":[0],"series-resonant":[1],"converter":[2,41],"(SRC)":[3],"has":[4,126],"been":[5],"used":[6],"in":[7,50],"several":[8],"application":[9],"and":[10,24,66,87,90,108],"it":[11],"recently":[12],"became":[13],"popular":[14],"for":[15,72,120],"smart":[16],"transformers":[17],"(STs).":[18],"In":[19,53],"this":[20,54,56],"application,":[21],"the":[22,35,40,45,51,64,70,80,91,112,121],"efficiency":[23,65,76,129],"reliability":[25,46,67,101],"are":[26,47],"of":[27,69,82,111,130],"paramount":[28],"importance.":[29],"Although":[30],"many":[31],"papers":[32],"have":[33],"addressed":[34],"design":[36,60,93,110],"challenges":[37],"to":[38],"improve":[39],"efficiency,":[42],"discussions":[43],"about":[44],"still":[48],"missing":[49],"literature.":[52],"context,":[55],"paper":[57],"presents":[58],"a":[59,105],"procedure":[61,94],"focusing":[62],"on":[63,96],"improvement":[68],"SRC":[71,125],"ST":[73],"application.":[74],"High":[75,100],"is":[77,102],"achieved":[78,103],"through":[79,104],"use":[81],"silicon-carbide":[83],"MOSFETs,":[84],"reducing":[85],"conduction":[86],"switching":[88],"losses,":[89],"detail":[92],"based":[95],"accurate":[97],"losses":[98],"modeling.":[99],"fault-tolerant":[106],"topology":[107],"reliability-oriented":[109],"resonant":[113],"circuit":[114],"passive":[115],"components.":[116],"Experimental":[117],"results":[118],"obtained":[119],"optimized":[122],"10":[123],"kW":[124],"shown":[127],"an":[128],"98.61%.":[131]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":13},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}